{"id":"https://openalex.org/W4394898185","doi":"https://doi.org/10.1145/3650400.3650404","title":"An a-IGZO TFT Pixel Circuit to Compensate Electrical Characteristics Variation and OLED Degradation","display_name":"An a-IGZO TFT Pixel Circuit to Compensate Electrical Characteristics Variation and OLED Degradation","publication_year":2023,"publication_date":"2023-10-20","ids":{"openalex":"https://openalex.org/W4394898185","doi":"https://doi.org/10.1145/3650400.3650404"},"language":"en","primary_location":{"id":"doi:10.1145/3650400.3650404","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3650400.3650404","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2023 7th International Conference on Electronic Information Technology and Computer Engineering","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010995717","display_name":"Bo Yu","orcid":"https://orcid.org/0009-0001-8476-5873"},"institutions":[{"id":"https://openalex.org/I91935597","display_name":"University of South China","ror":"https://ror.org/03mqfn238","country_code":"CN","type":"education","lineage":["https://openalex.org/I91935597"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Yu","raw_affiliation_strings":["School of Electrical Engineering, University of South China, China"],"raw_orcid":"https://orcid.org/0009-0001-8476-5873","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, University of South China, China","institution_ids":["https://openalex.org/I91935597"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042095563","display_name":"Huicheng Zhao","orcid":"https://orcid.org/0000-0002-4363-0446"},"institutions":[{"id":"https://openalex.org/I91935597","display_name":"University of South China","ror":"https://ror.org/03mqfn238","country_code":"CN","type":"education","lineage":["https://openalex.org/I91935597"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huicheng Zhao","raw_affiliation_strings":["School of Electrical Engineering, University of South China, China"],"raw_orcid":"https://orcid.org/0000-0002-4363-0446","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, University of South China, China","institution_ids":["https://openalex.org/I91935597"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085054726","display_name":"Ning Wei","orcid":"https://orcid.org/0009-0001-4544-4786"},"institutions":[{"id":"https://openalex.org/I91935597","display_name":"University of South China","ror":"https://ror.org/03mqfn238","country_code":"CN","type":"education","lineage":["https://openalex.org/I91935597"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ning Wei","raw_affiliation_strings":["School of Electrical Engineering, University of South China, China"],"raw_orcid":"https://orcid.org/0009-0001-4544-4786","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, University of South China, China","institution_ids":["https://openalex.org/I91935597"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025150577","display_name":"Hongzhen Chu","orcid":null},"institutions":[{"id":"https://openalex.org/I91935597","display_name":"University of South China","ror":"https://ror.org/03mqfn238","country_code":"CN","type":"education","lineage":["https://openalex.org/I91935597"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongzhen Chu","raw_affiliation_strings":["School of Electrical Engineering, University of South China, China"],"raw_orcid":"https://orcid.org/0009-0008-2849-9639","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, University of South China, China","institution_ids":["https://openalex.org/I91935597"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091834593","display_name":"Yuehua Li","orcid":"https://orcid.org/0000-0003-2037-1071"},"institutions":[{"id":"https://openalex.org/I91935597","display_name":"University of South China","ror":"https://ror.org/03mqfn238","country_code":"CN","type":"education","lineage":["https://openalex.org/I91935597"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuehua Li","raw_affiliation_strings":["School of Electrical Engineering, University of South China, China"],"raw_orcid":"https://orcid.org/0000-0003-2037-1071","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, University of South China, China","institution_ids":["https://openalex.org/I91935597"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101903873","display_name":"Xinlin Wang","orcid":"https://orcid.org/0000-0001-6966-505X"},"institutions":[{"id":"https://openalex.org/I91935597","display_name":"University of South China","ror":"https://ror.org/03mqfn238","country_code":"CN","type":"education","lineage":["https://openalex.org/I91935597"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinlin Wang","raw_affiliation_strings":["School of Electrical Engineering, University of South China, China"],"raw_orcid":"https://orcid.org/0000-0001-6966-505X","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, University of South China, China","institution_ids":["https://openalex.org/I91935597"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043683058","display_name":"Hongyu He","orcid":"https://orcid.org/0000-0003-0721-9067"},"institutions":[{"id":"https://openalex.org/I91935597","display_name":"University of South China","ror":"https://ror.org/03mqfn238","country_code":"CN","type":"education","lineage":["https://openalex.org/I91935597"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongyu He","raw_affiliation_strings":["School of Electrical Engineering, University of South China, China"],"raw_orcid":"https://orcid.org/0000-0003-0721-9067","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, University of South China, China","institution_ids":["https://openalex.org/I91935597"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I91935597"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"18","last_page":"23"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9760000109672546,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9524999856948853,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/amoled","display_name":"AMOLED","score":0.93201744556427},{"id":"https://openalex.org/keywords/thin-film-transistor","display_name":"Thin-film transistor","score":0.9293215274810791},{"id":"https://openalex.org/keywords/oled","display_name":"OLED","score":0.833538830280304},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7459760308265686},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.6867222189903259},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6828406453132629},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.633479118347168},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5031153559684753},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.49636369943618774},{"id":"https://openalex.org/keywords/oxide-thin-film-transistor","display_name":"Oxide thin-film transistor","score":0.4823319613933563},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4752880334854126},{"id":"https://openalex.org/keywords/active-matrix","display_name":"Active matrix","score":0.4374130070209503},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.42835530638694763},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.14700520038604736},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11792287230491638},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09483188390731812}],"concepts":[{"id":"https://openalex.org/C101050124","wikidata":"https://www.wikidata.org/wiki/Q527747","display_name":"AMOLED","level":5,"score":0.93201744556427},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.9293215274810791},{"id":"https://openalex.org/C150759737","wikidata":"https://www.wikidata.org/wiki/Q209593","display_name":"OLED","level":3,"score":0.833538830280304},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7459760308265686},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.6867222189903259},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6828406453132629},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.633479118347168},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5031153559684753},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.49636369943618774},{"id":"https://openalex.org/C162743726","wikidata":"https://www.wikidata.org/wiki/Q7115642","display_name":"Oxide thin-film transistor","level":4,"score":0.4823319613933563},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4752880334854126},{"id":"https://openalex.org/C70201059","wikidata":"https://www.wikidata.org/wiki/Q3142195","display_name":"Active matrix","level":4,"score":0.4374130070209503},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.42835530638694763},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.14700520038604736},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11792287230491638},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09483188390731812},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3650400.3650404","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3650400.3650404","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2023 7th International Conference on Electronic Information Technology and Computer Engineering","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.75,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1911608470","https://openalex.org/W2063788624","https://openalex.org/W2153749995","https://openalex.org/W2309029870","https://openalex.org/W2529052944","https://openalex.org/W2530826853","https://openalex.org/W3027981214","https://openalex.org/W3206293589"],"related_works":["https://openalex.org/W2902151727","https://openalex.org/W4283644143","https://openalex.org/W2799295168","https://openalex.org/W2978736898","https://openalex.org/W2102874782","https://openalex.org/W1911608470","https://openalex.org/W2043741144","https://openalex.org/W1580385727","https://openalex.org/W3114169873","https://openalex.org/W2155399297"],"abstract_inverted_index":{"A":[0],"voltage-programmed":[1],"pixel":[2],"circuit":[3,14,35,54,85],"is":[4],"presented":[5],"for":[6,61,98,106],"active-matrix":[7],"organic":[8],"light-emitting":[9],"diode":[10],"(AMOLED)":[11],"displays.":[12],"The":[13,53,84],"contains":[15],"seven":[16],"amorphous":[17],"indium":[18],"gallium":[19],"zinc":[20],"oxide":[21],"(a-IGZO)":[22],"thin":[23],"film":[24],"transistors":[25],"(TFTs)":[26],"and":[27,44,46,76,78],"one":[28,57],"capacitor.":[29],"In":[30],"the":[31,34,37,41,64,68,79,82,90],"compensation":[32],"stage,":[33],"extracts":[36],"threshold":[38,74,99],"voltages":[39],"of":[40,63,67,73,81,102,109],"driving":[42,69],"TFT":[43],"OLED,":[45],"obtains":[47],"a":[48],"mobility":[49,107],"dependent":[50],"discharge":[51],"voltage.":[52],"requires":[55],"only":[56],"capacitor":[58],"to":[59],"compensate":[60],"variations":[62,72,101,108],"electrical":[65],"characteristics":[66],"TFT,":[70],"i.e.":[71],"voltage":[75,100],"mobility,":[77],"degradation":[80],"OLED.":[83],"simulation":[86],"results":[87],"show":[88],"that":[89],"relative":[91],"current":[92],"error":[93],"rates":[94],"are":[95],"below":[96,104],"5.70%":[97],"\u00b10.5V,":[103],"5.66%":[105],"\u00b130%.":[110]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}