{"id":"https://openalex.org/W4206342565","doi":"https://doi.org/10.1145/3501409.3501440","title":"Study on the influence of pressure on the characteristics of IGBT","display_name":"Study on the influence of pressure on the characteristics of IGBT","publication_year":2021,"publication_date":"2021-10-22","ids":{"openalex":"https://openalex.org/W4206342565","doi":"https://doi.org/10.1145/3501409.3501440"},"language":"en","primary_location":{"id":"doi:10.1145/3501409.3501440","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3501409.3501440","pdf_url":null,"source":{"id":"https://openalex.org/S4363608789","display_name":"Proceedings of the 2021 5th International Conference on Electronic Information Technology and Computer Engineering","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2021 5th International Conference on Electronic Information Technology and Computer Engineering","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5106976271","display_name":"Yaohua Wang","orcid":"https://orcid.org/0009-0004-7404-6367"},"institutions":[{"id":"https://openalex.org/I17442442","display_name":"State Grid Corporation of China (China)","ror":"https://ror.org/05twwhs70","country_code":"CN","type":"company","lineage":["https://openalex.org/I17442442"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yaohua Wang","raw_affiliation_strings":["State Key Lab of Advanced Power Transmission Technology, Global Energy Interconnection Research Institute Co., Ltd, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Lab of Advanced Power Transmission Technology, Global Energy Interconnection Research Institute Co., Ltd, Beijing, China","institution_ids":["https://openalex.org/I17442442"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031896248","display_name":"Rui Jin","orcid":"https://orcid.org/0000-0003-4594-7778"},"institutions":[{"id":"https://openalex.org/I17442442","display_name":"State Grid Corporation of China (China)","ror":"https://ror.org/05twwhs70","country_code":"CN","type":"company","lineage":["https://openalex.org/I17442442"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rui Jin","raw_affiliation_strings":["State Key Lab of Advanced Power Transmission Technology, Global Energy Interconnection Research Institute Co., Ltd, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Lab of Advanced Power Transmission Technology, Global Energy Interconnection Research Institute Co., Ltd, Beijing, China","institution_ids":["https://openalex.org/I17442442"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100361041","display_name":"Li Li","orcid":"https://orcid.org/0000-0001-8485-2216"},"institutions":[{"id":"https://openalex.org/I17442442","display_name":"State Grid Corporation of China (China)","ror":"https://ror.org/05twwhs70","country_code":"CN","type":"company","lineage":["https://openalex.org/I17442442"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Li Li","raw_affiliation_strings":["State Key Lab of Advanced Power Transmission Technology, Global Energy Interconnection Research Institute Co., Ltd, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Lab of Advanced Power Transmission Technology, Global Energy Interconnection Research Institute Co., Ltd, Beijing, China","institution_ids":["https://openalex.org/I17442442"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014491703","display_name":"Jiang Liu","orcid":"https://orcid.org/0000-0002-6291-1307"},"institutions":[{"id":"https://openalex.org/I17442442","display_name":"State Grid Corporation of China (China)","ror":"https://ror.org/05twwhs70","country_code":"CN","type":"company","lineage":["https://openalex.org/I17442442"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiang Liu","raw_affiliation_strings":["State Key Lab of Advanced Power Transmission Technology, Global Energy Interconnection Research Institute Co., Ltd, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Lab of Advanced Power Transmission Technology, Global Energy Interconnection Research Institute Co., Ltd, Beijing, China","institution_ids":["https://openalex.org/I17442442"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067858050","display_name":"Mingchao Gao","orcid":null},"institutions":[{"id":"https://openalex.org/I17442442","display_name":"State Grid Corporation of China (China)","ror":"https://ror.org/05twwhs70","country_code":"CN","type":"company","lineage":["https://openalex.org/I17442442"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingchao Gao","raw_affiliation_strings":["State Key Lab of Advanced Power Transmission Technology, Global Energy Interconnection Research Institute Co., Ltd, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Lab of Advanced Power Transmission Technology, Global Energy Interconnection Research Institute Co., Ltd, Beijing, China","institution_ids":["https://openalex.org/I17442442"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I17442442"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.2659884,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"168","last_page":"173"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.9546321034431458},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6547089219093323},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.5977922677993774},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.5708647966384888},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.535955011844635},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.46956515312194824},{"id":"https://openalex.org/keywords/saturation","display_name":"Saturation (graph theory)","score":0.46020764112472534},{"id":"https://openalex.org/keywords/welding","display_name":"Welding","score":0.4259776175022125},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39408186078071594},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36044004559516907},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.33763059973716736},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2537800967693329},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.2365036904811859},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.20043355226516724}],"concepts":[{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.9546321034431458},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6547089219093323},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.5977922677993774},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.5708647966384888},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.535955011844635},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.46956515312194824},{"id":"https://openalex.org/C9930424","wikidata":"https://www.wikidata.org/wiki/Q7426587","display_name":"Saturation (graph theory)","level":2,"score":0.46020764112472534},{"id":"https://openalex.org/C19474535","wikidata":"https://www.wikidata.org/wiki/Q131172","display_name":"Welding","level":2,"score":0.4259776175022125},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39408186078071594},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36044004559516907},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.33763059973716736},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2537800967693329},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.2365036904811859},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.20043355226516724},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3501409.3501440","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3501409.3501440","pdf_url":null,"source":{"id":"https://openalex.org/S4363608789","display_name":"Proceedings of the 2021 5th International Conference on Electronic Information Technology and Computer Engineering","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2021 5th International Conference on Electronic Information Technology and Computer Engineering","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6000000238418579,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W267840210","https://openalex.org/W2068496374","https://openalex.org/W4245433393"],"related_works":["https://openalex.org/W2318746575","https://openalex.org/W3164416905","https://openalex.org/W2394855236","https://openalex.org/W2385832380","https://openalex.org/W2060044332","https://openalex.org/W2380046073","https://openalex.org/W2320548181","https://openalex.org/W2146642246","https://openalex.org/W2162081524","https://openalex.org/W4295037241"],"abstract_inverted_index":{"In":[0],"order":[1],"to":[2,12,23],"achieve":[3],"good":[4],"electrical":[5,59],"connection,":[6],"a":[7],"certain":[8],"mechanical":[9,27,55,93],"pressure":[10],"needs":[11],"be":[13,103],"applied":[14],"during":[15],"the":[16,24,29,46,52,58,80,92,97],"use":[17],"of":[18,26,31,54,61,86,99],"Press-Pack":[19],"IGBT":[20,32,40,62,87],"devices.":[21,41],"Due":[22],"influence":[25,53],"pressure,":[28],"characteristics":[30,60],"chips":[33,88],"will":[34],"change":[35,89,98],"compared":[36],"with":[37],"conventional":[38],"welded":[39],"Therefore,":[42],"this":[43],"paper":[44],"analyzes":[45],"semiconductor":[47],"physical":[48],"mechanism,":[49],"and":[50,71,75,83],"studies":[51],"stress":[56,94],"on":[57],"chip":[63],"by":[64],"using":[65],"2D":[66],"finite":[67],"element":[68],"simulation":[69],"method":[70],"experiment.":[72],"The":[73],"simulated":[74],"experimental":[76],"results":[77],"showed":[78],"that":[79],"saturation":[81],"voltage":[82,101],"fall":[84],"time":[85],"obviously":[90],"when":[91],"increases,":[95],"but":[96],"threshold":[100],"can":[102],"ignored.":[104]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}