{"id":"https://openalex.org/W4296593725","doi":"https://doi.org/10.1145/3563552","title":"Test Point Insertion for Multi-Cycle Power-On Self-Test","display_name":"Test Point Insertion for Multi-Cycle Power-On Self-Test","publication_year":2022,"publication_date":"2022-09-13","ids":{"openalex":"https://openalex.org/W4296593725","doi":"https://doi.org/10.1145/3563552"},"language":"en","primary_location":{"id":"doi:10.1145/3563552","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3563552","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/3563552","source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://dl.acm.org/doi/pdf/10.1145/3563552","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066422669","display_name":"Senling Wang","orcid":"https://orcid.org/0000-0002-7129-8380"},"institutions":[{"id":"https://openalex.org/I43545212","display_name":"Ehime University","ror":"https://ror.org/017hkng22","country_code":"JP","type":"education","lineage":["https://openalex.org/I43545212"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Senling Wang","raw_affiliation_strings":["Graduate School of Science and Engineering, Ehime University, Matsuyama, Ehime, Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Science and Engineering, Ehime University, Matsuyama, Ehime, Japan","institution_ids":["https://openalex.org/I43545212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030409046","display_name":"Xihong Zhou","orcid":"https://orcid.org/0000-0003-1016-2209"},"institutions":[{"id":"https://openalex.org/I43545212","display_name":"Ehime University","ror":"https://ror.org/017hkng22","country_code":"JP","type":"education","lineage":["https://openalex.org/I43545212"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xihong Zhou","raw_affiliation_strings":["Graduate School of Science and Engineering, Ehime University, Matsuyama, Ehime, Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Science and Engineering, Ehime University, Matsuyama, Ehime, Japan","institution_ids":["https://openalex.org/I43545212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080764382","display_name":"Yoshinobu Higami","orcid":"https://orcid.org/0000-0002-2909-6777"},"institutions":[{"id":"https://openalex.org/I43545212","display_name":"Ehime University","ror":"https://ror.org/017hkng22","country_code":"JP","type":"education","lineage":["https://openalex.org/I43545212"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshinobu Higami","raw_affiliation_strings":["Graduate School of Science and Engineering, Ehime University, Matsuyama, Ehime, Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Science and Engineering, Ehime University, Matsuyama, Ehime, Japan","institution_ids":["https://openalex.org/I43545212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101529866","display_name":"Hiroshi Takahashi","orcid":"https://orcid.org/0000-0002-3654-6457"},"institutions":[{"id":"https://openalex.org/I43545212","display_name":"Ehime University","ror":"https://ror.org/017hkng22","country_code":"JP","type":"education","lineage":["https://openalex.org/I43545212"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroshi Takahashi","raw_affiliation_strings":["Graduate School of Science and Engineering, Ehime University, Matsuyama, Ehime, Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Science and Engineering, Ehime University, Matsuyama, Ehime, Japan","institution_ids":["https://openalex.org/I43545212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046088871","display_name":"Hiroyuki Iwata","orcid":"https://orcid.org/0000-0002-0475-8519"},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroyuki Iwata","raw_affiliation_strings":["Renesas Electronics Corporation, Kodaira-shi, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Renesas Electronics Corporation, Kodaira-shi, Tokyo, Japan","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013742522","display_name":"Yoichi Maeda","orcid":"https://orcid.org/0000-0002-3170-8576"},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoichi Maeda","raw_affiliation_strings":["Renesas Electronics Corporation, Kodaira-shi, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Renesas Electronics Corporation, Kodaira-shi, Tokyo, Japan","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078211457","display_name":"Jun Matsushima","orcid":"https://orcid.org/0000-0002-9054-6917"},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Jun Matsushima","raw_affiliation_strings":["Renesas Electronics Corporation, Kodaira-shi, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Renesas Electronics Corporation, Kodaira-shi, Tokyo, Japan","institution_ids":["https://openalex.org/I4210153176"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5066422669"],"corresponding_institution_ids":["https://openalex.org/I43545212"],"apc_list":null,"apc_paid":null,"fwci":1.8165,"has_fulltext":true,"cited_by_count":9,"citation_normalized_percentile":{"value":0.84273218,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":"28","issue":"3","first_page":"1","last_page":"21"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7956409454345703},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.7375829219818115},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6993396282196045},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.691737949848175},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5926357507705688},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.564574658870697},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5293035507202148},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.513645350933075},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5098509192466736},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5092283487319946},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.4844358265399933},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.4729827642440796},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.42500269412994385},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.4205884337425232},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.14887583255767822},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.14237645268440247},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12522995471954346},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11778110265731812},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08718672394752502}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7956409454345703},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.7375829219818115},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6993396282196045},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.691737949848175},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5926357507705688},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.564574658870697},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5293035507202148},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.513645350933075},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5098509192466736},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5092283487319946},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.4844358265399933},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.4729827642440796},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.42500269412994385},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.4205884337425232},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.14887583255767822},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.14237645268440247},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12522995471954346},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11778110265731812},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08718672394752502},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3563552","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3563552","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/3563552","source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1145/3563552","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3563552","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/3563552","source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6899999976158142,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G1977085956","display_name":null,"funder_award_id":"19K11878","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4296593725.pdf","grobid_xml":"https://content.openalex.org/works/W4296593725.grobid-xml"},"referenced_works_count":36,"referenced_works":["https://openalex.org/W1582825744","https://openalex.org/W2018796127","https://openalex.org/W2027873672","https://openalex.org/W2031532240","https://openalex.org/W2039868523","https://openalex.org/W2071316512","https://openalex.org/W2101900253","https://openalex.org/W2104856486","https://openalex.org/W2108254527","https://openalex.org/W2108500347","https://openalex.org/W2119521940","https://openalex.org/W2127343408","https://openalex.org/W2133884850","https://openalex.org/W2135615172","https://openalex.org/W2137549092","https://openalex.org/W2138530143","https://openalex.org/W2167639389","https://openalex.org/W2190312426","https://openalex.org/W2524537451","https://openalex.org/W2565213352","https://openalex.org/W2570421387","https://openalex.org/W2570554800","https://openalex.org/W2781764167","https://openalex.org/W2789438238","https://openalex.org/W2811399752","https://openalex.org/W2905295279","https://openalex.org/W2954535151","https://openalex.org/W2958469817","https://openalex.org/W3096288288","https://openalex.org/W3161984565","https://openalex.org/W4239144429","https://openalex.org/W4240277685","https://openalex.org/W4245729885","https://openalex.org/W4246686973","https://openalex.org/W4256404229","https://openalex.org/W4283759518"],"related_works":["https://openalex.org/W2786111245","https://openalex.org/W3009953521","https://openalex.org/W4285708951","https://openalex.org/W1991935474","https://openalex.org/W2323083271","https://openalex.org/W2091533492","https://openalex.org/W2570882127","https://openalex.org/W2802691720","https://openalex.org/W2021253405","https://openalex.org/W2535245920"],"abstract_inverted_index":{"Under":[0],"the":[1,11,15,21,24,28,34,60,65,73,82,87,93,99,112,144,147],"functional":[2],"safety":[3],"standard":[4],"ISO26262,":[5],"automotive":[6],"systems":[7],"require":[8],"testing":[9],"in":[10],"field,":[12],"such":[13],"as":[14],"power-on":[16,56],"self-test":[17,57],"(POST)":[18],".":[19],"Unlike":[20],"production":[22],"test,":[23],"POST":[25],"requires":[26],"reducing":[27],"test":[29,36,50,61,67,75,107,121],"application":[30,62],"time":[31,63],"to":[32,58,72,80,101,137],"meet":[33],"indispensable":[35,66],"quality":[37],"(e.g.,":[38],">90%":[39],"of":[40,44,106,146],"latent":[41],"fault":[42,83,88,141],"metric)":[43],"ISO26262.":[45],"This":[46],"article":[47],"proposes":[48],"a":[49,103,119],"point":[51,76],"insertion":[52,77],"technique":[53],"for":[54,117],"multi-cycle":[55,94],"reduce":[59],"under":[64,92],"quality.":[68],"The":[69,123],"main":[70],"difference":[71],"existing":[74],"techniques":[78],"is":[79],"solve":[81],"masking":[84],"problem":[85,91],"and":[86,128],"detection":[89],"degradation":[90],"test.":[95],"We":[96],"also":[97],"present":[98],"method":[100],"identify":[102],"user-specified":[104],"amount":[105],"points":[108],"that":[109],"could":[110],"achieve":[111,138],"most":[113],"scan-in":[114],"pattern":[115,133],"reduction":[116,134],"attaining":[118],"target":[120],"coverage.":[122],"experimental":[124],"results":[125],"on":[126,135],"ISCAS89":[127],"ITC99":[129],"benchmarks":[130],"show":[131],"24.4X":[132],"average":[136],"90%":[139],"stuck-at":[140],"coverage":[142],"confirming":[143],"effectiveness":[145],"proposed":[148],"method.":[149]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}