{"id":"https://openalex.org/W4293026121","doi":"https://doi.org/10.1145/3489517.3530530","title":"AVATAR","display_name":"AVATAR","publication_year":2022,"publication_date":"2022-07-10","ids":{"openalex":"https://openalex.org/W4293026121","doi":"https://doi.org/10.1145/3489517.3530530"},"language":"en","primary_location":{"id":"doi:10.1145/3489517.3530530","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3489517.3530530","pdf_url":null,"source":{"id":"https://openalex.org/S4363608816","display_name":"Proceedings of the 59th ACM/IEEE Design Automation Conference","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 59th ACM/IEEE Design Automation Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045601421","display_name":"Zuodong Zhang","orcid":"https://orcid.org/0000-0002-8496-6114"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zuodong Zhang","raw_affiliation_strings":["Peking University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039573083","display_name":"Zizheng Guo","orcid":"https://orcid.org/0000-0002-0724-5356"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zizheng Guo","raw_affiliation_strings":["Peking University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000933188","display_name":"Yibo Lin","orcid":"https://orcid.org/0000-0002-0977-2774"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yibo Lin","raw_affiliation_strings":["Peking University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002760019","display_name":"Runsheng Wang","orcid":"https://orcid.org/0000-0002-7514-0767"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Runsheng Wang","raw_affiliation_strings":["Peking University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062886480","display_name":"Ru Huang","orcid":"https://orcid.org/0000-0002-8146-4821"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ru Huang","raw_affiliation_strings":["Peking University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I20231570"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"841","last_page":"846"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7525242567062378},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.5677053928375244},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5099183320999146},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.4975910484790802},{"id":"https://openalex.org/keywords/dynamic-demand","display_name":"Dynamic demand","score":0.49356114864349365},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.47296756505966187},{"id":"https://openalex.org/keywords/frequency-scaling","display_name":"Frequency scaling","score":0.46434861421585083},{"id":"https://openalex.org/keywords/tolerance-analysis","display_name":"Tolerance analysis","score":0.45934635400772095},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.44224807620048523},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.41657018661499023},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3912144601345062},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.35624873638153076},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.31854891777038574},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.1907883584499359},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.124489426612854}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7525242567062378},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.5677053928375244},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5099183320999146},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.4975910484790802},{"id":"https://openalex.org/C45872418","wikidata":"https://www.wikidata.org/wiki/Q5318966","display_name":"Dynamic demand","level":3,"score":0.49356114864349365},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.47296756505966187},{"id":"https://openalex.org/C157742956","wikidata":"https://www.wikidata.org/wiki/Q3237776","display_name":"Frequency scaling","level":3,"score":0.46434861421585083},{"id":"https://openalex.org/C2780080018","wikidata":"https://www.wikidata.org/wiki/Q2439233","display_name":"Tolerance analysis","level":2,"score":0.45934635400772095},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.44224807620048523},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.41657018661499023},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3912144601345062},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.35624873638153076},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.31854891777038574},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.1907883584499359},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.124489426612854},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3489517.3530530","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3489517.3530530","pdf_url":null,"source":{"id":"https://openalex.org/S4363608816","display_name":"Proceedings of the 59th ACM/IEEE Design Automation Conference","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 59th ACM/IEEE Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.9100000262260437}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1991670063","https://openalex.org/W2026005150","https://openalex.org/W2060002782","https://openalex.org/W2288338221","https://openalex.org/W2320080161","https://openalex.org/W2396345169","https://openalex.org/W2507722844","https://openalex.org/W2507785513","https://openalex.org/W2604956773","https://openalex.org/W2613779579","https://openalex.org/W2774688396","https://openalex.org/W2786288697","https://openalex.org/W2913980322","https://openalex.org/W2920866063","https://openalex.org/W2946787298","https://openalex.org/W2963255460","https://openalex.org/W3194625917","https://openalex.org/W4200128939","https://openalex.org/W4242565052","https://openalex.org/W4245661807","https://openalex.org/W4280619382","https://openalex.org/W6647561237","https://openalex.org/W6663687029"],"related_works":["https://openalex.org/W2340036953","https://openalex.org/W1992148151","https://openalex.org/W2015799581","https://openalex.org/W1888695803","https://openalex.org/W2075934899","https://openalex.org/W2187069160","https://openalex.org/W4251706877","https://openalex.org/W4242565052","https://openalex.org/W1991670063","https://openalex.org/W4293026121"],"abstract_inverted_index":{"As":[0],"the":[1,8,31,38,48,67,85,112,146,151,170,176,181,184,189,198],"timing":[2,34,40,51,81,105,142],"guardband":[3],"continues":[4],"to":[5,43,56,195,204],"increase":[6],"with":[7,111,175],"continuous":[9],"technology":[10],"scaling,":[11],"better-than-worst-case":[12],"(BTWC)":[13],"design":[14,22,128],"has":[15],"gained":[16],"more":[17,19],"and":[18,36,60,72,87,102,117,145,161],"attention.":[20],"BTWC":[21,91],"can":[23,108,134,165,192,201],"improve":[24,135],"energy":[25,136],"efficiency":[26,88,137],"and/or":[27],"performance":[28,86,159,186],"by":[29,138,168],"relaxing":[30],"conservative":[32],"static":[33],"constraints":[35],"exploiting":[37,139,169],"dynamic":[39,50,104,141],"margin.":[41],"However,":[42],"avoid":[44],"potential":[45],"reliability":[46],"hazards,":[47],"existing":[49],"analysis":[52],"(DTA)":[53],"tools":[54],"have":[55],"add":[57],"extra":[58],"aging":[59,71,116],"variation":[61],"guardbands,":[62],"which":[63,133],"are":[64],"estimated":[65],"under":[66],"worst-case":[68],"corners":[69],"of":[70,90,114,150,188],"variation.":[73,120],"Such":[74],"guardbanding":[75],"method":[76],"introduces":[77],"unnecessary":[78],"margin":[79],"in":[80,94],"analysis,":[82],"thus":[83],"reducing":[84],"gains":[89],"designs.":[92],"Therefore,":[93],"this":[95],"paper,":[96],"we":[97],"propose":[98,123],"AVATAR,":[99,132],"an":[100,124],"aging-":[101],"variation-aware":[103],"analyzer":[106],"that":[107,156],"perform":[109],"DTA":[110],"impact":[113],"transistor":[115],"random":[118],"process":[119],"We":[121],"also":[122],"application-based":[125],"dynamic-voltage-accuracy-frequency-scaling":[126],"(DVAFS)":[127],"flow":[129,178,191],"based":[130,179],"on":[131,180],"both":[140],"slack":[143],"(DTS)":[144],"intrinsic":[147,171],"error":[148,172],"tolerance":[149],"application.":[152],"The":[153],"results":[154],"show":[155],"a":[157],"45.8%":[158],"improvement":[160,187],"68%":[162],"power":[163],"savings":[164],"be":[166,193,202],"achieved":[167],"tolerance.":[173],"Compared":[174],"conventional":[177],"corner-based":[182],"DTA,":[183],"additional":[185,199],"proposed":[190],"up":[194,203],"14%":[196],"or":[197],"power-saving":[200],"20%.":[205]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2022-08-25T00:00:00"}