{"id":"https://openalex.org/W4398196865","doi":"https://doi.org/10.1145/3638682.3638703","title":"Chip Surface Defect Detection Algorithm Based on Improved YOLOv3","display_name":"Chip Surface Defect Detection Algorithm Based on Improved YOLOv3","publication_year":2023,"publication_date":"2023-11-24","ids":{"openalex":"https://openalex.org/W4398196865","doi":"https://doi.org/10.1145/3638682.3638703"},"language":"en","primary_location":{"id":"doi:10.1145/3638682.3638703","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3638682.3638703","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2023 5th International Conference on Video, Signal and Image Processing","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070861058","display_name":"Biao Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I100188998","display_name":"Harbin University of Science and Technology","ror":"https://ror.org/04e6y1282","country_code":"CN","type":"education","lineage":["https://openalex.org/I100188998"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Biao Zhou","raw_affiliation_strings":["Heilongjiang Province Key Laboratory of Laser Spectroscopy Technology and Application, Harbin University of Science and Technology, China"],"affiliations":[{"raw_affiliation_string":"Heilongjiang Province Key Laboratory of Laser Spectroscopy Technology and Application, Harbin University of Science and Technology, China","institution_ids":["https://openalex.org/I100188998"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079987910","display_name":"Xiaoyu Yu","orcid":"https://orcid.org/0000-0002-2255-275X"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoyu Yu","raw_affiliation_strings":["College of Electron and Information, University of Electronic Science and Technology of China, Zhongshan Institute, China"],"affiliations":[{"raw_affiliation_string":"College of Electron and Information, University of Electronic Science and Technology of China, Zhongshan Institute, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030212496","display_name":"Yang Zhang","orcid":"https://orcid.org/0009-0002-4168-5539"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yang Zhang","raw_affiliation_strings":["State Grid Heilongjiang Electric Power Co., Ltd. Harbin Power Supply Company, China"],"affiliations":[{"raw_affiliation_string":"State Grid Heilongjiang Electric Power Co., Ltd. Harbin Power Supply Company, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070532621","display_name":"H X Chen","orcid":"https://orcid.org/0009-0003-0390-1971"},"institutions":[{"id":"https://openalex.org/I182722699","display_name":"Shenzhen Polytechnic University","ror":"https://ror.org/00d2w9g53","country_code":"CN","type":"education","lineage":["https://openalex.org/I182722699"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haisong Chen","raw_affiliation_strings":["Shenzhen Polytechnic University, China"],"affiliations":[{"raw_affiliation_string":"Shenzhen Polytechnic University, China","institution_ids":["https://openalex.org/I182722699"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100693070","display_name":"Aili Wang","orcid":"https://orcid.org/0000-0002-9118-230X"},"institutions":[{"id":"https://openalex.org/I100188998","display_name":"Harbin University of Science and Technology","ror":"https://ror.org/04e6y1282","country_code":"CN","type":"education","lineage":["https://openalex.org/I100188998"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Aili Wang","raw_affiliation_strings":["Heilongjiang Province Key Laboratory of Laser Spectroscopy Technology and Application, Harbin University of Science and Technology, China"],"affiliations":[{"raw_affiliation_string":"Heilongjiang Province Key Laboratory of Laser Spectroscopy Technology and Application, Harbin University of Science and Technology, China","institution_ids":["https://openalex.org/I100188998"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5070861058"],"corresponding_institution_ids":["https://openalex.org/I100188998"],"apc_list":null,"apc_paid":null,"fwci":0.2027,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.64232368,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"134","last_page":"142"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9919999837875366,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9663000106811523,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.741648256778717},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.634673535823822},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.462100625038147},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.44836729764938354},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.44081786274909973},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.44057855010032654},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13115811347961426},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10934972763061523},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08696350455284119}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.741648256778717},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.634673535823822},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.462100625038147},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.44836729764938354},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.44081786274909973},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.44057855010032654},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13115811347961426},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10934972763061523},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08696350455284119},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3638682.3638703","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3638682.3638703","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2023 5th International Conference on Video, Signal and Image Processing","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1981276685","https://openalex.org/W2911054611","https://openalex.org/W3019407890","https://openalex.org/W4301045096","https://openalex.org/W6600120041"],"related_works":["https://openalex.org/W2051487156","https://openalex.org/W2073681303","https://openalex.org/W2053286651","https://openalex.org/W2181743346","https://openalex.org/W2187401768","https://openalex.org/W2181413294","https://openalex.org/W2989452537","https://openalex.org/W2052122378","https://openalex.org/W2544423928","https://openalex.org/W2062023542"],"abstract_inverted_index":{"Chip":[0],"package":[1],"testing":[2],"is":[3,119,130,134],"a":[4,87],"key":[5],"process":[6],"to":[7,52,65,76],"eliminate":[8],"bad":[9],"products":[10],"in":[11,23,58],"the":[12,17,54,61,70,84,108,112,125],"electronics":[13],"industry.":[14],"Aiming":[15],"at":[16],"problems":[18],"of":[19,32,56,63,74,95,114,127,146],"YOLOv3":[20,37,110],"chip":[21,115,147],"detection":[22,39,90,118,145],"complex":[24],"environments":[25],"with":[26,107],"low":[27],"accuracy":[28],"and":[29,69,103],"large":[30],"number":[31,126],"model":[33,66,85,128],"parameters,":[34],"an":[35],"improved":[36,120],"automatic":[38,144],"method":[40,49,138],"based":[41],"on":[42,92],"EMO,":[43],"called":[44],"EMO-YOLOV3,":[45],"was":[46],"proposed.":[47],"This":[48],"uses":[50],"EMO":[51],"replace":[53],"backbone":[55],"Darknet53":[57],"YOLOv3,":[59],"inherits":[60],"efficiency":[62],"CNN":[64],"short-range":[67],"dependencies":[68],"dynamic":[71],"modeling":[72],"capability":[73],"Transformer":[75],"learn":[77],"long-distance":[78],"interactions.":[79],"The":[80],"results":[81],"show":[82],"that":[83,136],"has":[86],"very":[88],"good":[89],"effect":[91],"7":[93],"kinds":[94],"environment,":[96],"such":[97],"as":[98],"character":[99],"defect,":[100],"scratch":[101],"defect":[102,117],"braid":[104],"damage.":[105],"Compared":[106],"original":[109],"model,":[111],"mAP":[113],"surface":[116,148],"by":[121],"about":[122],"3.4%":[123],"while":[124],"parameters":[129],"reduced.":[131],"Therefore,":[132],"it":[133],"considered":[135],"this":[137],"can":[139],"be":[140],"used":[141],"for":[142],"real-time":[143],"defects.":[149]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}