{"id":"https://openalex.org/W4394898137","doi":"https://doi.org/10.1145/3650400.3650610","title":"A Bit Error Rate Analysis and Testing System","display_name":"A Bit Error Rate Analysis and Testing System","publication_year":2023,"publication_date":"2023-10-20","ids":{"openalex":"https://openalex.org/W4394898137","doi":"https://doi.org/10.1145/3650400.3650610"},"language":"en","primary_location":{"id":"doi:10.1145/3650400.3650610","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3650400.3650610","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2023 7th International Conference on Electronic Information Technology and Computer Engineering","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5107339130","display_name":"Lili Ren","orcid":null},"institutions":[{"id":"https://openalex.org/I4210105460","display_name":"Shanghai Institute of Measurement and Testing Technology","ror":"https://ror.org/00zcefp03","country_code":"CN","type":"nonprofit","lineage":["https://openalex.org/I4210105460"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lili Ren","raw_affiliation_strings":["Shanghai Precision Metrology &Testing Research Institute, China"],"raw_orcid":"https://orcid.org/0009-0004-9530-7351","affiliations":[{"raw_affiliation_string":"Shanghai Precision Metrology &Testing Research Institute, China","institution_ids":["https://openalex.org/I4210105460"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5095748231","display_name":"Ming Xuan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210105460","display_name":"Shanghai Institute of Measurement and Testing Technology","ror":"https://ror.org/00zcefp03","country_code":"CN","type":"nonprofit","lineage":["https://openalex.org/I4210105460"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ming Xuan","raw_affiliation_strings":["Shanghai Precision Metrology &Testing Research Institute, China"],"raw_orcid":"https://orcid.org/0009-0003-6084-1987","affiliations":[{"raw_affiliation_string":"Shanghai Precision Metrology &Testing Research Institute, China","institution_ids":["https://openalex.org/I4210105460"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5095748232","display_name":"Lili Qi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210105460","display_name":"Shanghai Institute of Measurement and Testing Technology","ror":"https://ror.org/00zcefp03","country_code":"CN","type":"nonprofit","lineage":["https://openalex.org/I4210105460"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lili Qi","raw_affiliation_strings":["Shanghai Precision Metrology &Testing Research Institute, China"],"raw_orcid":"https://orcid.org/0009-0006-5547-0212","affiliations":[{"raw_affiliation_string":"Shanghai Precision Metrology &Testing Research Institute, China","institution_ids":["https://openalex.org/I4210105460"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210105460"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1245","last_page":"1249"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.8490999937057495,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.8490999937057495,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12941","display_name":"Embedded Systems and FPGA Design","score":0.8345000147819519,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13292","display_name":"Embedded Systems and FPGA Applications","score":0.7850000262260437,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bit-error-rate","display_name":"Bit error rate","score":0.7989948391914368},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7348236441612244},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.6236269474029541},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5436223745346069},{"id":"https://openalex.org/keywords/communications-system","display_name":"Communications system","score":0.5258705615997314},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.520645797252655},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4525163173675537},{"id":"https://openalex.org/keywords/software-defined-radio","display_name":"Software-defined radio","score":0.4284844398498535},{"id":"https://openalex.org/keywords/signal-to-noise-ratio","display_name":"Signal-to-noise ratio (imaging)","score":0.4263169467449188},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.24700239300727844},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15548723936080933},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.12392538785934448}],"concepts":[{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.7989948391914368},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7348236441612244},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.6236269474029541},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5436223745346069},{"id":"https://openalex.org/C101765175","wikidata":"https://www.wikidata.org/wiki/Q577764","display_name":"Communications system","level":2,"score":0.5258705615997314},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.520645797252655},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4525163173675537},{"id":"https://openalex.org/C171115542","wikidata":"https://www.wikidata.org/wiki/Q1331892","display_name":"Software-defined radio","level":2,"score":0.4284844398498535},{"id":"https://openalex.org/C13944312","wikidata":"https://www.wikidata.org/wiki/Q7512748","display_name":"Signal-to-noise ratio (imaging)","level":2,"score":0.4263169467449188},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.24700239300727844},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15548723936080933},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.12392538785934448},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3650400.3650610","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3650400.3650610","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2023 7th International Conference on Electronic Information Technology and Computer Engineering","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W3128611524"],"related_works":["https://openalex.org/W1594893153","https://openalex.org/W2886621694","https://openalex.org/W2548565013","https://openalex.org/W4382050970","https://openalex.org/W2528414118","https://openalex.org/W2356651745","https://openalex.org/W2132453830","https://openalex.org/W1194392288","https://openalex.org/W2361299381","https://openalex.org/W2121921304"],"abstract_inverted_index":{"Bit":[0],"Error":[1],"Rate":[2],"(BER)":[3],"is":[4,15,107],"a":[5,45,58,62],"critical":[6],"indicator":[7],"of":[8,21],"the":[9,19,35,49,52,82,93,98,101],"quality":[10],"in":[11,37,54,87,104,115],"digital":[12,38],"communication,":[13],"which":[14,111],"used":[16],"to":[17,47,56,73],"assess":[18],"accuracy":[20],"data":[22],"transmission.":[23],"Various":[24],"factors,":[25],"such":[26],"as":[27],"noise,":[28],"attenuation,":[29],"interference,":[30],"and":[31,51,80,96,100,109,118],"others":[32],"can":[33,90],"impact":[34],"BER":[36,60],"communication":[39,63,75],"systems.":[40],"Therefore,":[41],"this":[42,88,105],"paper":[43,106],"presents":[44],"method":[46,85,102],"reduce":[48,97],"noise":[50],"interference":[53],"order":[55],"get":[57],"better":[59],"for":[61],"system.":[64],"Additionally,":[65],"specific":[66],"code":[67],"element":[68],"correction":[69],"techniques":[70],"are":[71],"employed":[72],"enhance":[74],"quality.":[76],"By":[77],"experimental":[78],"testing":[79],"verification,":[81],"software":[83],"radio-based":[84],"proposed":[86],"thesis":[89],"effectively":[91],"improve":[92],"signal-to-noise":[94],"ratio":[95],"BER,":[99],"utilized":[103],"simplicity":[108],"efficiency,":[110],"has":[112],"practical":[113],"value":[114],"engineering":[116],"applications":[117],"academic":[119],"research.":[120]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}