{"id":"https://openalex.org/W4312121067","doi":"https://doi.org/10.1145/3508352.3561119","title":"Reliable Computing of ReRAM Based Compute-in-Memory Circuits for AI Edge Devices","display_name":"Reliable Computing of ReRAM Based Compute-in-Memory Circuits for AI Edge Devices","publication_year":2022,"publication_date":"2022-10-30","ids":{"openalex":"https://openalex.org/W4312121067","doi":"https://doi.org/10.1145/3508352.3561119"},"language":"en","primary_location":{"id":"doi:10.1145/3508352.3561119","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3508352.3561119","pdf_url":null,"source":{"id":"https://openalex.org/S4363608844","display_name":"Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023225287","display_name":"Meng\u2010Fan Chang","orcid":"https://orcid.org/0000-0001-6905-6350"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Meng-Fan Chang","raw_affiliation_strings":["National Tsing Hua University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069034092","display_name":"Je-Ming Hung","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Je-Ming Hung","raw_affiliation_strings":["National Tsing Hua University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034520936","display_name":"Ping-Cheng Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I98298690","display_name":"I-Shou University","ror":"https://ror.org/04d7e4m76","country_code":"TW","type":"education","lineage":["https://openalex.org/I98298690"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ping-Cheng Chen","raw_affiliation_strings":["I-Shou University, Kaohsiung, Taiwan"],"affiliations":[{"raw_affiliation_string":"I-Shou University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I98298690"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089330532","display_name":"Tai-Hao Wen","orcid":"https://orcid.org/0000-0002-0692-1084"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tai-Hao Wen","raw_affiliation_strings":["National Tsing Hua University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5023225287"],"corresponding_institution_ids":["https://openalex.org/I25846049"],"apc_list":null,"apc_paid":null,"fwci":0.3222,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.4543311,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.8337422609329224},{"id":"https://openalex.org/keywords/macro","display_name":"Macro","score":0.7680543065071106},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7304919362068176},{"id":"https://openalex.org/keywords/bottleneck","display_name":"Bottleneck","score":0.6157893538475037},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5028309226036072},{"id":"https://openalex.org/keywords/inference","display_name":"Inference","score":0.49073779582977295},{"id":"https://openalex.org/keywords/in-memory-processing","display_name":"In-Memory Processing","score":0.4714689552783966},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.44046738743782043},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.37212076783180237},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34490981698036194},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3380786180496216},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.30083584785461426},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.21427080035209656},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.19929873943328857},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14674276113510132},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11883962154388428},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0991392433643341}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.8337422609329224},{"id":"https://openalex.org/C166955791","wikidata":"https://www.wikidata.org/wiki/Q629579","display_name":"Macro","level":2,"score":0.7680543065071106},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7304919362068176},{"id":"https://openalex.org/C2780513914","wikidata":"https://www.wikidata.org/wiki/Q18210350","display_name":"Bottleneck","level":2,"score":0.6157893538475037},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5028309226036072},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.49073779582977295},{"id":"https://openalex.org/C123593499","wikidata":"https://www.wikidata.org/wiki/Q6008583","display_name":"In-Memory Processing","level":5,"score":0.4714689552783966},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.44046738743782043},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.37212076783180237},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34490981698036194},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3380786180496216},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.30083584785461426},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.21427080035209656},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.19929873943328857},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14674276113510132},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11883962154388428},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0991392433643341},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C23123220","wikidata":"https://www.wikidata.org/wiki/Q816826","display_name":"Information retrieval","level":1,"score":0.0},{"id":"https://openalex.org/C164120249","wikidata":"https://www.wikidata.org/wiki/Q995982","display_name":"Web search query","level":3,"score":0.0},{"id":"https://openalex.org/C97854310","wikidata":"https://www.wikidata.org/wiki/Q19541","display_name":"Search engine","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C194222762","wikidata":"https://www.wikidata.org/wiki/Q114486","display_name":"Query by Example","level":4,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3508352.3561119","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3508352.3561119","pdf_url":null,"source":{"id":"https://openalex.org/S4363608844","display_name":"Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8999999761581421}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":47,"referenced_works":["https://openalex.org/W601439785","https://openalex.org/W2611005572","https://openalex.org/W2734294704","https://openalex.org/W2765081478","https://openalex.org/W2775771159","https://openalex.org/W2783156342","https://openalex.org/W2787336703","https://openalex.org/W2792208628","https://openalex.org/W2794288888","https://openalex.org/W2803163155","https://openalex.org/W2805362231","https://openalex.org/W2911290762","https://openalex.org/W2921329602","https://openalex.org/W2960778947","https://openalex.org/W2966187992","https://openalex.org/W2970608956","https://openalex.org/W2990797940","https://openalex.org/W3003821665","https://openalex.org/W3012215102","https://openalex.org/W3012530838","https://openalex.org/W3015980402","https://openalex.org/W3016048022","https://openalex.org/W3048746542","https://openalex.org/W3099073033","https://openalex.org/W3112668161","https://openalex.org/W3133754064","https://openalex.org/W3134195144","https://openalex.org/W3135461891","https://openalex.org/W3135839634","https://openalex.org/W3139521791","https://openalex.org/W3183264033","https://openalex.org/W3202668570","https://openalex.org/W3208067593","https://openalex.org/W4200611376","https://openalex.org/W4205230840","https://openalex.org/W4220958508","https://openalex.org/W4221039638","https://openalex.org/W4221118949","https://openalex.org/W4236135583","https://openalex.org/W4248053622","https://openalex.org/W4254227808","https://openalex.org/W4286571874","https://openalex.org/W6755567131","https://openalex.org/W6773025034","https://openalex.org/W6799500049","https://openalex.org/W6809326210","https://openalex.org/W6809522676"],"related_works":["https://openalex.org/W3137037072","https://openalex.org/W4308870977","https://openalex.org/W2983750276","https://openalex.org/W2043393912","https://openalex.org/W3164445786","https://openalex.org/W2802367674","https://openalex.org/W2993390155","https://openalex.org/W2912892722","https://openalex.org/W2562493617","https://openalex.org/W2157007809"],"abstract_inverted_index":{"Compute-in-memory":[0],"macros":[1],"based":[2],"on":[3],"non-volatile":[4],"memory":[5,15],"(nvCIM)":[6],"are":[7],"a":[8,86,97],"promising":[9],"approach":[10],"to":[11],"break":[12],"through":[13],"the":[14,24,44,52,68,82,90,114],"bottleneck":[16],"for":[17],"artificial":[18],"intelligence":[19],"(AI)":[20],"edge":[21],"devices;":[22],"however,":[23],"development":[25,115],"of":[26,46,85,93,99,116],"these":[27],"devices":[28,64],"involves":[29],"unavoidable":[30],"tradeoffs":[31],"between":[32],"reliability,":[33],"energy":[34],"efficiency,":[35],"computing":[36],"latency,":[37],"and":[38,65,67,89,111],"readout":[39],"accuracy.":[40],"This":[41,78],"paper":[42,79],"outlines":[43],"background":[45],"ReRAM-based":[47,118],"nvCIM":[48,87,104,119],"as":[49,51,96],"well":[50],"major":[53],"challenges":[54],"in":[55,62,75,113],"its":[56],"further":[57],"development,":[58],"including":[59],"process":[60],"variation":[61,74],"ReRAM":[63],"transistors":[66],"small":[69],"signal":[70],"margins":[71],"associated":[72],"with":[73],"input-weight":[76],"patterns.":[77],"also":[80],"investigates":[81],"error":[83,100],"model":[84,101],"macro,":[88],"correspondent":[91],"degradation":[92],"inference":[94],"accuracy":[95],"function":[98],"when":[102],"using":[103],"macros.":[105],"Finally,":[106],"we":[107],"summarize":[108],"recent":[109],"trends":[110],"advances":[112],"reliable":[117],"macro.":[120]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}