{"id":"https://openalex.org/W4285586669","doi":"https://doi.org/10.1145/3533767.3534370","title":"FDG: a precise measurement of fault diagnosability gain of test cases","display_name":"FDG: a precise measurement of fault diagnosability gain of test cases","publication_year":2022,"publication_date":"2022-07-15","ids":{"openalex":"https://openalex.org/W4285586669","doi":"https://doi.org/10.1145/3533767.3534370"},"language":"en","primary_location":{"id":"doi:10.1145/3533767.3534370","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3533767.3534370","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 31st ACM SIGSOFT International Symposium on Software Testing and Analysis","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["arxiv","crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/2104.06641","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048573106","display_name":"Gabin An","orcid":"https://orcid.org/0000-0002-6521-8858"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Gabin An","raw_affiliation_strings":["KAIST, South Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070401254","display_name":"Shin Yoo","orcid":"https://orcid.org/0000-0002-0836-6993"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Shin Yoo","raw_affiliation_strings":["KAIST, South Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, South Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5048573106"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":1.3743,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.80267663,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"14","last_page":"26"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-suite","display_name":"Test suite","score":0.9371449947357178},{"id":"https://openalex.org/keywords/correctness","display_name":"Correctness","score":0.7975777387619019},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.7816885113716125},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6960588097572327},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.6875255107879639},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5527393817901611},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5286135077476501},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.49918508529663086},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.48198312520980835},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.451927125453949},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.42636895179748535},{"id":"https://openalex.org/keywords/suite","display_name":"Suite","score":0.4209047853946686},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3283483386039734},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3026462495326996},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.24178546667099},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.17494219541549683},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14541208744049072},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14067217707633972}],"concepts":[{"id":"https://openalex.org/C151552104","wikidata":"https://www.wikidata.org/wiki/Q7705809","display_name":"Test suite","level":4,"score":0.9371449947357178},{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.7975777387619019},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.7816885113716125},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6960588097572327},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.6875255107879639},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5527393817901611},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5286135077476501},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.49918508529663086},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.48198312520980835},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.451927125453949},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.42636895179748535},{"id":"https://openalex.org/C79581498","wikidata":"https://www.wikidata.org/wiki/Q1367530","display_name":"Suite","level":2,"score":0.4209047853946686},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3283483386039734},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3026462495326996},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.24178546667099},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.17494219541549683},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14541208744049072},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14067217707633972},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/3533767.3534370","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3533767.3534370","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 31st ACM SIGSOFT International Symposium on Software Testing and Analysis","raw_type":"proceedings-article"},{"id":"pmh:oai:arXiv.org:2104.06641","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2104.06641","pdf_url":"https://arxiv.org/pdf/2104.06641","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:2104.06641","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2104.06641","pdf_url":"https://arxiv.org/pdf/2104.06641","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[{"score":0.49000000953674316,"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":63,"referenced_works":["https://openalex.org/W1950030762","https://openalex.org/W1963679610","https://openalex.org/W1965194038","https://openalex.org/W1971650562","https://openalex.org/W1977331076","https://openalex.org/W1980421405","https://openalex.org/W1981537308","https://openalex.org/W1985947101","https://openalex.org/W1990785546","https://openalex.org/W1995875735","https://openalex.org/W2006149896","https://openalex.org/W2010833880","https://openalex.org/W2013655083","https://openalex.org/W2014515160","https://openalex.org/W2018017297","https://openalex.org/W2023428208","https://openalex.org/W2024507356","https://openalex.org/W2041713059","https://openalex.org/W2050238751","https://openalex.org/W2054864002","https://openalex.org/W2062154010","https://openalex.org/W2065236359","https://openalex.org/W2067416361","https://openalex.org/W2067436653","https://openalex.org/W2068981034","https://openalex.org/W2077085538","https://openalex.org/W2088604607","https://openalex.org/W2099444174","https://openalex.org/W2101819268","https://openalex.org/W2110706065","https://openalex.org/W2112040168","https://openalex.org/W2120474334","https://openalex.org/W2128049346","https://openalex.org/W2138132764","https://openalex.org/W2156723666","https://openalex.org/W2157922094","https://openalex.org/W2159614205","https://openalex.org/W2164372721","https://openalex.org/W2165325822","https://openalex.org/W2168561184","https://openalex.org/W2170771779","https://openalex.org/W2332237006","https://openalex.org/W2343875716","https://openalex.org/W2465098971","https://openalex.org/W2536479894","https://openalex.org/W2539721238","https://openalex.org/W2578469907","https://openalex.org/W2617064411","https://openalex.org/W2617832356","https://openalex.org/W2736091366","https://openalex.org/W2752382195","https://openalex.org/W2795260929","https://openalex.org/W2913917532","https://openalex.org/W2958754741","https://openalex.org/W3034122229","https://openalex.org/W3048002659","https://openalex.org/W3085878334","https://openalex.org/W3103568582","https://openalex.org/W3140804348","https://openalex.org/W4230013745","https://openalex.org/W4241947695","https://openalex.org/W4247801242","https://openalex.org/W6894161169"],"related_works":["https://openalex.org/W2091833418","https://openalex.org/W2913077774","https://openalex.org/W4256030018","https://openalex.org/W2145089576","https://openalex.org/W2021253405","https://openalex.org/W1986228509","https://openalex.org/W2147400189","https://openalex.org/W1600468096","https://openalex.org/W2340957901","https://openalex.org/W2030553922"],"abstract_inverted_index":{"The":[0,97],"performance":[1],"of":[2,13,89,99,106,132,143,155,199,218],"many":[3],"Fault":[4,90],"Localisation":[5],"(FL)":[6],"techniques":[7],"directly":[8],"depends":[9],"on":[10,103,172,207,215],"the":[11,14,124,130,133,153,178,184,191,195,200,216,219],"quality":[12],"used":[15,44,63,79],"test":[16,34,42,59,71,95,114,156,167,170,180,185],"suites.":[17],"Consequently,":[18],"it":[19,149],"is":[20,101,139],"extremely":[21],"useful":[22],"to":[23,26,40,55,61,68,77,112,128],"be":[24,62,78],"able":[25],"precisely":[27],"measure":[28,49,88],"how":[29],"much":[30],"diagnostic":[31],"power":[32],"each":[33],"case":[35],"can":[36,50,150,175,193],"introduce":[37],"when":[38],"added":[39],"a":[41,48,86,164],"suite":[43,181],"for":[45,64,93,116,135,158],"FL.":[46,118,160],"Such":[47],"help":[51,152],"us":[52],"not":[53],"only":[54,163,211],"prioritise":[56,113],"and":[57,197,205],"select":[58],"cases":[60,115,168,171,186],"FL,":[65],"but":[66],"also":[67],"effectively":[69,176],"augment":[70,177],"suites":[72,157],"that":[73,109,148],"are":[74,110],"too":[75],"weak":[76],"with":[80,145],"FL":[81,126,201],"techniques.":[82],"We":[83],"propose":[84],"FDG,":[85],"new":[87],"Diagnosability":[91],"Gain":[92],"individual":[94],"cases.":[96],"design":[98],"FDG":[100,122,144,174],"based":[102],"our":[104],"analysis":[105],"existing":[107],"metrics":[108],"designed":[111],"better":[117,159],"Unlike":[119],"other":[120],"metrics,":[121],"exploits":[123],"ongoing":[125],"results":[127,202],"emphasise":[129],"parts":[131],"program":[134],"which":[136],"more":[137],"information":[138],"needed.":[140],"Our":[141],"evaluation":[142],"Defects4J":[146],"shows":[147],"successfully":[151],"augmentation":[154,192],"When":[161],"given":[162,179],"few":[165],"failing":[166],"(2.3":[169],"average),":[173],"by":[182,189,203],"prioritising":[183],"generated":[187],"automatically":[188],"EvoSuite:":[190],"improve":[194],"acc@1":[196],"acc@10":[198],"11.6x":[204],"2.2x":[206],"average,":[208],"after":[209],"requiring":[210],"ten":[212],"human":[213],"judgements":[214],"correctness":[217],"assertions":[220],"EvoSuite":[221],"generates.":[222]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}