{"id":"https://openalex.org/W4231584382","doi":"https://doi.org/10.1145/3495018.3495085","title":"Automation Level of Measurement and Development of Load Cells","display_name":"Automation Level of Measurement and Development of Load Cells","publication_year":2021,"publication_date":"2021-10-23","ids":{"openalex":"https://openalex.org/W4231584382","doi":"https://doi.org/10.1145/3495018.3495085"},"language":"en","primary_location":{"id":"doi:10.1145/3495018.3495085","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3495018.3495085","pdf_url":null,"source":{"id":"https://openalex.org/S4363607741","display_name":"2021 3rd International Conference on Artificial Intelligence and Advanced Manufacture","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 3rd International Conference on Artificial Intelligence and Advanced Manufacture","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100461178","display_name":"Lili Zhang","orcid":"https://orcid.org/0000-0002-3516-2443"},"institutions":[{"id":"https://openalex.org/I4210105460","display_name":"Shanghai Institute of Measurement and Testing Technology","ror":"https://ror.org/00zcefp03","country_code":"CN","type":"nonprofit","lineage":["https://openalex.org/I4210105460"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Lili Zhang","raw_affiliation_strings":["Shanghai Institute of Measurement and Testing Technology, China"],"affiliations":[{"raw_affiliation_string":"Shanghai Institute of Measurement and Testing Technology, China","institution_ids":["https://openalex.org/I4210105460"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014159582","display_name":"Jun Zhu","orcid":"https://orcid.org/0000-0002-3231-7235"},"institutions":[{"id":"https://openalex.org/I4210105460","display_name":"Shanghai Institute of Measurement and Testing Technology","ror":"https://ror.org/00zcefp03","country_code":"CN","type":"nonprofit","lineage":["https://openalex.org/I4210105460"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Zhu","raw_affiliation_strings":["Shanghai Institute of Measurement and Testing Technology, China"],"affiliations":[{"raw_affiliation_string":"Shanghai Institute of Measurement and Testing Technology, China","institution_ids":["https://openalex.org/I4210105460"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100390957","display_name":"Yuan Li","orcid":"https://orcid.org/0000-0003-4743-7261"},"institutions":[{"id":"https://openalex.org/I4210105460","display_name":"Shanghai Institute of Measurement and Testing Technology","ror":"https://ror.org/00zcefp03","country_code":"CN","type":"nonprofit","lineage":["https://openalex.org/I4210105460"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuan Li","raw_affiliation_strings":["Shanghai Institute of Measurement and Testing Technology, China"],"affiliations":[{"raw_affiliation_string":"Shanghai Institute of Measurement and Testing Technology, China","institution_ids":["https://openalex.org/I4210105460"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009846526","display_name":"Yue Jin","orcid":"https://orcid.org/0000-0002-0005-5170"},"institutions":[{"id":"https://openalex.org/I4210105460","display_name":"Shanghai Institute of Measurement and Testing Technology","ror":"https://ror.org/00zcefp03","country_code":"CN","type":"nonprofit","lineage":["https://openalex.org/I4210105460"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yue Jin","raw_affiliation_strings":["Shanghai Institute of Measurement and Testing Technology, China"],"affiliations":[{"raw_affiliation_string":"Shanghai Institute of Measurement and Testing Technology, China","institution_ids":["https://openalex.org/I4210105460"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100461178"],"corresponding_institution_ids":["https://openalex.org/I4210105460"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.41033895,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"387","last_page":"391"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14304","display_name":"Transport Systems and Technology","score":0.978600025177002,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14304","display_name":"Transport Systems and Technology","score":0.978600025177002,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13344","display_name":"Industrial Automation and Control Systems","score":0.9695000052452087,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14011","display_name":"Elevator Systems and Control","score":0.919700026512146,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.8147455453872681},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6389930248260498},{"id":"https://openalex.org/keywords/load-cell","display_name":"Load cell","score":0.5910224318504333},{"id":"https://openalex.org/keywords/load-testing","display_name":"Load testing","score":0.5278720259666443},{"id":"https://openalex.org/keywords/development","display_name":"Development (topology)","score":0.5152699947357178},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.43427175283432007},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3208807706832886},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.27621763944625854},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21927744150161743},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.1862184703350067},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.13258805871009827},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.09185400605201721}],"concepts":[{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.8147455453872681},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6389930248260498},{"id":"https://openalex.org/C145991859","wikidata":"https://www.wikidata.org/wiki/Q1561445","display_name":"Load cell","level":2,"score":0.5910224318504333},{"id":"https://openalex.org/C48460631","wikidata":"https://www.wikidata.org/wiki/Q4311799","display_name":"Load testing","level":2,"score":0.5278720259666443},{"id":"https://openalex.org/C2776542497","wikidata":"https://www.wikidata.org/wiki/Q5266672","display_name":"Development (topology)","level":2,"score":0.5152699947357178},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.43427175283432007},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3208807706832886},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.27621763944625854},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21927744150161743},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.1862184703350067},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.13258805871009827},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.09185400605201721},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3495018.3495085","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3495018.3495085","pdf_url":null,"source":{"id":"https://openalex.org/S4363607741","display_name":"2021 3rd International Conference on Artificial Intelligence and Advanced Manufacture","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 3rd International Conference on Artificial Intelligence and Advanced Manufacture","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.46000000834465027,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4206952472","https://openalex.org/W4220705932","https://openalex.org/W1994723427","https://openalex.org/W2354218047","https://openalex.org/W2135985068","https://openalex.org/W4247132635","https://openalex.org/W4302799580","https://openalex.org/W2804920805","https://openalex.org/W3163029302","https://openalex.org/W2070037175"],"abstract_inverted_index":{"The":[0],"force":[1,30,68,79],"standard":[2,31,69,80,107],"machine":[3,32,108],"can":[4,82],"not":[5],"meet":[6,84,126],"the":[7,16,29,45,57,74,85,99,104,115,127],"test":[8],"requirements":[9],"of":[10,18,49,62,78,89,103,118,129],"high":[11],"precision":[12],"load":[13,20,50,63,95],"cells":[14,21,51,64],"in":[15],"work":[17],"finalize":[19],"and":[22,47,52,55,59,87,92,97,101,132],"prototype":[23],"test.":[24],"Periodical":[25],"weighing":[26],"apparatus":[27],"introduces":[28,44],"developed":[33],"on":[34],"various":[35],"principles,":[36],"its":[37],"level":[38,67,77,117],"is":[39],"0.03.":[40],"This":[41],"paper":[42],"mainly":[43],"structure":[46],"principle":[48],"measuring":[53,58],"standard,":[54],"analyzes":[56],"testing":[60],"items":[61],"with":[65],"0.01":[66],"machine.":[70],"Only":[71],"by":[72],"improving":[73],"automatic":[75],"technology":[76,120,131],"machine,":[81],"we":[83],"measurement":[86],"development":[88,100,116,128],"class":[90,93],"A":[91],"B":[94],"cells,":[96],"promote":[98],"application":[102],"sensor.":[105],"Force":[106],"control":[109],"system":[110],"automation,":[111],"intelligence":[112],"will":[113],"make":[114],"sensing":[119],"to":[121,125],"a":[122],"higher":[123],"level,":[124],"communication":[130],"computer":[133],"technology.":[134]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-01-13T01:12:25.745995","created_date":"2025-10-10T00:00:00"}