{"id":"https://openalex.org/W3215266371","doi":"https://doi.org/10.1145/3460268.3460277","title":"CPDD: A Cascaded-Parallel Defect Detector with Application to Intelligent Inspection in Substation","display_name":"CPDD: A Cascaded-Parallel Defect Detector with Application to Intelligent Inspection in Substation","publication_year":2021,"publication_date":"2021-01-15","ids":{"openalex":"https://openalex.org/W3215266371","doi":"https://doi.org/10.1145/3460268.3460277","mag":"3215266371"},"language":"en","primary_location":{"id":"doi:10.1145/3460268.3460277","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3460268.3460277","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 2nd International Conference on Artificial Intelligence in Electronics Engineering","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017780197","display_name":"Han Sun","orcid":"https://orcid.org/0000-0003-4584-3688"},"institutions":[{"id":"https://openalex.org/I4210118629","display_name":"NARI Group (China)","ror":"https://ror.org/02egn3136","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210118629"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Han Sun","raw_affiliation_strings":["NARI Technology Development Co. Ltd, China"],"affiliations":[{"raw_affiliation_string":"NARI Technology Development Co. Ltd, China","institution_ids":["https://openalex.org/I4210118629"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100378633","display_name":"Jing Wang","orcid":"https://orcid.org/0000-0003-0241-0743"},"institutions":[{"id":"https://openalex.org/I4210118629","display_name":"NARI Group (China)","ror":"https://ror.org/02egn3136","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210118629"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Wang","raw_affiliation_strings":["NARI Technology Development Co. Ltd, China"],"affiliations":[{"raw_affiliation_string":"NARI Technology Development Co. Ltd, China","institution_ids":["https://openalex.org/I4210118629"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101543891","display_name":"Kunlun Li","orcid":"https://orcid.org/0000-0002-5797-6560"},"institutions":[{"id":"https://openalex.org/I4210118629","display_name":"NARI Group (China)","ror":"https://ror.org/02egn3136","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210118629"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kunlun Li","raw_affiliation_strings":["NARI Technology Development Co. Ltd, China"],"affiliations":[{"raw_affiliation_string":"NARI Technology Development Co. Ltd, China","institution_ids":["https://openalex.org/I4210118629"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100703050","display_name":"Qingwei Zhang","orcid":"https://orcid.org/0009-0003-0567-6739"},"institutions":[{"id":"https://openalex.org/I4210118629","display_name":"NARI Group (China)","ror":"https://ror.org/02egn3136","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210118629"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qingwei Zhang","raw_affiliation_strings":["NARI Technology Development Co. Ltd, China"],"affiliations":[{"raw_affiliation_string":"NARI Technology Development Co. Ltd, China","institution_ids":["https://openalex.org/I4210118629"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5017780197"],"corresponding_institution_ids":["https://openalex.org/I4210118629"],"apc_list":null,"apc_paid":null,"fwci":0.2633,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.54696413,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"60","last_page":"66"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7311159372329712},{"id":"https://openalex.org/keywords/fuse","display_name":"Fuse (electrical)","score":0.6949242949485779},{"id":"https://openalex.org/keywords/bounding-overwatch","display_name":"Bounding overwatch","score":0.6007038354873657},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.5651738047599792},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.5402642488479614},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.540027379989624},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.515189528465271},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4194793403148651},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.36077427864074707},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.21517091989517212},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18122965097427368}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7311159372329712},{"id":"https://openalex.org/C141353440","wikidata":"https://www.wikidata.org/wiki/Q182221","display_name":"Fuse (electrical)","level":2,"score":0.6949242949485779},{"id":"https://openalex.org/C63584917","wikidata":"https://www.wikidata.org/wiki/Q333286","display_name":"Bounding overwatch","level":2,"score":0.6007038354873657},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5651738047599792},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.5402642488479614},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.540027379989624},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.515189528465271},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4194793403148651},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.36077427864074707},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.21517091989517212},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18122965097427368},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3460268.3460277","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3460268.3460277","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 2nd International Conference on Artificial Intelligence in Electronics Engineering","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W2766144630","https://openalex.org/W2964121718","https://openalex.org/W2964241181","https://openalex.org/W2994032767","https://openalex.org/W2997747012","https://openalex.org/W3016818246","https://openalex.org/W3017387426","https://openalex.org/W3033447432","https://openalex.org/W3042573446","https://openalex.org/W3085618511","https://openalex.org/W3154376708"],"related_works":["https://openalex.org/W3000097931","https://openalex.org/W2354322770","https://openalex.org/W4237547500","https://openalex.org/W1570848052","https://openalex.org/W2373192430","https://openalex.org/W4239268388","https://openalex.org/W4243305035","https://openalex.org/W1537496349","https://openalex.org/W2379407973","https://openalex.org/W2350267540"],"abstract_inverted_index":{"The":[0,83,108],"intelligent":[1],"inspection":[2,144],"is":[3,51,111],"a":[4,61],"detection":[5,72,105],"problem":[6],"that":[7],"aims":[8,86],"to":[9,35,64,87,112],"recognize":[10],"abnormalities":[11],"in":[12,146],"substations.":[13],"Defects":[14],"acquired":[15,140],"by":[16,141],"various":[17],"devices":[18],"with":[19],"small":[20],"size,":[21],"truncation,":[22],"and":[23,42,44,92,129],"similar":[24],"appearance":[25],"are":[26],"easily":[27],"confused,":[28],"which":[29],"biases":[30],"the":[31,38,69,89,95,103,116,123,131,138,151],"evaluation":[32],"metrics.":[33],"How":[34],"correctly":[36],"explore":[37],"relationships":[39,91],"between":[40],"equipment":[41],"defects,":[43],"fully":[45],"utilize":[46,122],"results":[47,114,136],"from":[48,115,125],"different":[49,147],"models":[50,128],"critical":[52],"for":[53],"this":[54,57],"task.":[55],"In":[56],"work,":[58],"we":[59],"propose":[60],"novel":[62],"solution":[63],"these":[65,126],"problems":[66],"based":[67],"on":[68,137],"cascaded-parallel":[70],"defect":[71],"(CPDD)":[73],"algorithm.":[74],"Specifically,":[75],"it":[76],"consists":[77],"of":[78,153],"two":[79],"key":[80],"components:":[81],"(1)":[82],"cascaded":[84,118],"model":[85,110],"mine":[88],"detailed":[90],"filter":[93],"out":[94],"illogical":[96],"bounding":[97],"boxes.":[98],"This":[99],"way":[100],"can":[101,121,158],"reduce":[102],"miss":[104],"rate.":[106,133],"(2)":[107],"parallel":[109],"fuse":[113],"mentioned":[117],"model.":[119],"It":[120,157],"information":[124],"two-stage":[127],"promote":[130],"detectable":[132],"Extensive":[134],"empirical":[135],"dataset,":[139],"our":[142,154],"designed":[143],"system":[145],"voltage-level":[148],"substations,":[149],"demonstrate":[150],"superiority":[152],"proposed":[155],"method.":[156],"achieve":[159],"state-of-the-art":[160],"performance.":[161]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
