{"id":"https://openalex.org/W3211397308","doi":"https://doi.org/10.1145/3485730.3492868","title":"Cyber-Physical System for Collecting Data on Moisture Inside the Walls of Buildings","display_name":"Cyber-Physical System for Collecting Data on Moisture Inside the Walls of Buildings","publication_year":2021,"publication_date":"2021-11-11","ids":{"openalex":"https://openalex.org/W3211397308","doi":"https://doi.org/10.1145/3485730.3492868","mag":"3211397308"},"language":"en","primary_location":{"id":"doi:10.1145/3485730.3492868","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3485730.3492868","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 19th ACM Conference on Embedded Networked Sensor Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070349657","display_name":"Grzegorz K\u0142osowski","orcid":"https://orcid.org/0000-0001-7927-3674"},"institutions":[{"id":"https://openalex.org/I8264552","display_name":"Lublin University of Technology","ror":"https://ror.org/024zjzd49","country_code":"PL","type":"education","lineage":["https://openalex.org/I8264552"]}],"countries":["PL"],"is_corresponding":true,"raw_author_name":"Grzegorz K\u0142osowski","raw_affiliation_strings":["Lublin University of Technology, Lublin, Poland"],"affiliations":[{"raw_affiliation_string":"Lublin University of Technology, Lublin, Poland","institution_ids":["https://openalex.org/I8264552"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066003040","display_name":"Tomasz Rymarczyk","orcid":"https://orcid.org/0000-0002-3524-9151"},"institutions":[{"id":"https://openalex.org/I2799788900","display_name":"University of Economics and Innovation","ror":"https://ror.org/012a85e51","country_code":"PL","type":"education","lineage":["https://openalex.org/I2799788900"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Tomasz Rymarczyk.","raw_affiliation_strings":["University of Economics and Innovation in Lublin, Lublin, Poland"],"affiliations":[{"raw_affiliation_string":"University of Economics and Innovation in Lublin, Lublin, Poland","institution_ids":["https://openalex.org/I2799788900"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101849973","display_name":"Marcin Kowalski","orcid":"https://orcid.org/0000-0002-1644-0612"},"institutions":[{"id":"https://openalex.org/I2799788900","display_name":"University of Economics and Innovation","ror":"https://ror.org/012a85e51","country_code":"PL","type":"education","lineage":["https://openalex.org/I2799788900"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Marcin Kowalski","raw_affiliation_strings":["University of Economics and Innovation in Lublin, Lublin, Poland"],"affiliations":[{"raw_affiliation_string":"University of Economics and Innovation in Lublin, Lublin, Poland","institution_ids":["https://openalex.org/I2799788900"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5070349657"],"corresponding_institution_ids":["https://openalex.org/I8264552"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1293389,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"23","issue":null,"first_page":"357","last_page":"358"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.9589999914169312,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.95169997215271,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.9332696199417114},{"id":"https://openalex.org/keywords/inverse-problem","display_name":"Inverse problem","score":0.668796181678772},{"id":"https://openalex.org/keywords/homogeneous","display_name":"Homogeneous","score":0.6675626039505005},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.6604547500610352},{"id":"https://openalex.org/keywords/novelty","display_name":"Novelty","score":0.6496146321296692},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5665206909179688},{"id":"https://openalex.org/keywords/moisture","display_name":"Moisture","score":0.5141584873199463},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.4966440796852112},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.47002553939819336},{"id":"https://openalex.org/keywords/electrical-resistivity-tomography","display_name":"Electrical resistivity tomography","score":0.4427943825721741},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.41425031423568726},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.3271061182022095},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.32552266120910645},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22149407863616943},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2012917399406433},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.18429464101791382},{"id":"https://openalex.org/keywords/electrical-resistivity-and-conductivity","display_name":"Electrical resistivity and conductivity","score":0.17276009917259216},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1237238347530365},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.11022815108299255},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.10847413539886475},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09397730231285095},{"id":"https://openalex.org/keywords/meteorology","display_name":"Meteorology","score":0.08985984325408936}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.9332696199417114},{"id":"https://openalex.org/C135252773","wikidata":"https://www.wikidata.org/wiki/Q1567213","display_name":"Inverse problem","level":2,"score":0.668796181678772},{"id":"https://openalex.org/C66882249","wikidata":"https://www.wikidata.org/wiki/Q169336","display_name":"Homogeneous","level":2,"score":0.6675626039505005},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.6604547500610352},{"id":"https://openalex.org/C2778738651","wikidata":"https://www.wikidata.org/wiki/Q16546687","display_name":"Novelty","level":2,"score":0.6496146321296692},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5665206909179688},{"id":"https://openalex.org/C176864760","wikidata":"https://www.wikidata.org/wiki/Q217651","display_name":"Moisture","level":2,"score":0.5141584873199463},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.4966440796852112},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.47002553939819336},{"id":"https://openalex.org/C60591178","wikidata":"https://www.wikidata.org/wiki/Q488986","display_name":"Electrical resistivity tomography","level":3,"score":0.4427943825721741},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.41425031423568726},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.3271061182022095},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.32552266120910645},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22149407863616943},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2012917399406433},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.18429464101791382},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.17276009917259216},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1237238347530365},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.11022815108299255},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.10847413539886475},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09397730231285095},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.08985984325408936},{"id":"https://openalex.org/C27206212","wikidata":"https://www.wikidata.org/wiki/Q34178","display_name":"Theology","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3485730.3492868","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3485730.3492868","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 19th ACM Conference on Embedded Networked Sensor Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11","score":0.7799999713897705}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2805890534","https://openalex.org/W2953483414","https://openalex.org/W2966172989","https://openalex.org/W3123944501"],"related_works":["https://openalex.org/W2553917976","https://openalex.org/W3211685995","https://openalex.org/W2532315310","https://openalex.org/W4239884404","https://openalex.org/W2902419700","https://openalex.org/W3160616384","https://openalex.org/W2098962200","https://openalex.org/W2905540725","https://openalex.org/W4376629886","https://openalex.org/W2725829804"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"the":[3,8,13,18,34,43,49,53,59,80,82,92,100,104],"results":[4,84],"of":[5,10,15,20,30,36,58,70,94,99,103],"research":[6,32],"on":[7],"identification":[9],"moisture":[11],"inside":[12],"walls":[14,111],"buildings":[16],"with":[17,91],"use":[19,93],"non-invasive":[21],"electrical":[22],"impedance":[23],"tomography":[24],"(EIT).":[25],"The":[26],"novelty":[27],"and":[28,72,107,114],"contribution":[29],"this":[31],"is":[33],"development":[35],"an":[37],"original":[38],"algorithmic":[39],"method":[40,54],"to":[41],"solve":[42],"ill":[44],"posedness,":[45],"inverse":[46],"problem.":[47],"Since":[48],"new":[50],"algorithm":[51],"optimizes":[52],"for":[55,109],"each":[56],"pixel":[57],"tomographic":[60],"image,":[61],"taking":[62],"into":[63],"account":[64],"a":[65],"specific":[66],"measurement":[67],"vector,":[68],"regardless":[69],"what":[71],"how":[73],"many":[74],"homogeneous":[75,95],"methods":[76],"are":[77,85],"included":[78],"in":[79],"algorithm,":[81],"obtained":[83,90],"more":[86],"accurate":[87],"than":[88],"those":[89],"methods.":[96],"As":[97],"part":[98],"research,":[101],"prototypes":[102],"EIT":[105],"tomograph":[106],"electrodes":[108],"examining":[110],"were":[112],"designed":[113],"manufactured.":[115]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}