{"id":"https://openalex.org/W4404134055","doi":"https://doi.org/10.1145/3649329.3657380","title":"KATO: Knowledge Alignment And Transfer for Transistor Sizing Of Different Design and Technology","display_name":"KATO: Knowledge Alignment And Transfer for Transistor Sizing Of Different Design and Technology","publication_year":2024,"publication_date":"2024-06-23","ids":{"openalex":"https://openalex.org/W4404134055","doi":"https://doi.org/10.1145/3649329.3657380"},"language":"en","primary_location":{"id":"doi:10.1145/3649329.3657380","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3649329.3657380","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 61st ACM/IEEE Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020806445","display_name":"Wei Xing","orcid":"https://orcid.org/0000-0002-3177-8478"},"institutions":[{"id":"https://openalex.org/I91136226","display_name":"University of Sheffield","ror":"https://ror.org/05krs5044","country_code":"GB","type":"education","lineage":["https://openalex.org/I91136226"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Wei W Xing","raw_affiliation_strings":["The University of Sheffield, Sheffield, United Kingdom"],"raw_orcid":"https://orcid.org/0000-0002-3177-8478","affiliations":[{"raw_affiliation_string":"The University of Sheffield, Sheffield, United Kingdom","institution_ids":["https://openalex.org/I91136226"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100314186","display_name":"Weijian Fan","orcid":"https://orcid.org/0009-0006-4522-2194"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]},{"id":"https://openalex.org/I4394709157","display_name":"Eastern Institute of Technology, Ningbo","ror":"https://ror.org/036mbz113","country_code":null,"type":"education","lineage":["https://openalex.org/I4394709157"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weijian Fan","raw_affiliation_strings":["Eastern Institute of Technology, Ningbo, China","Shenzhen University, ShenZhen, China"],"raw_orcid":"https://orcid.org/0009-0006-4522-2194","affiliations":[{"raw_affiliation_string":"Eastern Institute of Technology, Ningbo, China","institution_ids":["https://openalex.org/I4394709157"]},{"raw_affiliation_string":"Shenzhen University, ShenZhen, China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108323692","display_name":"Zhuohua Liu","orcid":"https://orcid.org/0009-0001-2415-793X"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhuohua Liu","raw_affiliation_strings":["Shenzhen University, Shenzhen, Guangdong, China"],"raw_orcid":"https://orcid.org/0009-0001-2415-793X","affiliations":[{"raw_affiliation_string":"Shenzhen University, Shenzhen, Guangdong, China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5116252179","display_name":"Yuan Yao","orcid":"https://orcid.org/0009-0007-3741-3238"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuan Yao","raw_affiliation_strings":["Beihang University, Beijing, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0007-3741-3238","affiliations":[{"raw_affiliation_string":"Beihang University, Beijing, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101698140","display_name":"Yuanqi Hu","orcid":"https://orcid.org/0000-0001-9179-6603"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanqi Hu","raw_affiliation_strings":["Beihang University, Beijing, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-9179-6603","affiliations":[{"raw_affiliation_string":"Beihang University, Beijing, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5020806445"],"corresponding_institution_ids":["https://openalex.org/I91136226"],"apc_list":null,"apc_paid":null,"fwci":0.9351,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.75600621,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sizing","display_name":"Sizing","score":0.7648748159408569},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6132161617279053},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.46650001406669617},{"id":"https://openalex.org/keywords/transfer","display_name":"Transfer (computing)","score":0.4317004680633545},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32206833362579346},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24199146032333374},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20677921175956726},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.10848641395568848},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09366115927696228},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.06217968463897705}],"concepts":[{"id":"https://openalex.org/C2777767291","wikidata":"https://www.wikidata.org/wiki/Q1080291","display_name":"Sizing","level":2,"score":0.7648748159408569},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6132161617279053},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.46650001406669617},{"id":"https://openalex.org/C2776175482","wikidata":"https://www.wikidata.org/wiki/Q1195816","display_name":"Transfer (computing)","level":2,"score":0.4317004680633545},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32206833362579346},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24199146032333374},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20677921175956726},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.10848641395568848},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09366115927696228},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.06217968463897705},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3649329.3657380","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3649329.3657380","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 61st ACM/IEEE Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2769791151","https://openalex.org/W3092618035","https://openalex.org/W3121642476","https://openalex.org/W3133413229","https://openalex.org/W3199544972","https://openalex.org/W3205090792","https://openalex.org/W3212050490","https://openalex.org/W4200520905","https://openalex.org/W4293023056"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2375311683","https://openalex.org/W2366062860","https://openalex.org/W2373777250","https://openalex.org/W2353956655","https://openalex.org/W2020653254","https://openalex.org/W2010454064","https://openalex.org/W2352072014"],"abstract_inverted_index":{"Automatic":[0],"transistor":[1],"sizing":[2],"in":[3],"circuit":[4],"design":[5,30,102],"continues":[6],"to":[7,63,83,91,96],"be":[8],"a":[9,58],"formidable":[10],"challenge.":[11],"Despite":[12],"that":[13],"Bayesian":[14],"optimization":[15],"(BO)":[16],"has":[17],"achieved":[18],"significant":[19],"success,":[20],"it":[21],"is":[22,68],"circuit-specific,":[23],"limiting":[24],"the":[25,44,105],"accumulation":[26],"and":[27,51,56,87,100],"transfer":[28,46,60],"of":[29],"knowledge":[31,67],"for":[32,54],"broader":[33],"applications.":[34],"This":[35],"paper":[36],"proposes":[37],"(1)":[38],"efficient":[39],"automatic":[40],"kernel":[41],"construction,":[42],"(2)":[43],"first":[45],"learning":[47,61],"across":[48],"different":[49],"circuits":[50],"technology":[52],"nodes":[53],"BO,":[55],"(3)":[57],"selective":[59],"scheme":[62],"ensure":[64],"only":[65],"useful":[66],"utilized.":[69],"These":[70],"three":[71],"novel":[72],"components":[73],"are":[74],"integrated":[75],"into":[76],"BO":[77],"with":[78],"Multi-objective":[79],"Acquisition":[80],"Ensemble":[81],"(MACE)":[82],"form":[84],"Knowledge":[85],"Alignment":[86],"Transfer":[88],"Optimization":[89],"(KATO)":[90],"deliver":[92],"state-of-the-art":[93],"performance:":[94],"up":[95],"2x":[97],"simulation":[98],"reduction":[99],"1.2x":[101],"improvement":[103],"over":[104],"baselines.":[106]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-06T09:05:17.133730","created_date":"2025-10-10T00:00:00"}