{"id":"https://openalex.org/W4399174048","doi":"https://doi.org/10.1145/3660043.3660164","title":"A Framework of Operational Profile for AI Systems","display_name":"A Framework of Operational Profile for AI Systems","publication_year":2023,"publication_date":"2023-12-22","ids":{"openalex":"https://openalex.org/W4399174048","doi":"https://doi.org/10.1145/3660043.3660164"},"language":"en","primary_location":{"id":"doi:10.1145/3660043.3660164","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3660043.3660164","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2023 International Conference on Information Education and Artificial Intelligence","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083810657","display_name":"Cong Pan","orcid":"https://orcid.org/0000-0002-4955-7761"},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Cong Pan","raw_affiliation_strings":["China Electronics Product Reliability and Environmental Testing Research Institute, China"],"raw_orcid":"https://orcid.org/0000-0002-4955-7761","affiliations":[{"raw_affiliation_string":"China Electronics Product Reliability and Environmental Testing Research Institute, China","institution_ids":["https://openalex.org/I4210113818"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073315739","display_name":"Ai Gu","orcid":"https://orcid.org/0000-0001-7642-9581"},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ai Gu","raw_affiliation_strings":["China Electronics Product Reliability and Environmental Testing Research Institute, China"],"raw_orcid":"https://orcid.org/0000-0001-7642-9581","affiliations":[{"raw_affiliation_string":"China Electronics Product Reliability and Environmental Testing Research Institute, China","institution_ids":["https://openalex.org/I4210113818"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049286044","display_name":"Yan Gao","orcid":"https://orcid.org/0009-0001-2256-5323"},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yan Gao","raw_affiliation_strings":["China Electronics Product Reliability and Environmental Testing Research Institute, China"],"raw_orcid":"https://orcid.org/0009-0001-2256-5323","affiliations":[{"raw_affiliation_string":"China Electronics Product Reliability and Environmental Testing Research Institute, China","institution_ids":["https://openalex.org/I4210113818"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210113818"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"678","last_page":"683"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11689","display_name":"Adversarial Robustness in Machine Learning","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7039465308189392},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6735303997993469},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.5964742302894592},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4529697597026825},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.43086984753608704},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4249304533004761},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.39574041962623596},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.35940587520599365},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.24473828077316284},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22392168641090393}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7039465308189392},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6735303997993469},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.5964742302894592},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4529697597026825},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.43086984753608704},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4249304533004761},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.39574041962623596},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.35940587520599365},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.24473828077316284},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22392168641090393},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3660043.3660164","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3660043.3660164","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2023 International Conference on Information Education and Artificial Intelligence","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W2001355653","https://openalex.org/W2032774349","https://openalex.org/W2113004249","https://openalex.org/W2144544779","https://openalex.org/W2353257644","https://openalex.org/W2738635164","https://openalex.org/W2777638777","https://openalex.org/W2943271466","https://openalex.org/W2948254043","https://openalex.org/W2965407852","https://openalex.org/W2968865041","https://openalex.org/W2970635053","https://openalex.org/W3009542902","https://openalex.org/W3012481664","https://openalex.org/W3034465864","https://openalex.org/W3090423701","https://openalex.org/W3092148827","https://openalex.org/W3093500498","https://openalex.org/W3099444373","https://openalex.org/W3105347387","https://openalex.org/W3159754417","https://openalex.org/W3168146252","https://openalex.org/W3181500144","https://openalex.org/W3211597178","https://openalex.org/W3214027242","https://openalex.org/W4200523838","https://openalex.org/W4286619698","https://openalex.org/W4294658959","https://openalex.org/W4302012756","https://openalex.org/W4312107633","https://openalex.org/W4313656815","https://openalex.org/W6761055161","https://openalex.org/W6762250416","https://openalex.org/W6801620897","https://openalex.org/W6910318977"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"Deep":[0],"learning-based":[1],"artificial":[2],"intelligence":[3],"(AI)":[4],"systems":[5],"have":[6],"advanced":[7],"rapidly":[8],"during":[9],"the":[10,26,51,62,83],"last":[11],"decade.":[12],"AI":[13,54,76,93,141],"systems,":[14,77],"as":[15,133],"a":[16,21,44,102,134],"novel":[17],"system":[18],"type,":[19],"follow":[20],"data-driven":[22],"development":[23],"paradigm,":[24],"emphasizing":[25],"crucial":[27],"necessity":[28],"of":[29,36,53,85,104,140],"their":[30],"quality":[31],"and":[32,49,70,117,121],"reliability.":[33],"The":[34,127],"use":[35],"operational":[37,106,138],"profiles":[38],"(OPs)":[39],"in":[40,73,92],"reliability":[41,52,86],"testing":[42],"is":[43,110],"potential":[45],"technique":[46],"for":[47,75,89,124,136],"analyzing":[48],"improving":[50],"systems.":[55,94,142],"Traditional":[56],"software":[57],"OP":[58,115],"construction":[59],"approaches,":[60],"on":[61,112],"other":[63],"hand,":[64],"fail":[65],"to":[66,81],"describe":[67],"external":[68],"environmental":[69,119],"data":[71,122],"elements":[72],"depth":[74],"making":[78],"it":[79],"difficult":[80],"lead":[82],"production":[84],"test":[87],"cases":[88],"intelligent":[90],"functions":[91],"To":[95],"address":[96],"such":[97],"challenges,":[98],"this":[99],"research":[100],"provides":[101],"framework":[103,129],"AI-oriented":[105],"profile":[107,120,123,139],"(AIOP),":[108],"which":[109],"based":[111],"an":[113],"expanded":[114],"meta-model":[116],"adds":[118],"AIOP":[125],"generation.":[126],"proposed":[128],"can":[130],"be":[131],"used":[132],"guideline":[135],"generating":[137]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-15T18:14:33.161393","created_date":"2025-10-10T00:00:00"}