{"id":"https://openalex.org/W4353031993","doi":"https://doi.org/10.1145/3569052.3578920","title":"NVCell 2","display_name":"NVCell 2","publication_year":2023,"publication_date":"2023-03-22","ids":{"openalex":"https://openalex.org/W4353031993","doi":"https://doi.org/10.1145/3569052.3578920"},"language":"en","primary_location":{"id":"doi:10.1145/3569052.3578920","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3569052.3578920","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/3569052.3578920","source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2023 International Symposium on Physical Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://dl.acm.org/doi/pdf/10.1145/3569052.3578920","any_repository_has_fulltext":null},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053201835","display_name":"Chia-Tung Ho","orcid":"https://orcid.org/0000-0002-6479-7552"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chia-Tung Ho","raw_affiliation_strings":["Nvidia, Santa Clara, CA, USA"],"raw_orcid":"https://orcid.org/0000-0002-6479-7552","affiliations":[{"raw_affiliation_string":"Nvidia, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049333787","display_name":"Alvin Ho","orcid":"https://orcid.org/0000-0001-7989-9909"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alvin Ho","raw_affiliation_strings":["Nvidia, Santa Clara, CA, USA"],"raw_orcid":"https://orcid.org/0000-0001-7989-9909","affiliations":[{"raw_affiliation_string":"Nvidia, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087082539","display_name":"Matthew Fojtik","orcid":"https://orcid.org/0000-0003-3138-9293"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Matthew Fojtik","raw_affiliation_strings":["Nvidia, Durham, NC, USA"],"raw_orcid":"https://orcid.org/0000-0003-3138-9293","affiliations":[{"raw_affiliation_string":"Nvidia, Durham, NC, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100362669","display_name":"Minsoo Kim","orcid":"https://orcid.org/0000-0002-6488-4349"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Minsoo Kim","raw_affiliation_strings":["Nvidia, Austin, TX, USA"],"raw_orcid":"https://orcid.org/0000-0002-6488-4349","affiliations":[{"raw_affiliation_string":"Nvidia, Austin, TX, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067751604","display_name":"Shang Wei","orcid":"https://orcid.org/0000-0002-9454-4265"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shang Wei","raw_affiliation_strings":["Nvidia, Santa Clara, CA, USA"],"raw_orcid":"https://orcid.org/0000-0002-9454-4265","affiliations":[{"raw_affiliation_string":"Nvidia, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003109386","display_name":"Yaguang Li","orcid":"https://orcid.org/0000-0002-6856-2128"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yaguang Li","raw_affiliation_strings":["Nvidia, Austin, TX, USA"],"raw_orcid":"https://orcid.org/0000-0002-6856-2128","affiliations":[{"raw_affiliation_string":"Nvidia, Austin, TX, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010156116","display_name":"Brucek Khailany","orcid":"https://orcid.org/0000-0002-7584-3489"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Brucek Khailany","raw_affiliation_strings":["Nvidia, Austin, TX, USA"],"raw_orcid":"https://orcid.org/0000-0002-7584-3489","affiliations":[{"raw_affiliation_string":"Nvidia, Austin, TX, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029928585","display_name":"Haoxing Ren","orcid":"https://orcid.org/0000-0003-1028-3860"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Haoxing Ren","raw_affiliation_strings":["Nvidia, Austin, TX, USA"],"raw_orcid":"https://orcid.org/0000-0003-1028-3860","affiliations":[{"raw_affiliation_string":"Nvidia, Austin, TX, USA","institution_ids":["https://openalex.org/I4210127875"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.577,"has_fulltext":true,"cited_by_count":21,"citation_normalized_percentile":{"value":0.89840569,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":98,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"44","last_page":"52"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/standard-cell","display_name":"Standard cell","score":0.7272091507911682},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6383970975875854},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5962356925010681},{"id":"https://openalex.org/keywords/routing","display_name":"Routing (electronic design automation)","score":0.564468264579773},{"id":"https://openalex.org/keywords/electronic-design-automation","display_name":"Electronic design automation","score":0.5062912702560425},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.49261194467544556},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.47729647159576416},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.46168532967567444},{"id":"https://openalex.org/keywords/integrated-circuit-layout","display_name":"Integrated circuit layout","score":0.4333766996860504},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.35768717527389526},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3283611536026001},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2675763964653015},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.23348453640937805},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.09379935264587402}],"concepts":[{"id":"https://openalex.org/C78401558","wikidata":"https://www.wikidata.org/wiki/Q464496","display_name":"Standard cell","level":3,"score":0.7272091507911682},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6383970975875854},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5962356925010681},{"id":"https://openalex.org/C74172769","wikidata":"https://www.wikidata.org/wiki/Q1446839","display_name":"Routing (electronic design automation)","level":2,"score":0.564468264579773},{"id":"https://openalex.org/C64260653","wikidata":"https://www.wikidata.org/wiki/Q1194864","display_name":"Electronic design automation","level":2,"score":0.5062912702560425},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.49261194467544556},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.47729647159576416},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.46168532967567444},{"id":"https://openalex.org/C2765594","wikidata":"https://www.wikidata.org/wiki/Q2624187","display_name":"Integrated circuit layout","level":3,"score":0.4333766996860504},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.35768717527389526},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3283611536026001},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2675763964653015},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.23348453640937805},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09379935264587402},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3569052.3578920","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3569052.3578920","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/3569052.3578920","source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2023 International Symposium on Physical Design","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1145/3569052.3578920","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3569052.3578920","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/3569052.3578920","source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2023 International Symposium on Physical Design","raw_type":"proceedings-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.6800000071525574}],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4353031993.pdf","grobid_xml":"https://content.openalex.org/works/W4353031993.grobid-xml"},"referenced_works_count":11,"referenced_works":["https://openalex.org/W1988639050","https://openalex.org/W2742855437","https://openalex.org/W2804268694","https://openalex.org/W2997716136","https://openalex.org/W3040394052","https://openalex.org/W3100453629","https://openalex.org/W3112123566","https://openalex.org/W3127191906","https://openalex.org/W3143696222","https://openalex.org/W3174654674","https://openalex.org/W3211857759"],"related_works":["https://openalex.org/W2111071331","https://openalex.org/W2134385741","https://openalex.org/W2108092114","https://openalex.org/W4247948903","https://openalex.org/W3211857759","https://openalex.org/W1538254313","https://openalex.org/W1976154696","https://openalex.org/W2626325543","https://openalex.org/W2060392256","https://openalex.org/W2251104045"],"abstract_inverted_index":{"Standard":[0],"cells":[1,51,124,131],"are":[2,47],"essential":[3],"components":[4],"of":[5,28,35,94,106,123,129],"modern":[6],"digital":[7],"circuit":[8],"designs.":[9],"With":[10],"process":[11],"technologies":[12],"advancing":[13],"beyond":[14],"the":[15,25,104,130],"5nm":[16],"node,":[17],"more":[18],"routability":[19,54,77,88],"issues":[20],"have":[21],"arisen":[22],"due":[23],"to":[24,49,86,136],"decreasing":[26],"number":[27,32,105],"routing":[29],"tracks,":[30],"increasing":[31],"and":[33,38,80,97,108,115],"complexity":[34],"design":[36,50],"rules,":[37],"strict":[39],"patterning":[40],"rules.":[41],"Automatic":[42],"standard":[43,63,99,139,145],"cell":[44,64,111,140],"synthesis":[45,65],"tools":[46],"struggling":[48],"with":[52,127,142],"severe":[53],"issues.":[55],"In":[56],"this":[57],"paper,":[58],"we":[59],"propose":[60],"a":[61,68,92],"routability-driven":[62],"framework":[66],"using":[67],"novel":[69],"pin":[70,83],"density":[71],"aware":[72],"congestion":[73],"metric,":[74],"lattice":[75],"graph":[76],"modelling":[78],"approach,":[79],"dynamic":[81],"external":[82],"allocation":[84],"methodology":[85],"generate":[87,121],"optimized":[89],"layouts.":[90],"On":[91],"benchmark":[93],"94":[95],"complex":[96],"hard-to-route":[98],"cells,":[100],"NVCell":[101,118],"2":[102,119],"improves":[103],"routable":[107],"LVS/DRC":[109,125],"clean":[110],"layouts":[112],"by":[113],"84.0%":[114],"87.2%,":[116],"respectively.":[117],"can":[120],"98.9%":[122],"clean,":[126],"13.9%":[128],"having":[132],"smaller":[133],"area,":[134],"compared":[135],"an":[137],"industrial":[138],"library":[141],"over":[143],"1000":[144],"cells.":[146]},"counts_by_year":[{"year":2026,"cited_by_count":6},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":6}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2023-03-23T00:00:00"}