{"id":"https://openalex.org/W3154985521","doi":"https://doi.org/10.1145/3447450.3447471","title":"Fuse Box Image Segmentation Based On Improved FCM","display_name":"Fuse Box Image Segmentation Based On Improved FCM","publication_year":2020,"publication_date":"2020-12-25","ids":{"openalex":"https://openalex.org/W3154985521","doi":"https://doi.org/10.1145/3447450.3447471","mag":"3154985521"},"language":"en","primary_location":{"id":"doi:10.1145/3447450.3447471","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3447450.3447471","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 The 4th International Conference on Video and Image Processing","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082814011","display_name":"Xiaofeng Yue","orcid":"https://orcid.org/0009-0002-4862-4085"},"institutions":[{"id":"https://openalex.org/I4385474403","display_name":"Changchun University of Technology","ror":"https://ror.org/052pakb34","country_code":null,"type":"education","lineage":["https://openalex.org/I4385474403"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiaofeng Yue","raw_affiliation_strings":["Changchun University of Technology, China"],"affiliations":[{"raw_affiliation_string":"Changchun University of Technology, China","institution_ids":["https://openalex.org/I4385474403","https://openalex.org/I4385474403"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044691331","display_name":"Juan Zhu","orcid":null},"institutions":[{"id":"https://openalex.org/I4385474403","display_name":"Changchun University of Technology","ror":"https://ror.org/052pakb34","country_code":null,"type":"education","lineage":["https://openalex.org/I4385474403"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Juan Zhu","raw_affiliation_strings":["Changchun University of Technology, China"],"affiliations":[{"raw_affiliation_string":"Changchun University of Technology, China","institution_ids":["https://openalex.org/I4385474403","https://openalex.org/I4385474403"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086464846","display_name":"Xiaodong Zhou","orcid":"https://orcid.org/0000-0002-0287-8904"},"institutions":[{"id":"https://openalex.org/I4385474403","display_name":"Changchun University of Technology","ror":"https://ror.org/052pakb34","country_code":null,"type":"education","lineage":["https://openalex.org/I4385474403"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaodong Zhou","raw_affiliation_strings":["Changchun University of Technology, China"],"affiliations":[{"raw_affiliation_string":"Changchun University of Technology, China","institution_ids":["https://openalex.org/I4385474403","https://openalex.org/I4385474403"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100693180","display_name":"Zeyuan Liu","orcid":"https://orcid.org/0000-0002-6621-3688"},"institutions":[{"id":"https://openalex.org/I4385474403","display_name":"Changchun University of Technology","ror":"https://ror.org/052pakb34","country_code":null,"type":"education","lineage":["https://openalex.org/I4385474403"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zeyuan Liu","raw_affiliation_strings":["Changchun University of Technology, China"],"affiliations":[{"raw_affiliation_string":"Changchun University of Technology, China","institution_ids":["https://openalex.org/I4385474403","https://openalex.org/I4385474403"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074483644","display_name":"Xianning Yu","orcid":null},"institutions":[{"id":"https://openalex.org/I4385474403","display_name":"Changchun University of Technology","ror":"https://ror.org/052pakb34","country_code":null,"type":"education","lineage":["https://openalex.org/I4385474403"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xianning Yu","raw_affiliation_strings":["Changchun University of Technology, China"],"affiliations":[{"raw_affiliation_string":"Changchun University of Technology, China","institution_ids":["https://openalex.org/I4385474403","https://openalex.org/I4385474403"]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5082814011"],"corresponding_institution_ids":["https://openalex.org/I4385474403"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.33937161,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"88","last_page":"92"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fuse","display_name":"Fuse (electrical)","score":0.9060403108596802},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7190642952919006},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6768178939819336},{"id":"https://openalex.org/keywords/rgb-color-model","display_name":"RGB color model","score":0.6240525841712952},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.6188629865646362},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.6041125059127808},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.564008891582489},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5611640810966492},{"id":"https://openalex.org/keywords/data-set","display_name":"Data set","score":0.5427849292755127},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.5007894039154053},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.49935054779052734},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4914158582687378},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.4469519853591919},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.43476593494415283},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1260882318019867}],"concepts":[{"id":"https://openalex.org/C141353440","wikidata":"https://www.wikidata.org/wiki/Q182221","display_name":"Fuse (electrical)","level":2,"score":0.9060403108596802},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7190642952919006},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6768178939819336},{"id":"https://openalex.org/C82990744","wikidata":"https://www.wikidata.org/wiki/Q166194","display_name":"RGB color model","level":2,"score":0.6240525841712952},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.6188629865646362},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.6041125059127808},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.564008891582489},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5611640810966492},{"id":"https://openalex.org/C58489278","wikidata":"https://www.wikidata.org/wiki/Q1172284","display_name":"Data set","level":2,"score":0.5427849292755127},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.5007894039154053},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.49935054779052734},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4914158582687378},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.4469519853591919},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.43476593494415283},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1260882318019867},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3447450.3447471","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3447450.3447471","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 The 4th International Conference on Video and Image Processing","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2073606110","display_name":null,"funder_award_id":"2020C018-3","funder_id":"https://openalex.org/F4320316081","funder_display_name":"Jilin Province Development and Reform Commission"}],"funders":[{"id":"https://openalex.org/F4320316081","display_name":"Jilin Province Development and Reform Commission","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2763160469","https://openalex.org/W2789717942","https://openalex.org/W2887557057","https://openalex.org/W2887648988","https://openalex.org/W2942398206","https://openalex.org/W2946188330","https://openalex.org/W2972093541"],"related_works":["https://openalex.org/W3000097931","https://openalex.org/W2354322770","https://openalex.org/W4237547500","https://openalex.org/W1570848052","https://openalex.org/W2373192430","https://openalex.org/W4239268388","https://openalex.org/W4243305035","https://openalex.org/W1537496349","https://openalex.org/W2379407973","https://openalex.org/W2350267540"],"abstract_inverted_index":{"In":[0],"order":[1],"to":[2,32,59,66,93],"segment":[3,80],"the":[4,27,30,36,43,53,56,60,68,98],"image":[5],"of":[6,23,29],"fuse":[7,81],"box,":[8],"a":[9,48],"color":[10,86],"based":[11],"FCM":[12,64],"algorithm":[13],"is":[14,91],"proposed":[15],"in":[16,55,76],"this":[17,77],"paper.":[18],"First,":[19],"build":[20],"data":[21,37,69],"set":[22,38],"RGB":[24],"feature.":[25,87],"Analyze":[26],"feature":[28],"target":[31],"be":[33],"classified.":[34],"Extract":[35],"make":[39],"it":[40],"suitable":[41],"for":[42],"current":[44],"target.":[45],"Second,":[46],"define":[47],"classified":[49],"vector":[50,57],"CF.":[51],"Calculate":[52],"values":[54],"according":[58],"definition.":[61],"Third,":[62],"Use":[63],"method":[65,75],"cluster":[67],"set.":[70],"Experimental":[71],"results":[72],"show":[73],"that":[74],"paper":[78],"can":[79,96],"box":[82],"which":[83,95],"has":[84],"obvious":[85],"The":[88],"calculate":[89,99],"pixel":[90],"reduced":[92],"38%":[94],"reduce":[97],"time":[100],"greatly.":[101]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}