{"id":"https://openalex.org/W4389766760","doi":"https://doi.org/10.1145/3624288.3624302","title":"Grand Challenges in Printed Circuit Board Defect Detection Based on Image Processing","display_name":"Grand Challenges in Printed Circuit Board Defect Detection Based on Image Processing","publication_year":2023,"publication_date":"2023-05-26","ids":{"openalex":"https://openalex.org/W4389766760","doi":"https://doi.org/10.1145/3624288.3624302"},"language":"en","primary_location":{"id":"doi:10.1145/3624288.3624302","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3624288.3624302","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 8th International Conference on Big Data and Computing","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041974099","display_name":"Mary Jane C. Samonte","orcid":"https://orcid.org/0000-0001-9867-8722"},"institutions":[{"id":"https://openalex.org/I137967721","display_name":"Map\u00faa University","ror":"https://ror.org/040rd2b57","country_code":"PH","type":"facility","lineage":["https://openalex.org/I137967721"]}],"countries":["PH"],"is_corresponding":false,"raw_author_name":"Mary Jane Samonte","raw_affiliation_strings":["Mapua University, Philippines"],"raw_orcid":"https://orcid.org/0000-0001-9867-8722","affiliations":[{"raw_affiliation_string":"Mapua University, Philippines","institution_ids":["https://openalex.org/I137967721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023571654","display_name":"Chuanxiang Du","orcid":"https://orcid.org/0000-0002-0768-958X"},"institutions":[{"id":"https://openalex.org/I137967721","display_name":"Map\u00faa University","ror":"https://ror.org/040rd2b57","country_code":"PH","type":"facility","lineage":["https://openalex.org/I137967721"]}],"countries":["PH"],"is_corresponding":false,"raw_author_name":"Chuanxiang Du","raw_affiliation_strings":["Mapua University, Philippines"],"raw_orcid":"https://orcid.org/0000-0002-0768-958X","affiliations":[{"raw_affiliation_string":"Mapua University, Philippines","institution_ids":["https://openalex.org/I137967721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006442015","display_name":"Xiaomian Li","orcid":"https://orcid.org/0000-0002-0938-9329"},"institutions":[{"id":"https://openalex.org/I137967721","display_name":"Map\u00faa University","ror":"https://ror.org/040rd2b57","country_code":"PH","type":"facility","lineage":["https://openalex.org/I137967721"]}],"countries":["PH"],"is_corresponding":false,"raw_author_name":"Xiaomian Li","raw_affiliation_strings":["Mapua University, Philippines"],"raw_orcid":"https://orcid.org/0000-0002-0938-9329","affiliations":[{"raw_affiliation_string":"Mapua University, Philippines","institution_ids":["https://openalex.org/I137967721"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101532668","display_name":"Xiaoyan Wei","orcid":"https://orcid.org/0000-0002-9884-2104"},"institutions":[{"id":"https://openalex.org/I137967721","display_name":"Map\u00faa University","ror":"https://ror.org/040rd2b57","country_code":"PH","type":"facility","lineage":["https://openalex.org/I137967721"]}],"countries":["PH"],"is_corresponding":false,"raw_author_name":"Xiaoyan Wei","raw_affiliation_strings":["Mapua University, Philippines"],"raw_orcid":"https://orcid.org/0000-0002-9884-2104","affiliations":[{"raw_affiliation_string":"Mapua University, Philippines","institution_ids":["https://openalex.org/I137967721"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.28519699,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"94","last_page":"100"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9761999845504761,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7548233866691589},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7301315069198608},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.6707357168197632},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5733489990234375},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5728009343147278},{"id":"https://openalex.org/keywords/grayscale","display_name":"Grayscale","score":0.5693371295928955},{"id":"https://openalex.org/keywords/histogram","display_name":"Histogram","score":0.5488234758377075},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.49955105781555176},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.498884916305542},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.47574305534362793},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.4645179808139801},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4223375916481018}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7548233866691589},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7301315069198608},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.6707357168197632},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5733489990234375},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5728009343147278},{"id":"https://openalex.org/C78201319","wikidata":"https://www.wikidata.org/wiki/Q685727","display_name":"Grayscale","level":3,"score":0.5693371295928955},{"id":"https://openalex.org/C53533937","wikidata":"https://www.wikidata.org/wiki/Q185020","display_name":"Histogram","level":3,"score":0.5488234758377075},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.49955105781555176},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.498884916305542},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.47574305534362793},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4645179808139801},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4223375916481018},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3624288.3624302","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3624288.3624302","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 8th International Conference on Big Data and Computing","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1574818812","https://openalex.org/W1969294188","https://openalex.org/W2044465660","https://openalex.org/W2089500134","https://openalex.org/W2618530766","https://openalex.org/W2768955070","https://openalex.org/W2941001797","https://openalex.org/W3117946660","https://openalex.org/W3186516637","https://openalex.org/W4214678470","https://openalex.org/W4220793365","https://openalex.org/W4312738608","https://openalex.org/W6600762866","https://openalex.org/W6819060087"],"related_works":["https://openalex.org/W115686965","https://openalex.org/W2768918307","https://openalex.org/W2110031805","https://openalex.org/W2040020606","https://openalex.org/W4252608911","https://openalex.org/W4362659915","https://openalex.org/W2113071088","https://openalex.org/W2184913151","https://openalex.org/W1555939286","https://openalex.org/W2339449039"],"abstract_inverted_index":{"It":[0],"is":[1,38,103,129,136,146],"difficult":[2],"to":[3,29,66],"avoid":[4],"defects":[5],"in":[6,77],"the":[7,36,51,108,119,123,155,159,171,178,187,192],"production":[8],"process":[9],"of":[10,92,122,143,163,177,191],"printed":[11,30],"circuit":[12,31],"boards.":[13],"Traditional":[14],"manual":[15],"methods":[16],"are":[17,166,180],"not":[18,40],"effective.":[19],"In":[20],"recent":[21],"years,":[22],"deep":[23,74],"learning":[24,75],"has":[25,89,195],"been":[26],"gradually":[27],"applied":[28],"board":[32],"(PCB)":[33],"detection,":[34,49],"but":[35],"accuracy":[37,135,162,173],"still":[39],"high.":[41],"This":[42],"paper":[43],"starts":[44],"with":[45],"PCB":[46,109,144],"image":[47,52,54,110,145],"defect":[48,69,140],"preprocesses":[50],"through":[53,113],"graying,":[55],"grayscale":[56],"histogram":[57],"equalization":[58],"and":[59,71,80,95,105,132,161,174,189,194],"Gaussian":[60],"filtering,":[61],"uses":[62,73],"machine":[63],"vision":[64],"technology":[65],"realize":[67],"global":[68],"detection":[70,142,165],"location,":[72],"method":[76],"feature":[78,85,93],"extraction,":[79,94],"then":[81],"proposes":[82],"a":[83,97],"multi-scale":[84],"fusion":[86],"method,":[87],"which":[88,185],"high":[90,196],"quality":[91],"forms":[96],"Resnet101":[98,125],"fine-tuning":[99,126],"network.":[100],"The":[101],"network":[102,128],"trained":[104],"verified":[106],"on":[107,149],"data":[111],"set":[112],"migration":[114],"learning.":[115],"Experiments":[116,168],"show":[117,169],"that":[118,170],"recognition":[120],"rate":[121],"improved":[124],"neural":[127],"significantly":[130],"improved,":[131],"its":[133],"average":[134,172],"also":[137,181],"higher.":[138],"Finally,":[139],"target":[141,164],"realized":[147],"based":[148],"fast":[150],"RCNN":[151,157],"algorithm.":[152],"By":[153],"improving":[154],"Faster":[156],"algorithm,":[158],"efficiency":[160],"improved.":[167],"mAP":[175],"value":[176],"algorithm":[179,193],"higher":[182],"than":[183],"others,":[184],"verifies":[186],"effectiveness":[188],"versatility":[190],"practical":[197],"value.":[198]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}