{"id":"https://openalex.org/W4312121122","doi":"https://doi.org/10.1145/3508352.3549383","title":"X-Check","display_name":"X-Check","publication_year":2022,"publication_date":"2022-10-30","ids":{"openalex":"https://openalex.org/W4312121122","doi":"https://doi.org/10.1145/3508352.3549383"},"language":"en","primary_location":{"id":"doi:10.1145/3508352.3549383","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3508352.3549383","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039671544","display_name":"Zhuolun He","orcid":"https://orcid.org/0009-0009-4909-6588"},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Zhuolun He","raw_affiliation_strings":["CUHK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CUHK","institution_ids":["https://openalex.org/I889458895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071995111","display_name":"Yuzhe Ma","orcid":"https://orcid.org/0000-0002-3612-4182"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yuzhe Ma","raw_affiliation_strings":["HKUST(GZ)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"HKUST(GZ)","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051340429","display_name":"Bei Yu","orcid":"https://orcid.org/0000-0001-6406-4810"},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Bei Yu","raw_affiliation_strings":["CUHK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CUHK","institution_ids":["https://openalex.org/I889458895"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.1304,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.9577087,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.8264832496643066},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7908378839492798},{"id":"https://openalex.org/keywords/speedup","display_name":"Speedup","score":0.7038779258728027},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6166049242019653},{"id":"https://openalex.org/keywords/acceleration","display_name":"Acceleration","score":0.5731045007705688},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.4807000756263733},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.43287187814712524},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.4178903102874756},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.41774600744247437},{"id":"https://openalex.org/keywords/formal-verification","display_name":"Formal verification","score":0.4159850478172302},{"id":"https://openalex.org/keywords/model-checking","display_name":"Model checking","score":0.4105224907398224},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.27591803669929504},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.26846882700920105},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08410915732383728},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07195010781288147}],"concepts":[{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.8264832496643066},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7908378839492798},{"id":"https://openalex.org/C68339613","wikidata":"https://www.wikidata.org/wiki/Q1549489","display_name":"Speedup","level":2,"score":0.7038779258728027},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6166049242019653},{"id":"https://openalex.org/C117896860","wikidata":"https://www.wikidata.org/wiki/Q11376","display_name":"Acceleration","level":2,"score":0.5731045007705688},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4807000756263733},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.43287187814712524},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.4178903102874756},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.41774600744247437},{"id":"https://openalex.org/C111498074","wikidata":"https://www.wikidata.org/wiki/Q173326","display_name":"Formal verification","level":2,"score":0.4159850478172302},{"id":"https://openalex.org/C110251889","wikidata":"https://www.wikidata.org/wiki/Q1569697","display_name":"Model checking","level":2,"score":0.4105224907398224},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.27591803669929504},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.26846882700920105},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08410915732383728},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07195010781288147},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/3508352.3549383","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3508352.3549383","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design","raw_type":"proceedings-article"},{"id":"pmh:oai:repository.hkust.edu.hk:1783.1-126500","is_oa":false,"landing_page_url":"http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=LinksAMR&SrcApp=PARTNER_APP&DestLinkType=FullRecord&DestApp=WOS&KeyUT=000981574300051","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference paper"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4300000071525574,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1822595813","https://openalex.org/W2113639834","https://openalex.org/W2120490947","https://openalex.org/W2138416625","https://openalex.org/W2160710598","https://openalex.org/W2885849839","https://openalex.org/W2946332877","https://openalex.org/W3036696276","https://openalex.org/W3114046495","https://openalex.org/W3188917597","https://openalex.org/W3213323378","https://openalex.org/W4200043277","https://openalex.org/W4221149708","https://openalex.org/W4280571788","https://openalex.org/W6652405322","https://openalex.org/W6658471095","https://openalex.org/W6669051336","https://openalex.org/W6675360682","https://openalex.org/W6677485480","https://openalex.org/W6678962844","https://openalex.org/W6734631182","https://openalex.org/W6787401642","https://openalex.org/W6803848106","https://openalex.org/W6804360543","https://openalex.org/W7056556511"],"related_works":["https://openalex.org/W2006962382","https://openalex.org/W2149716943","https://openalex.org/W2037121848","https://openalex.org/W4312733571","https://openalex.org/W4315606162","https://openalex.org/W113732979","https://openalex.org/W2340807904","https://openalex.org/W1547517160","https://openalex.org/W1483297389","https://openalex.org/W2060070465"],"abstract_inverted_index":{"Design":[0],"rule":[1,52],"checking":[2],"(DRC)":[3],"is":[4],"essential":[5],"in":[6,64],"physical":[7],"verification":[8],"to":[9,34],"ensure":[10],"high":[11],"yield":[12],"and":[13,66],"reliability":[14],"for":[15,26],"VLSI":[16,41],"circuit":[17],"designs.":[18],"To":[19],"achieve":[20],"reasonable":[21],"design":[22,51],"cycle":[23],"time,":[24],"acceleration":[25],"computationally":[27],"intensive":[28],"DRC":[29],"tasks":[30],"has":[31],"been":[32],"demanded":[33],"accommodate":[35],"the":[36],"ever-growing":[37],"complexity":[38],"of":[39],"modern":[40],"circuits.":[42],"In":[43],"this":[44],"paper,":[45],"we":[46],"propose":[47],"X-Check,":[48],"a":[49,82],"GPU-accelerated":[50],"checker.":[53,85],"X-Check":[54,79],"integrates":[55],"novel":[56],"parallel":[57],"sweepline":[58],"algorithms,":[59],"which":[60],"are":[61],"both":[62],"efficient":[63],"practice":[65],"with":[67,81],"nontrivial":[68],"theoretical":[69],"guarantees.":[70],"Experimental":[71],"results":[72],"have":[73],"demonstrated":[74],"significant":[75],"speedup":[76],"achieved":[77],"by":[78],"compared":[80],"multi-threaded":[83],"CPU":[84]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2023-01-04T00:00:00"}