{"id":"https://openalex.org/W4324266418","doi":"https://doi.org/10.1145/3579654.3579679","title":"Electromagnetic Pattern Cluster in Latent Space in Near Filed Scanning of a Device","display_name":"Electromagnetic Pattern Cluster in Latent Space in Near Filed Scanning of a Device","publication_year":2022,"publication_date":"2022-12-23","ids":{"openalex":"https://openalex.org/W4324266418","doi":"https://doi.org/10.1145/3579654.3579679"},"language":"en","primary_location":{"id":"doi:10.1145/3579654.3579679","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3579654.3579679","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2022 5th International Conference on Algorithms, Computing and Artificial Intelligence","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069029261","display_name":"Quan Huang","orcid":"https://orcid.org/0000-0002-0142-2892"},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Quan Huang","raw_affiliation_strings":["Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, China"],"affiliations":[{"raw_affiliation_string":"Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, China","institution_ids":["https://openalex.org/I4210113818"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054236638","display_name":"Yuxin Wu","orcid":"https://orcid.org/0000-0002-0544-0190"},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuxin Wu","raw_affiliation_strings":["Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, China"],"affiliations":[{"raw_affiliation_string":"Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, China","institution_ids":["https://openalex.org/I4210113818"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5069029261"],"corresponding_institution_ids":["https://openalex.org/I4210113818"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.13449732,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/emi","display_name":"EMI","score":0.8794478178024292},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.861762523651123},{"id":"https://openalex.org/keywords/electromagnetic-field","display_name":"Electromagnetic field","score":0.7428380250930786},{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"Electromagnetic compatibility","score":0.6226047873497009},{"id":"https://openalex.org/keywords/conducted-electromagnetic-interference","display_name":"Conducted electromagnetic interference","score":0.6203992962837219},{"id":"https://openalex.org/keywords/electromagnetic-radiation","display_name":"Electromagnetic radiation","score":0.5040051341056824},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.49706795811653137},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44748860597610474},{"id":"https://openalex.org/keywords/cluster","display_name":"Cluster (spacecraft)","score":0.4470076262950897},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4441644847393036},{"id":"https://openalex.org/keywords/integer","display_name":"Integer (computer science)","score":0.41471874713897705},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.399235337972641},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.38700753450393677},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.36731040477752686},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22359603643417358},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.20900008082389832},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1722606122493744}],"concepts":[{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.8794478178024292},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.861762523651123},{"id":"https://openalex.org/C28843909","wikidata":"https://www.wikidata.org/wiki/Q177625","display_name":"Electromagnetic field","level":2,"score":0.7428380250930786},{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.6226047873497009},{"id":"https://openalex.org/C147584655","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Conducted electromagnetic interference","level":4,"score":0.6203992962837219},{"id":"https://openalex.org/C149773537","wikidata":"https://www.wikidata.org/wiki/Q12969754","display_name":"Electromagnetic radiation","level":2,"score":0.5040051341056824},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.49706795811653137},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44748860597610474},{"id":"https://openalex.org/C164866538","wikidata":"https://www.wikidata.org/wiki/Q367351","display_name":"Cluster (spacecraft)","level":2,"score":0.4470076262950897},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4441644847393036},{"id":"https://openalex.org/C97137487","wikidata":"https://www.wikidata.org/wiki/Q729138","display_name":"Integer (computer science)","level":2,"score":0.41471874713897705},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.399235337972641},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.38700753450393677},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.36731040477752686},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22359603643417358},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.20900008082389832},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1722606122493744},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3579654.3579679","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3579654.3579679","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2022 5th International Conference on Algorithms, Computing and Artificial Intelligence","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2057097191","https://openalex.org/W2108471477","https://openalex.org/W2174170220","https://openalex.org/W2611557875","https://openalex.org/W2786026228","https://openalex.org/W2919075705","https://openalex.org/W2963761396","https://openalex.org/W3095079237","https://openalex.org/W4246627721"],"related_works":["https://openalex.org/W1986241886","https://openalex.org/W2071764837","https://openalex.org/W2076345965","https://openalex.org/W1921091955","https://openalex.org/W2170868587","https://openalex.org/W2041511579","https://openalex.org/W2077896430","https://openalex.org/W2124450871","https://openalex.org/W2160921373","https://openalex.org/W4242752962"],"abstract_inverted_index":{"Electromagnetic":[0],"pattern":[1,95],"is":[2,22,41],"an":[3],"image":[4],"generated":[5],"from":[6],"near":[7],"field":[8,10],"electromagnetic":[9,34,39,73,94,119],"of":[11,38,47,83,93],"a":[12,84],"device":[13],"such":[14],"as":[15],"microprogrammed":[16],"control":[17],"unit":[18],"(MCU)":[19],"when":[20,98],"it":[21],"working.":[23],"Many":[24],"Electro-Magnetic":[25],"Interference":[26],"(EMI)":[27],"sources":[28],"can":[29,69],"be":[30],"located":[31],"using":[32],"the":[33,45,53,60,71,88,99,100,107,118,122],"patterns.":[35],"The":[36,91],"cluster":[37,110,117],"patterns":[40,120],"helpful":[42],"to":[43],"distinguish":[44],"types":[46],"EMI,":[48],"and":[49],"problems":[50],"caused":[51],"by":[52],"same":[54,61,72],"EMI":[55,108],"are":[56,80],"basicly":[57],"addressed":[58],"in":[59,65,121],"way.":[62],"Different":[63],"frequencies":[64,78],"integrated":[66],"circuite":[67],"(IC)":[68],"have":[70],"patterns,":[74],"especially":[75],"for":[76],"those":[77],"that":[79],"multiple":[81],"integer":[82],"small":[85],"frequency":[86,102],"called":[87],"basic":[89],"frequency.":[90],"magnitude":[92],"becomes":[96],"weak":[97],"corresponding":[101],"gets":[103],"higher,":[104],"which":[105],"makes":[106],"source":[109],"inaccurate.":[111],"To":[112],"tackle":[113],"this":[114],"problem,":[115],"we":[116],"latent":[123],"space.":[124]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}