{"id":"https://openalex.org/W4398196933","doi":"https://doi.org/10.1145/3638682.3638696","title":"Failure Mode Analysis and Infrared Image Recognition of Crystalline Silicon PV Module","display_name":"Failure Mode Analysis and Infrared Image Recognition of Crystalline Silicon PV Module","publication_year":2023,"publication_date":"2023-11-24","ids":{"openalex":"https://openalex.org/W4398196933","doi":"https://doi.org/10.1145/3638682.3638696"},"language":"en","primary_location":{"id":"doi:10.1145/3638682.3638696","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3638682.3638696","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/3638682.3638696","source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2023 5th International Conference on Video, Signal and Image Processing","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://dl.acm.org/doi/pdf/10.1145/3638682.3638696","any_repository_has_fulltext":null},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Ziyi Li","orcid":"https://orcid.org/0009-0004-2701-0935"},"institutions":[{"id":"https://openalex.org/I100188998","display_name":"Harbin University of Science and Technology","ror":"https://ror.org/04e6y1282","country_code":"CN","type":"education","lineage":["https://openalex.org/I100188998"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ziyi Li","raw_affiliation_strings":["School of Measurement and Control Technology and Communication Engineering, Harbin University of Science and Technology, China"],"raw_orcid":"https://orcid.org/0009-0004-2701-0935","affiliations":[{"raw_affiliation_string":"School of Measurement and Control Technology and Communication Engineering, Harbin University of Science and Technology, China","institution_ids":["https://openalex.org/I100188998"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035570294","display_name":"Lijie Wang","orcid":"https://orcid.org/0009-0000-2284-0447"},"institutions":[{"id":"https://openalex.org/I100188998","display_name":"Harbin University of Science and Technology","ror":"https://ror.org/04e6y1282","country_code":"CN","type":"education","lineage":["https://openalex.org/I100188998"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lijie Wang","raw_affiliation_strings":["School of Measurement and Control Technology and Communication Engineering, Harbin University of Science and Technology, China"],"raw_orcid":"https://orcid.org/0009-0000-2284-0447","affiliations":[{"raw_affiliation_string":"School of Measurement and Control Technology and Communication Engineering, Harbin University of Science and Technology, China","institution_ids":["https://openalex.org/I100188998"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113588182","display_name":"J. Sun","orcid":"https://orcid.org/0009-0000-6451-6047"},"institutions":[{"id":"https://openalex.org/I100188998","display_name":"Harbin University of Science and Technology","ror":"https://ror.org/04e6y1282","country_code":"CN","type":"education","lineage":["https://openalex.org/I100188998"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianbo Sun","raw_affiliation_strings":["School of Measurement and Control Technology and Communication Engineering, Harbin University of Science and Technology, China"],"raw_orcid":"https://orcid.org/0009-0000-6451-6047","affiliations":[{"raw_affiliation_string":"School of Measurement and Control Technology and Communication Engineering, Harbin University of Science and Technology, China","institution_ids":["https://openalex.org/I100188998"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051226519","display_name":"Xinyu Lu","orcid":"https://orcid.org/0009-0008-7554-9483"},"institutions":[{"id":"https://openalex.org/I100188998","display_name":"Harbin University of Science and Technology","ror":"https://ror.org/04e6y1282","country_code":"CN","type":"education","lineage":["https://openalex.org/I100188998"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinyu Lu","raw_affiliation_strings":["School of Measurement and Control Technology and Communication Engineering, Harbin University of Science and Technology, China"],"raw_orcid":"https://orcid.org/0009-0008-7554-9483","affiliations":[{"raw_affiliation_string":"School of Measurement and Control Technology and Communication Engineering, Harbin University of Science and Technology, China","institution_ids":["https://openalex.org/I100188998"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111208231","display_name":"X.C. Zhu","orcid":"https://orcid.org/0009-0005-0972-3410"},"institutions":[{"id":"https://openalex.org/I100188998","display_name":"Harbin University of Science and Technology","ror":"https://ror.org/04e6y1282","country_code":"CN","type":"education","lineage":["https://openalex.org/I100188998"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xianwen Zhu","raw_affiliation_strings":["School of Measurement and Control Technology and Communication Engineering, Harbin University of Science and Technology, China"],"raw_orcid":"https://orcid.org/0009-0005-0972-3410","affiliations":[{"raw_affiliation_string":"School of Measurement and Control Technology and Communication Engineering, Harbin University of Science and Technology, China","institution_ids":["https://openalex.org/I100188998"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I100188998"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.41602067,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"93","last_page":"100"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10468","display_name":"Photovoltaic System Optimization Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10468","display_name":"Photovoltaic System Optimization Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9837999939918518,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.6710778474807739},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.6053735017776489},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5909373760223389},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5786142349243164},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.556134045124054},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5492005348205566},{"id":"https://openalex.org/keywords/photovoltaic-system","display_name":"Photovoltaic system","score":0.49828624725341797},{"id":"https://openalex.org/keywords/principal-component-analysis","display_name":"Principal component analysis","score":0.4579519033432007},{"id":"https://openalex.org/keywords/failure-mode-and-effects-analysis","display_name":"Failure mode and effects analysis","score":0.4577220678329468},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4438104033470154},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.42199304699897766},{"id":"https://openalex.org/keywords/frame","display_name":"Frame (networking)","score":0.41928336024284363},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.33050456643104553},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.239467591047287},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.0921795666217804}],"concepts":[{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.6710778474807739},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.6053735017776489},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5909373760223389},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5786142349243164},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.556134045124054},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5492005348205566},{"id":"https://openalex.org/C41291067","wikidata":"https://www.wikidata.org/wiki/Q1897785","display_name":"Photovoltaic system","level":2,"score":0.49828624725341797},{"id":"https://openalex.org/C27438332","wikidata":"https://www.wikidata.org/wiki/Q2873","display_name":"Principal component analysis","level":2,"score":0.4579519033432007},{"id":"https://openalex.org/C66283442","wikidata":"https://www.wikidata.org/wiki/Q1389268","display_name":"Failure mode and effects analysis","level":2,"score":0.4577220678329468},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4438104033470154},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.42199304699897766},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.41928336024284363},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.33050456643104553},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.239467591047287},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.0921795666217804},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3638682.3638696","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3638682.3638696","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/3638682.3638696","source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2023 5th International Conference on Video, Signal and Image Processing","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1145/3638682.3638696","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3638682.3638696","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/3638682.3638696","source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2023 5th International Conference on Video, Signal and Image Processing","raw_type":"proceedings-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4398196933.pdf","grobid_xml":"https://content.openalex.org/works/W4398196933.grobid-xml"},"referenced_works_count":4,"referenced_works":["https://openalex.org/W1904365287","https://openalex.org/W3216275135","https://openalex.org/W4300939921","https://openalex.org/W4313357060"],"related_works":["https://openalex.org/W1975632186","https://openalex.org/W3027745756","https://openalex.org/W3205213561","https://openalex.org/W2531880140","https://openalex.org/W2126145365","https://openalex.org/W2036609560","https://openalex.org/W346861917","https://openalex.org/W3024018414","https://openalex.org/W1542592062","https://openalex.org/W2474947501"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"the":[3,30,38,43,53,86,98,102,106,113,119,140,170],"fault":[4,41,55],"analysis":[5,46],"of":[6,40,57,64,101,143,153,172],"crystalline":[7],"silicon":[8],"photovoltaic":[9],"modules":[10,135],"is":[11,79,146],"studied.":[12],"The":[13,67,81,148],"Failure":[14],"Mode":[15],"and":[16,20,33,47,61,76,94,118,156,162],"Effect":[17],"Analysis":[18,23],"(FMEA)":[19],"Fault":[21],"Tree":[22],"(FTA)":[24],"methods":[25,49],"are":[26,50,159],"used":[27],"to":[28,110],"analyze":[29],"failure":[31],"mode":[32],"its":[34],"causes.":[35],"Based":[36],"on":[37,73],"results":[39,83],"analysis,":[42],"infrared":[44,58],"image":[45,69,88],"recognition":[48,70,89],"studied":[51],"for":[52],"two":[54],"modes":[56],"hot":[59,154],"spot":[60,155],"component":[62,157],"shedding":[63,158],"Photovoltaic(PV)":[65],"modules.":[66],"YOLOv5s":[68,87],"method":[71],"based":[72],"clustering":[74,92],"improvement":[75,93],"feature":[77,95,133],"enhancement":[78,96,134],"discussed.":[80],"experimental":[82],"show":[84],"that":[85],"algorithm":[90],"with":[91],"improves":[97],"training":[99],"effect":[100],"model":[103],"by":[104,130],"using":[105],"EIOU":[107],"loss":[108,115],"function":[109],"adaptively":[111],"adjust":[112],"confidence":[114],"balance":[116],"coefficient,":[117],"detection":[120,138],"speed":[121],"(Frame":[122],"Per":[123],"Second,":[124],"FPS)":[125],"can":[126,167],"reach":[127],"42.37":[128],"FPS;":[129],"adding":[131],"InRe":[132],"before":[136],"each":[137],"layer,":[139],"extraction":[141],"ability":[142],"target":[144],"features":[145],"improved.":[147],"mean":[149],"Average":[150],"Precision":[151],"(mAP)":[152],"94.85":[160],"%":[161],"90.67":[163],"%,":[164],"respectively,":[165],"which":[166],"fully":[168],"meet":[169],"needs":[171],"UAV":[173],"automatic":[174],"inspection.":[175]},"counts_by_year":[],"updated_date":"2026-07-31T08:31:51.225901","created_date":"2025-10-10T00:00:00"}