{"id":"https://openalex.org/W4287509645","doi":"https://doi.org/10.1145/3532719.3543242","title":"SVBRDF estimation using a normal sorting technique","display_name":"SVBRDF estimation using a normal sorting technique","publication_year":2022,"publication_date":"2022-07-25","ids":{"openalex":"https://openalex.org/W4287509645","doi":"https://doi.org/10.1145/3532719.3543242"},"language":"en","primary_location":{"id":"doi:10.1145/3532719.3543242","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3532719.3543242","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM SIGGRAPH 2022 Posters","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032646614","display_name":"Snehal A. Padhye","orcid":null},"institutions":[{"id":"https://openalex.org/I155173764","display_name":"Rochester Institute of Technology","ror":"https://ror.org/00v4yb702","country_code":"US","type":"education","lineage":["https://openalex.org/I155173764"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Snehal Padhye","raw_affiliation_strings":["Chester F Carlson Center For Imaging Science, Rochester Institute of Technology, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chester F Carlson Center For Imaging Science, Rochester Institute of Technology, United States of America","institution_ids":["https://openalex.org/I155173764"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043317825","display_name":"David W. Messinger","orcid":"https://orcid.org/0000-0002-2273-9194"},"institutions":[{"id":"https://openalex.org/I155173764","display_name":"Rochester Institute of Technology","ror":"https://ror.org/00v4yb702","country_code":"US","type":"education","lineage":["https://openalex.org/I155173764"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Messinger","raw_affiliation_strings":["Chester F Carlson Center For Imaging Science, Rochester Institute of Technology, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chester F Carlson Center For Imaging Science, Rochester Institute of Technology, USA","institution_ids":["https://openalex.org/I155173764"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077900703","display_name":"James A. Ferwerda","orcid":null},"institutions":[{"id":"https://openalex.org/I155173764","display_name":"Rochester Institute of Technology","ror":"https://ror.org/00v4yb702","country_code":"US","type":"education","lineage":["https://openalex.org/I155173764"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James Ferwerda","raw_affiliation_strings":["Chester F Carlson Center For Imaging Science, Rochester Institute of Technology, US"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chester F Carlson Center For Imaging Science, Rochester Institute of Technology, US","institution_ids":["https://openalex.org/I155173764"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1015,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.3780779,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10191","display_name":"Robotics and Sensor-Based Localization","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6270555257797241},{"id":"https://openalex.org/keywords/sorting","display_name":"Sorting","score":0.5955851078033447},{"id":"https://openalex.org/keywords/estimation","display_name":"Estimation","score":0.5098034739494324},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.22807690501213074},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0880608856678009}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6270555257797241},{"id":"https://openalex.org/C111696304","wikidata":"https://www.wikidata.org/wiki/Q2303697","display_name":"Sorting","level":2,"score":0.5955851078033447},{"id":"https://openalex.org/C96250715","wikidata":"https://www.wikidata.org/wiki/Q965330","display_name":"Estimation","level":2,"score":0.5098034739494324},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.22807690501213074},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0880608856678009},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3532719.3543242","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3532719.3543242","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM SIGGRAPH 2022 Posters","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W79897644","https://openalex.org/W2005389892","https://openalex.org/W2171646521","https://openalex.org/W2902972464","https://openalex.org/W4231356410","https://openalex.org/W4246951963"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2739612537","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2350741829","https://openalex.org/W2530322880","https://openalex.org/W1596801655"],"abstract_inverted_index":{"No":[0],"abstract":[1],"available.":[2]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}