{"id":"https://openalex.org/W4385299189","doi":"https://doi.org/10.1145/3603781.3604218","title":"Design and Research of Intelligent Weld Defect Detection System","display_name":"Design and Research of Intelligent Weld Defect Detection System","publication_year":2023,"publication_date":"2023-05-26","ids":{"openalex":"https://openalex.org/W4385299189","doi":"https://doi.org/10.1145/3603781.3604218"},"language":"en","primary_location":{"id":"doi:10.1145/3603781.3604218","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3603781.3604218","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2023 4th International Conference on Computing, Networks and Internet of Things","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102011073","display_name":"Jiacheng Zhou","orcid":"https://orcid.org/0009-0004-6192-9988"},"institutions":[{"id":"https://openalex.org/I3923682","display_name":"Soochow University","ror":"https://ror.org/05t8y2r12","country_code":"CN","type":"education","lineage":["https://openalex.org/I3923682"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jiacheng Zhou","raw_affiliation_strings":["School of Optoelectronic Science and Engineering, Soochow University, China"],"affiliations":[{"raw_affiliation_string":"School of Optoelectronic Science and Engineering, Soochow University, China","institution_ids":["https://openalex.org/I3923682"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102908765","display_name":"Zhixin Qiu","orcid":"https://orcid.org/0009-0004-6868-6763"},"institutions":[{"id":"https://openalex.org/I3923682","display_name":"Soochow University","ror":"https://ror.org/05t8y2r12","country_code":"CN","type":"education","lineage":["https://openalex.org/I3923682"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhixin Qiu","raw_affiliation_strings":["School of Optoelectronic Science and Engineering, Soochow University, China"],"affiliations":[{"raw_affiliation_string":"School of Optoelectronic Science and Engineering, Soochow University, China","institution_ids":["https://openalex.org/I3923682"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109187643","display_name":"Jianwei Niu","orcid":"https://orcid.org/0009-0004-0914-338X"},"institutions":[{"id":"https://openalex.org/I3923682","display_name":"Soochow University","ror":"https://ror.org/05t8y2r12","country_code":"CN","type":"education","lineage":["https://openalex.org/I3923682"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianwei Niu","raw_affiliation_strings":["School of Optoelectronic Science and Engineering, Soochow University, China"],"affiliations":[{"raw_affiliation_string":"School of Optoelectronic Science and Engineering, Soochow University, China","institution_ids":["https://openalex.org/I3923682"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079849370","display_name":"Jiamin Huang","orcid":"https://orcid.org/0009-0004-7112-0285"},"institutions":[{"id":"https://openalex.org/I3923682","display_name":"Soochow University","ror":"https://ror.org/05t8y2r12","country_code":"CN","type":"education","lineage":["https://openalex.org/I3923682"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiamin Huang","raw_affiliation_strings":["School of Optoelectronic Science and Engineering, Soochow University, China"],"affiliations":[{"raw_affiliation_string":"School of Optoelectronic Science and Engineering, Soochow University, China","institution_ids":["https://openalex.org/I3923682"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079358356","display_name":"Xiaoping Pan","orcid":"https://orcid.org/0009-0001-4586-8327"},"institutions":[{"id":"https://openalex.org/I3923682","display_name":"Soochow University","ror":"https://ror.org/05t8y2r12","country_code":"CN","type":"education","lineage":["https://openalex.org/I3923682"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoping Pan","raw_affiliation_strings":["School of Optoelectronic Science and Engineering, Soochow University, China"],"affiliations":[{"raw_affiliation_string":"School of Optoelectronic Science and Engineering, Soochow University, China","institution_ids":["https://openalex.org/I3923682"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006311218","display_name":"Zhi Tao","orcid":"https://orcid.org/0000-0001-8715-6603"},"institutions":[{"id":"https://openalex.org/I3923682","display_name":"Soochow University","ror":"https://ror.org/05t8y2r12","country_code":"CN","type":"education","lineage":["https://openalex.org/I3923682"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhi Tao","raw_affiliation_strings":["School of Optoelectronic Science and Engineering, Soochow University, China"],"affiliations":[{"raw_affiliation_string":"School of Optoelectronic Science and Engineering, Soochow University, China","institution_ids":["https://openalex.org/I3923682"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5102011073"],"corresponding_institution_ids":["https://openalex.org/I3923682"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14893493,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"943","last_page":"947"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.9934999942779541,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/welding","display_name":"Welding","score":0.8352940082550049},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5758056044578552},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.5159435868263245},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.514130175113678},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.45617198944091797},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.45572131872177124},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.4109554886817932},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3904374837875366},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.2821299433708191},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2403605878353119},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10430905222892761}],"concepts":[{"id":"https://openalex.org/C19474535","wikidata":"https://www.wikidata.org/wiki/Q131172","display_name":"Welding","level":2,"score":0.8352940082550049},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5758056044578552},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5159435868263245},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.514130175113678},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.45617198944091797},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.45572131872177124},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.4109554886817932},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3904374837875366},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.2821299433708191},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2403605878353119},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10430905222892761},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3603781.3604218","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3603781.3604218","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2023 4th International Conference on Computing, Networks and Internet of Things","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2502556230","https://openalex.org/W2911923560","https://openalex.org/W3031534717","https://openalex.org/W3138118886","https://openalex.org/W3211749075","https://openalex.org/W4220986642","https://openalex.org/W4281561723","https://openalex.org/W4312383555","https://openalex.org/W6724673459"],"related_works":["https://openalex.org/W2085033728","https://openalex.org/W4285411112","https://openalex.org/W2262409920","https://openalex.org/W3192220280","https://openalex.org/W2514640320","https://openalex.org/W2549651119","https://openalex.org/W2171299904","https://openalex.org/W2393201117","https://openalex.org/W1647606319","https://openalex.org/W2922442631"],"abstract_inverted_index":{"In":[0,55],"the":[1,30,36,95,102,104,112,115,125,140,145],"welding":[2,20],"process,":[3],"defects":[4,133],"such":[5],"as":[6],"cracks,":[7],"porosity,":[8],"incomplete":[9,11],"fusion,":[10],"penetration,":[12],"and":[13,24,33,50,81,114,134,144,147],"slag":[14],"inclusion":[15],"may":[16],"occur":[17],"due":[18],"to":[19,52,88],"technology,":[21],"environmental":[22],"factors,":[23],"other":[25],"influences,":[26],"which":[27,66],"directly":[28],"affect":[29],"service":[31],"life":[32],"performance":[34],"of":[35],"welded":[37],"parts":[38],"in":[39,130,139],"all":[40],"aspects.":[41],"Traditional":[42],"manual":[43],"weld":[44,62,69,96,132],"inspection":[45,64],"methods":[46],"are":[47],"inefficient,":[48],"costly,":[49],"susceptible":[51],"subjective":[53],"influences.":[54],"this":[56],"paper,":[57],"we":[58],"propose":[59],"an":[60],"intelligent":[61],"seam":[63,70,97],"system,":[65],"first":[67],"collects":[68],"defect":[71,78,91,105,116],"sample":[72,79],"images,":[73],"builds":[74],"a":[75,84,90],"256*256":[76],"pixel":[77],"library,":[80],"then":[82],"uses":[83],"random":[85],"forest":[86],"algorithm":[87],"establish":[89],"recognition":[92],"model.":[93],"After":[94],"image":[98,113],"is":[99,127],"identified":[100],"by":[101],"model,":[103],"area":[106],"can":[107,118,135],"be":[108,119,136],"automatically":[109],"located":[110],"on":[111],"type":[117],"displayed.":[120],"Experiments":[121],"have":[122],"shown":[123],"that":[124],"system":[126],"highly":[128],"accurate":[129],"identifying":[131],"widely":[137],"used":[138],"machine":[141],"building":[142],"industry":[143],"electrical":[146],"electronics":[148],"industry.":[149]},"counts_by_year":[],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}