{"id":"https://openalex.org/W4389892719","doi":"https://doi.org/10.1145/3631476","title":"Introduction to the Special Issue on Design for Testability and Reliability of Security-aware Hardware","display_name":"Introduction to the Special Issue on Design for Testability and Reliability of Security-aware Hardware","publication_year":2023,"publication_date":"2023-12-18","ids":{"openalex":"https://openalex.org/W4389892719","doi":"https://doi.org/10.1145/3631476"},"language":"en","primary_location":{"id":"doi:10.1145/3631476","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3631476","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"},"type":"editorial","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://kyutech.repo.nii.ac.jp/records/2001002","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085987622","display_name":"Tianming Ni","orcid":"https://orcid.org/0000-0001-6272-8660"},"institutions":[{"id":"https://openalex.org/I70908550","display_name":"Anhui Polytechnic University","ror":"https://ror.org/041sj0284","country_code":"CN","type":"education","lineage":["https://openalex.org/I70908550"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianming Ni","raw_affiliation_strings":["Anhui Polytechnic University"],"raw_orcid":"https://orcid.org/0000-0001-6272-8660","affiliations":[{"raw_affiliation_string":"Anhui Polytechnic University","institution_ids":["https://openalex.org/I70908550"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I135598925","display_name":"Kyushu University","ror":"https://ror.org/00p4k0j84","country_code":"JP","type":"education","lineage":["https://openalex.org/I135598925"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xiaoqing Wen","raw_affiliation_strings":["Kyushu University"],"raw_orcid":"https://orcid.org/0000-0001-8305-604X","affiliations":[{"raw_affiliation_string":"Kyushu University","institution_ids":["https://openalex.org/I135598925"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059133190","display_name":"Hussam Amrouch","orcid":"https://orcid.org/0000-0002-5649-3102"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hussam Amrouch","raw_affiliation_strings":["University of Stuttgart"],"raw_orcid":"https://orcid.org/0000-0002-5649-3102","affiliations":[{"raw_affiliation_string":"University of Stuttgart","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054211420","display_name":"Cheng Zhuo","orcid":"https://orcid.org/0000-0002-2610-7522"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Cheng Zhuo","raw_affiliation_strings":["Zhejiang University"],"raw_orcid":"https://orcid.org/0000-0002-2610-7522","affiliations":[{"raw_affiliation_string":"Zhejiang University","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021230706","display_name":"Peilin Song","orcid":"https://orcid.org/0000-0003-1756-6599"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Peilin Song","raw_affiliation_strings":["IBM"],"raw_orcid":"https://orcid.org/0000-0003-1756-6599","affiliations":[{"raw_affiliation_string":"IBM","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"29","issue":"1","first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.8425999879837036,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.8425999879837036,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.8385000228881836,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.7773000001907349,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.8069199323654175},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7517832517623901},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6411121487617493},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5869892835617065},{"id":"https://openalex.org/keywords/hardware-security-module","display_name":"Hardware security module","score":0.5855004191398621},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5691895484924316},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5025346279144287},{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.49074018001556396},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.4051857590675354},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3321034908294678},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.2717543840408325},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1158037781715393}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.8069199323654175},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7517832517623901},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6411121487617493},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5869892835617065},{"id":"https://openalex.org/C39217717","wikidata":"https://www.wikidata.org/wiki/Q1432354","display_name":"Hardware security module","level":3,"score":0.5855004191398621},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5691895484924316},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5025346279144287},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.49074018001556396},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.4051857590675354},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3321034908294678},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.2717543840408325},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1158037781715393},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1145/3631476","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3631476","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"},{"id":"pmh:oai:irdb.nii.ac.jp:01216:0006481149","is_oa":true,"landing_page_url":"https://kyutech.repo.nii.ac.jp/records/2001002","pdf_url":null,"source":{"id":"https://openalex.org/S7407056385","display_name":"Institutional Repositories DataBase (IRDB)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184597095","host_organization_name":"National Institute of Informatics","host_organization_lineage":["https://openalex.org/I184597095"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal article"},{"id":"pmh:oai:kyutech.repo.nii.ac.jp:02001002","is_oa":true,"landing_page_url":"http://hdl.handle.net/10228/0002001002","pdf_url":"https://kyutech.repo.nii.ac.jp/record/2001002/files/10441916.pdf","source":null,"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"VoR"}],"best_oa_location":{"id":"pmh:oai:irdb.nii.ac.jp:01216:0006481149","is_oa":true,"landing_page_url":"https://kyutech.repo.nii.ac.jp/records/2001002","pdf_url":null,"source":{"id":"https://openalex.org/S7407056385","display_name":"Institutional Repositories DataBase (IRDB)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184597095","host_organization_name":"National Institute of Informatics","host_organization_lineage":["https://openalex.org/I184597095"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5699999928474426,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2157191248","https://openalex.org/W2107525390","https://openalex.org/W2150046587","https://openalex.org/W2164493372","https://openalex.org/W2153086993","https://openalex.org/W2114980936","https://openalex.org/W2118697956","https://openalex.org/W4249526199","https://openalex.org/W2128920253","https://openalex.org/W2142405811"],"abstract_inverted_index":{"The":[0,152],"research":[1],"on":[2],"design":[3,40,92,112,138,142],"for":[4,127],"testability":[5],"and":[6,17,27,60,74,86,110,136,155,163,174,180],"reliability":[7],"of":[8,57,113,140],"security-aware":[9],"hardware":[10,23,39,69],"has":[11,158],"been":[12],"important":[13,80],"in":[14,35,120,166],"both":[15],"academia":[16,162],"industry.":[18],"With":[19],"ever-growing":[20],"globalization,":[21],"commercial":[22],"design,":[24],"manufacturing,":[25],"transportation,":[26],"supply":[28],"now":[29],"involve":[30],"many":[31],"different":[32,91,114],"countries,":[33],"resulting":[34],"aggravated":[36],"vulnerability":[37],"from":[38,48,90,161,177],"to":[41,124,148,171],"manufacturing.":[42],"Hardware":[43],"with":[44],"malicious":[45],"purposes":[46],"implanted":[47],"the":[49,55,95,101,107,128,133,167,172],"third-party":[50],"manufacturing":[51],"process":[52],"may":[53],"control":[54],"operation":[56],"a":[58,121],"circuit":[59],"tamper":[61],"its":[62],"functions,":[63],"causing":[64],"serious":[65],"security":[66,87,111,137,156],"issues.":[67],"However,":[68],"includes":[70],"not":[71],"only":[72],"devices":[73],"circuits":[75],"but":[76,94],"also":[77],"systems.":[78],"An":[79],"fact":[81],"is":[82,98],"that":[83],"testability,":[84,108,134,153],"reliability,":[85,109,135,154],"technologies":[88,139],"come":[89],"layers,":[93],"impact":[96],"evaluation":[97],"conducted":[99,147],"at":[100],"system":[102],"level.":[103],"In":[104,131],"other":[105],"words,":[106],"layers":[115],"can":[116,144],"be":[117,145],"carried":[118],"out":[119],"holistic":[122],"manner":[123],"achieve":[125,149],"optimization":[126],"whole":[129],"system.":[130],"addition,":[132],"each":[141],"layer":[143],"collaboratively":[146],"better":[150],"performance.":[151],"tradeoff":[157],"garnered":[159],"attention":[160],"industry,":[164],"particularly":[165],"Post-Moore":[168],"Era,":[169],"due":[170],"complexities":[173],"opportunities":[175],"arising":[176],"new":[178],"architectures":[179],"technologies.":[181]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}