{"id":"https://openalex.org/W4408151663","doi":"https://doi.org/10.1145/3658617.3703316","title":"ML-assisted SRAM Soft Error Rate Characterization: Opportunities and Challenges","display_name":"ML-assisted SRAM Soft Error Rate Characterization: Opportunities and Challenges","publication_year":2025,"publication_date":"2025-01-20","ids":{"openalex":"https://openalex.org/W4408151663","doi":"https://doi.org/10.1145/3658617.3703316"},"language":"en","primary_location":{"id":"doi:10.1145/3658617.3703316","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3658617.3703316","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 30th Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002405139","display_name":"Masanori Hashimoto","orcid":"https://orcid.org/0000-0002-0377-2108"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masanori Hashimoto","raw_affiliation_strings":["Dept. Informatics, Kyoto Univ., Kyoto, Kyoto, Japan"],"raw_orcid":"https://orcid.org/0000-0002-0377-2108","affiliations":[{"raw_affiliation_string":"Dept. Informatics, Kyoto Univ., Kyoto, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Ryuichi Yasuda","orcid":"https://orcid.org/0009-0008-9746-4296"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryuichi Yasuda","raw_affiliation_strings":["Dept. Informatics, Kyoto Univ., Kyoto, Kyoto, Japan"],"raw_orcid":"https://orcid.org/0009-0008-9746-4296","affiliations":[{"raw_affiliation_string":"Dept. Informatics, Kyoto Univ., Kyoto, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Kazusa Takami","orcid":"https://orcid.org/0009-0004-7674-4505"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazusa Takami","raw_affiliation_strings":["Dept. Informatics, Kyoto Univ., Kyoto, Kyoto, Japan"],"raw_orcid":"https://orcid.org/0009-0004-7674-4505","affiliations":[{"raw_affiliation_string":"Dept. Informatics, Kyoto Univ., Kyoto, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091946973","display_name":"Yuibi Gomi","orcid":null},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuibi Gomi","raw_affiliation_strings":["Dept. Informatics, Kyoto Univ., Kyoto, Kyoto, Japan"],"raw_orcid":"https://orcid.org/0009-0005-6422-6425","affiliations":[{"raw_affiliation_string":"Dept. Informatics, Kyoto Univ., Kyoto, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013018631","display_name":"Kozo Takeuchi","orcid":"https://orcid.org/0000-0002-8541-7491"},"institutions":[{"id":"https://openalex.org/I2800865746","display_name":"Japan Aerospace Exploration Agency","ror":"https://ror.org/059yhyy33","country_code":"JP","type":"facility","lineage":["https://openalex.org/I2800865746"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kozo Takeuchi","raw_affiliation_strings":["Japan Aerospace Exploration Agency, Tsukuba, Ibaraki, Japan"],"raw_orcid":"https://orcid.org/0000-0002-8541-7491","affiliations":[{"raw_affiliation_string":"Japan Aerospace Exploration Agency, Tsukuba, Ibaraki, Japan","institution_ids":["https://openalex.org/I2800865746"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"379","last_page":"384"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.8699657320976257},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.813406229019165},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5751096606254578},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.5630216002464294},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4811355173587799},{"id":"https://openalex.org/keywords/word-error-rate","display_name":"Word error rate","score":0.44829678535461426},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.41996246576309204},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2785094976425171},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2252902388572693},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.19816946983337402},{"id":"https://openalex.org/keywords/speech-recognition","display_name":"Speech recognition","score":0.1792687475681305},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1582484245300293},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.1135912537574768}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.8699657320976257},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.813406229019165},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5751096606254578},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5630216002464294},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4811355173587799},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.44829678535461426},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.41996246576309204},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2785094976425171},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2252902388572693},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.19816946983337402},{"id":"https://openalex.org/C28490314","wikidata":"https://www.wikidata.org/wiki/Q189436","display_name":"Speech recognition","level":1,"score":0.1792687475681305},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1582484245300293},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1135912537574768}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3658617.3703316","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3658617.3703316","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 30th Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W413878220","https://openalex.org/W1982381330","https://openalex.org/W2038297000","https://openalex.org/W2044444099","https://openalex.org/W2108194946","https://openalex.org/W2116914742","https://openalex.org/W2128158076","https://openalex.org/W2143781639","https://openalex.org/W2168860942","https://openalex.org/W2175328863","https://openalex.org/W2215541762","https://openalex.org/W2325092268","https://openalex.org/W2438490186","https://openalex.org/W2499045837","https://openalex.org/W2766555145","https://openalex.org/W2768176179","https://openalex.org/W2912083425","https://openalex.org/W2914761779","https://openalex.org/W2979031163","https://openalex.org/W4378715751","https://openalex.org/W4384162271","https://openalex.org/W4388040411","https://openalex.org/W4388133405"],"related_works":["https://openalex.org/W4290647047","https://openalex.org/W2066033226","https://openalex.org/W2363504003","https://openalex.org/W2548582980","https://openalex.org/W2620706469","https://openalex.org/W2052914698","https://openalex.org/W2088929465","https://openalex.org/W2612883256","https://openalex.org/W4386933833","https://openalex.org/W1030007664"],"abstract_inverted_index":{"Soft":[0],"errors":[1],"from":[2],"cosmic":[3],"rays":[4],"are":[5],"a":[6,111,126],"significant":[7],"concern":[8],"for":[9,28,56,87,102,144,150],"reliability-critical":[10],"applications":[11],"such":[12],"as":[13],"autonomous":[14],"driving":[15],"and":[16,38,63,147,158,163],"supercomputers.":[17],"In":[18],"this":[19],"paper,":[20],"we":[21,154],"review":[22],"soft":[23],"error":[24],"rate":[25],"(SER)":[26],"estimation":[27],"SRAM,":[29],"the":[30,68,92,100,115,131,137],"most":[31],"sensitive":[32],"component":[33],"in":[34,45,67,95,160],"digital":[35],"logic":[36],"chips,":[37],"explore":[39],"how":[40],"machine":[41],"learning":[42,62,69],"can":[43],"assist":[44],"SRAM":[46,128],"SER":[47],"characterization.":[48],"We":[49],"propose":[50],"an":[51,84,88],"efficient":[52],"discriminator":[53],"construction":[54],"method":[55,72],"single-event":[57],"upset":[58,85],"(SEU)":[59],"using":[60],"active":[61],"adaptive":[64],"hyperparameter":[65],"tuning":[66],"algorithm.":[70],"This":[71],"iteratively":[73],"labels":[74],"samples":[75],"through":[76],"technology":[77],"computer-aided":[78],"design":[79],"(TCAD)":[80],"simulations,":[81],"determining":[82],"whether":[83],"occurs":[86],"unlabeled":[89],"sample":[90],"with":[91,125],"lowest":[93],"confidence":[94],"prediction.":[96],"Our":[97],"approach":[98],"eliminates":[99],"need":[101],"empirical":[103],"modeling":[104],"based":[105],"on":[106],"tacit":[107],"knowledge,":[108],"systematically":[109],"building":[110],"model":[112],"while":[113],"reducing":[114],"training":[116,132],"data":[117,133],"needed":[118],"to":[119,135],"achieve":[120,136],"sufficient":[121],"event-wise":[122],"accuracy.":[123,152],"Experiments":[124],"12-nm":[127],"show":[129],"that":[130],"required":[134],"same":[138],"accuracy":[139,146],"was":[140],"reduced":[141],"by":[142,148],"41%":[143],"80%":[145],"31%":[149],"85%":[151],"Finally,":[153],"discuss":[155],"future":[156],"directions":[157],"challenges":[159],"advanced":[161],"nano-sheet":[162],"CFET":[164],"transistors.":[165]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}