{"id":"https://openalex.org/W4200092071","doi":"https://doi.org/10.1145/3490725.3490739","title":"Degradation Characteristics Analysis and Fault Prediction of Switching Power Supply Based on Data Mining","display_name":"Degradation Characteristics Analysis and Fault Prediction of Switching Power Supply Based on Data Mining","publication_year":2021,"publication_date":"2021-09-17","ids":{"openalex":"https://openalex.org/W4200092071","doi":"https://doi.org/10.1145/3490725.3490739"},"language":"en","primary_location":{"id":"doi:10.1145/3490725.3490739","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3490725.3490739","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 The 4th International Conference on Machine Learning and Machine Intelligence","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100940287","display_name":"Linlin Shi","orcid":"https://orcid.org/0009-0000-9015-0536"},"institutions":[{"id":"https://openalex.org/I890469752","display_name":"Ministry of Industry and Information Technology","ror":"https://ror.org/0385nmy68","country_code":"CN","type":"government","lineage":["https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Linlin Shi","raw_affiliation_strings":["The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, China","institution_ids":["https://openalex.org/I890469752"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101048677","display_name":"Pengfei Yu","orcid":"https://orcid.org/0000-0002-6465-6522"},"institutions":[{"id":"https://openalex.org/I890469752","display_name":"Ministry of Industry and Information Technology","ror":"https://ror.org/0385nmy68","country_code":"CN","type":"government","lineage":["https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengfei Yu","raw_affiliation_strings":["The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, China","institution_ids":["https://openalex.org/I890469752"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012238182","display_name":"Shilie He","orcid":"https://orcid.org/0009-0008-5247-8301"},"institutions":[{"id":"https://openalex.org/I890469752","display_name":"Ministry of Industry and Information Technology","ror":"https://ror.org/0385nmy68","country_code":"CN","type":"government","lineage":["https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shilie He","raw_affiliation_strings":["The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, China","institution_ids":["https://openalex.org/I890469752"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057039676","display_name":"Zhenwei Zhou","orcid":"https://orcid.org/0000-0003-4473-7541"},"institutions":[{"id":"https://openalex.org/I890469752","display_name":"Ministry of Industry and Information Technology","ror":"https://ror.org/0385nmy68","country_code":"CN","type":"government","lineage":["https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhenwei Zhou","raw_affiliation_strings":["The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, China","institution_ids":["https://openalex.org/I890469752"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045700877","display_name":"Linghui Meng","orcid":"https://orcid.org/0000-0001-5915-4395"},"institutions":[{"id":"https://openalex.org/I890469752","display_name":"Ministry of Industry and Information Technology","ror":"https://ror.org/0385nmy68","country_code":"CN","type":"government","lineage":["https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Linghui Meng","raw_affiliation_strings":["The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, China","institution_ids":["https://openalex.org/I890469752"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102797695","display_name":"Junbin Liu","orcid":"https://orcid.org/0000-0003-2026-0574"},"institutions":[{"id":"https://openalex.org/I890469752","display_name":"Ministry of Industry and Information Technology","ror":"https://ror.org/0385nmy68","country_code":"CN","type":"government","lineage":["https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junbin Liu","raw_affiliation_strings":["The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, China","institution_ids":["https://openalex.org/I890469752"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I890469752"],"apc_list":null,"apc_paid":null,"fwci":0.1215,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.49021026,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"89","last_page":"98"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11344","display_name":"Traffic Prediction and Management Techniques","score":0.9900000095367432,"subfield":{"id":"https://openalex.org/subfields/2215","display_name":"Building and Construction"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11344","display_name":"Traffic Prediction and Management Techniques","score":0.9900000095367432,"subfield":{"id":"https://openalex.org/subfields/2215","display_name":"Building and Construction"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12451","display_name":"Smart Grid and Power Systems","score":0.9702000021934509,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11052","display_name":"Energy Load and Power Forecasting","score":0.9595999717712402,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.6681481599807739},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.650705099105835},{"id":"https://openalex.org/keywords/switched-mode-power-supply-applications","display_name":"Switched-mode power supply applications","score":0.6446979641914368},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6323690414428711},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5615259408950806},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48448678851127625},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4679032266139984},{"id":"https://openalex.org/keywords/switched-mode-power-supply","display_name":"Switched-mode power supply","score":0.42623811960220337},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3622383177280426},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3044624328613281},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24204128980636597},{"id":"https://openalex.org/keywords/constant-power-circuit","display_name":"Constant power circuit","score":0.17878121137619019}],"concepts":[{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.6681481599807739},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.650705099105835},{"id":"https://openalex.org/C79899660","wikidata":"https://www.wikidata.org/wiki/Q587008","display_name":"Switched-mode power supply applications","level":5,"score":0.6446979641914368},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6323690414428711},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5615259408950806},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48448678851127625},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4679032266139984},{"id":"https://openalex.org/C151799858","wikidata":"https://www.wikidata.org/wiki/Q587008","display_name":"Switched-mode power supply","level":3,"score":0.42623811960220337},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3622383177280426},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3044624328613281},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24204128980636597},{"id":"https://openalex.org/C29586797","wikidata":"https://www.wikidata.org/wiki/Q5163663","display_name":"Constant power circuit","level":4,"score":0.17878121137619019},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3490725.3490739","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3490725.3490739","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 The 4th International Conference on Machine Learning and Machine Intelligence","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6100000143051147}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2137300256","https://openalex.org/W2154053567","https://openalex.org/W2573587735","https://openalex.org/W2898444582"],"related_works":["https://openalex.org/W1815542355","https://openalex.org/W2152540334","https://openalex.org/W4289655666","https://openalex.org/W2386849760","https://openalex.org/W2371073454","https://openalex.org/W2359850098","https://openalex.org/W2740815748","https://openalex.org/W4393106611","https://openalex.org/W2889535154","https://openalex.org/W2356496350"],"abstract_inverted_index":{"Fault":[0],"prediction":[1,80,127],"and":[2,17,40,56,78,97,125],"health":[3,75,126],"monitoring":[4,124],"of":[5,20,100,115,128],"DC-DC":[6,37],"switching":[7],"power":[8,21,38,88,102,107,129],"supply":[9,89,103,108],"plays":[10],"an":[11],"important":[12,119],"role":[13],"in":[14,86],"the":[15,41,62,83,87,95,101,105,123],"safe":[16],"reliable":[18],"operation":[19],"electronic":[22],"equipment.":[23],"In":[24],"this":[25,116],"paper,":[26],"a":[27],"long-term":[28],"high":[29],"temperature":[30],"degradation":[31,96,110],"test":[32,109],"was":[33],"carried":[34],"out":[35,70],"for":[36,122],"supply,":[39],"characteristic":[42],"parameters":[43],"related":[44],"to":[45,93],"device":[46],"health,":[47],"such":[48],"as":[49,92],"input":[50,52],"current,":[51],"voltage,":[53,58],"output":[54,57],"current":[55],"were":[59],"collected":[60,85],"during":[61],"test.":[63],"Through":[64],"data":[65,71],"mining":[66],"technology,":[67],"we":[68],"carry":[69],"preprocessing,":[72],"feature":[73],"analysis,":[74],"index":[76],"modeling":[77],"fault":[79,98],"analysis":[81],"on":[82],"samples":[84],"test,":[90],"so":[91],"study":[94],"predictor":[99],"from":[104],"real":[106],"data.":[111],"The":[112],"research":[113],"results":[114],"paper":[117],"have":[118],"engineering":[120],"significance":[121],"supply.":[130]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}