{"id":"https://openalex.org/W3173867560","doi":"https://doi.org/10.1145/3453688.3461487","title":"Tolerating Stuck-at Fault and Variation in Resistive Edge Inference Engine via Weight Mapping","display_name":"Tolerating Stuck-at Fault and Variation in Resistive Edge Inference Engine via Weight Mapping","publication_year":2021,"publication_date":"2021-06-18","ids":{"openalex":"https://openalex.org/W3173867560","doi":"https://doi.org/10.1145/3453688.3461487","mag":"3173867560"},"language":"en","primary_location":{"id":"doi:10.1145/3453688.3461487","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3453688.3461487","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/3453688.3461487","source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2021 Great Lakes Symposium on VLSI","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://dl.acm.org/doi/pdf/10.1145/3453688.3461487","any_repository_has_fulltext":null},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103257197","display_name":"Yu Ma","orcid":"https://orcid.org/0000-0003-4360-2098"},"institutions":[{"id":"https://openalex.org/I30809798","display_name":"ShanghaiTech University","ror":"https://ror.org/030bhh786","country_code":"CN","type":"education","lineage":["https://openalex.org/I30809798"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Ma","raw_affiliation_strings":["ShanghaiTech University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ShanghaiTech University, Shanghai, China","institution_ids":["https://openalex.org/I30809798"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101633239","display_name":"Linfeng Zheng","orcid":"https://orcid.org/0000-0002-4029-8724"},"institutions":[{"id":"https://openalex.org/I30809798","display_name":"ShanghaiTech University","ror":"https://ror.org/030bhh786","country_code":"CN","type":"education","lineage":["https://openalex.org/I30809798"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Linfeng Zheng","raw_affiliation_strings":["ShanghaiTech University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ShanghaiTech University, Shanghai, China","institution_ids":["https://openalex.org/I30809798"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081772659","display_name":"Pingqiang Zhou","orcid":"https://orcid.org/0000-0001-9515-9302"},"institutions":[{"id":"https://openalex.org/I30809798","display_name":"ShanghaiTech University","ror":"https://ror.org/030bhh786","country_code":"CN","type":"education","lineage":["https://openalex.org/I30809798"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pingqiang Zhou","raw_affiliation_strings":["ShanghaiTech University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ShanghaiTech University, Shanghai, China","institution_ids":["https://openalex.org/I30809798"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.05665021,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"313","last_page":"318"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.715435266494751},{"id":"https://openalex.org/keywords/inference","display_name":"Inference","score":0.6849781274795532},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.6722079515457153},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6444108486175537},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.602717399597168},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.4844536781311035},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.47335243225097656},{"id":"https://openalex.org/keywords/inference-engine","display_name":"Inference engine","score":0.4696924686431885},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.45833924412727356},{"id":"https://openalex.org/keywords/memristor","display_name":"Memristor","score":0.43565836548805237},{"id":"https://openalex.org/keywords/variation","display_name":"Variation (astronomy)","score":0.43314650654792786},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4033510982990265},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.26977062225341797},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.17246076464653015},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13325196504592896},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.1105671226978302},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.08643433451652527}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.715435266494751},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.6849781274795532},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.6722079515457153},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6444108486175537},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.602717399597168},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.4844536781311035},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.47335243225097656},{"id":"https://openalex.org/C46743427","wikidata":"https://www.wikidata.org/wiki/Q1341685","display_name":"Inference engine","level":3,"score":0.4696924686431885},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.45833924412727356},{"id":"https://openalex.org/C150072547","wikidata":"https://www.wikidata.org/wiki/Q212923","display_name":"Memristor","level":2,"score":0.43565836548805237},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.43314650654792786},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4033510982990265},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.26977062225341797},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.17246076464653015},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13325196504592896},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.1105671226978302},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.08643433451652527},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3453688.3461487","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3453688.3461487","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/3453688.3461487","source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2021 Great Lakes Symposium on VLSI","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1145/3453688.3461487","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3453688.3461487","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/3453688.3461487","source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2021 Great Lakes Symposium on VLSI","raw_type":"proceedings-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3173867560.pdf","grobid_xml":"https://content.openalex.org/works/W3173867560.grobid-xml"},"referenced_works_count":24,"referenced_works":["https://openalex.org/W2027342132","https://openalex.org/W2056507634","https://openalex.org/W2082311137","https://openalex.org/W2123151033","https://openalex.org/W2143483829","https://openalex.org/W2197375212","https://openalex.org/W2399958287","https://openalex.org/W2518281301","https://openalex.org/W2612375349","https://openalex.org/W2625840880","https://openalex.org/W2768104155","https://openalex.org/W2775771159","https://openalex.org/W2786027963","https://openalex.org/W2802745381","https://openalex.org/W2810068957","https://openalex.org/W2909800597","https://openalex.org/W2946591837","https://openalex.org/W2976364148","https://openalex.org/W2978384356","https://openalex.org/W2998758749","https://openalex.org/W3004127905","https://openalex.org/W3081302630","https://openalex.org/W4243519499","https://openalex.org/W4245731639"],"related_works":["https://openalex.org/W2057057690","https://openalex.org/W2368184788","https://openalex.org/W2358964818","https://openalex.org/W2359535128","https://openalex.org/W2381332051","https://openalex.org/W2321443665","https://openalex.org/W2375699995","https://openalex.org/W2043719711","https://openalex.org/W2140069467","https://openalex.org/W2364072231"],"abstract_inverted_index":{"There":[0],"is":[1],"an":[2,97,118],"increasing":[3],"demand":[4],"for":[5,64],"running":[6],"neural":[7,24,46],"network":[8],"inference":[9,54],"on":[10,26,53,61,78,108],"edge":[11,27,65],"devices.":[12,28,66],"Memristor":[13],"crossbar":[14],"array":[15],"(MCA)":[16],"based":[17,77,107],"accelerators":[18],"can":[19,135,143],"be":[20],"used":[21],"to":[22,42,88,122,147],"accelerate":[23],"networks":[25,47],"However,":[29],"reliability":[30,62,70],"issues":[31,63],"in":[32,150],"memristors,":[33],"such":[34],"as":[35,72],"stuck-at":[36],"faults":[37],"(SAF)":[38],"and":[39,48,142],"variations,":[40],"lead":[41],"weight":[43,83,113],"deviation":[44],"of":[45,81,111],"therefore":[49],"have":[50,102],"severe":[51],"influence":[52],"accuracy.":[55],"In":[56,86],"this":[57],"work,":[58],"we":[59,92,116],"focus":[60],"We":[67],"formulate":[68],"the":[69,79,90,94,103,112,124],"problem":[71,95],"a":[73],"0-1":[74],"programming":[75],"problem,":[76,91],"analysis":[80],"sum":[82],"variation":[84,151],"(SWV).":[85],"order":[87],"solve":[89,123],"simplify":[93],"with":[96],"approximation":[98],"-":[99,106],"different":[100],"columns":[101],"same":[104],"weights":[105],"our":[109,132],"observation":[110],"distribution.":[114],"Then":[115],"propose":[117],"effective":[119],"mapping":[120],"method":[121,134],"simplified":[125],"problem.":[126],"The":[127],"experimental":[128],"results":[129],"show":[130],"that":[131],"proposed":[133],"recover":[136],"95%":[137],"accuracy":[138,149],"considering":[139],"SAF":[140],"defects":[141],"increase":[144],"by":[145],"up":[146],"60%":[148],"\u03c3=0.4.":[152]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}