{"id":"https://openalex.org/W3086664545","doi":"https://doi.org/10.1145/3410530.3414596","title":"How particle detector can aid visual inspection for defect detection of TFT-LCD manufacturing","display_name":"How particle detector can aid visual inspection for defect detection of TFT-LCD manufacturing","publication_year":2020,"publication_date":"2020-09-10","ids":{"openalex":"https://openalex.org/W3086664545","doi":"https://doi.org/10.1145/3410530.3414596","mag":"3086664545"},"language":"en","primary_location":{"id":"doi:10.1145/3410530.3414596","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3410530.3414596","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Adjunct Proceedings of the 2020 ACM International Joint Conference on Pervasive and Ubiquitous Computing and Proceedings of the 2020 ACM International Symposium on Wearable Computers","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087163437","display_name":"Marzieh Khakifirooz","orcid":"https://orcid.org/0000-0002-1721-2646"},"institutions":[{"id":"https://openalex.org/I98461037","display_name":"Tecnol\u00f3gico de Monterrey","ror":"https://ror.org/03ayjn504","country_code":"MX","type":"education","lineage":["https://openalex.org/I98461037"]}],"countries":["MX"],"is_corresponding":true,"raw_author_name":"Marzieh Khakifirooz","raw_affiliation_strings":["Tecnologico de Monterrey"],"affiliations":[{"raw_affiliation_string":"Tecnologico de Monterrey","institution_ids":["https://openalex.org/I98461037"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057897754","display_name":"Mahdi Fathi","orcid":"https://orcid.org/0000-0001-6863-4761"},"institutions":[{"id":"https://openalex.org/I123534392","display_name":"University of North Texas","ror":"https://ror.org/00v97ad02","country_code":"US","type":"education","lineage":["https://openalex.org/I123534392"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mahdi Fathi","raw_affiliation_strings":["University of North Texas"],"affiliations":[{"raw_affiliation_string":"University of North Texas","institution_ids":["https://openalex.org/I123534392"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5087163437"],"corresponding_institution_ids":["https://openalex.org/I98461037"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15259207,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"547","last_page":"552"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9732000231742859,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9617000222206116,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/liquid-crystal-display","display_name":"Liquid-crystal display","score":0.7491723299026489},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6515268087387085},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.6142579913139343},{"id":"https://openalex.org/keywords/categorization","display_name":"Categorization","score":0.5443046689033508},{"id":"https://openalex.org/keywords/thin-film-transistor","display_name":"Thin-film transistor","score":0.520056426525116},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5159526467323303},{"id":"https://openalex.org/keywords/manufacturing-process","display_name":"Manufacturing process","score":0.4769103527069092},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.43532732129096985},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.43360668420791626},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.4171249270439148},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3444925546646118},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3293095827102661},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.18257248401641846},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.07079574465751648}],"concepts":[{"id":"https://openalex.org/C128019096","wikidata":"https://www.wikidata.org/wiki/Q83341","display_name":"Liquid-crystal display","level":2,"score":0.7491723299026489},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6515268087387085},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.6142579913139343},{"id":"https://openalex.org/C94124525","wikidata":"https://www.wikidata.org/wiki/Q912550","display_name":"Categorization","level":2,"score":0.5443046689033508},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.520056426525116},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5159526467323303},{"id":"https://openalex.org/C2987875673","wikidata":"https://www.wikidata.org/wiki/Q187939","display_name":"Manufacturing process","level":2,"score":0.4769103527069092},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.43532732129096985},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.43360668420791626},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.4171249270439148},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3444925546646118},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3293095827102661},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.18257248401641846},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.07079574465751648},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3410530.3414596","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3410530.3414596","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Adjunct Proceedings of the 2020 ACM International Joint Conference on Pervasive and Ubiquitous Computing and Proceedings of the 2020 ACM International Symposium on Wearable Computers","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8100000023841858,"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1967160092","https://openalex.org/W2000820311","https://openalex.org/W2064550465","https://openalex.org/W2103880841","https://openalex.org/W2111002045","https://openalex.org/W2120505141","https://openalex.org/W2305899843","https://openalex.org/W2930589274","https://openalex.org/W2977511705","https://openalex.org/W2982535616","https://openalex.org/W3030893967"],"related_works":["https://openalex.org/W1976630228","https://openalex.org/W2168051707","https://openalex.org/W2141796872","https://openalex.org/W1995584621","https://openalex.org/W2083881355","https://openalex.org/W1968703405","https://openalex.org/W2353338342","https://openalex.org/W2036852092","https://openalex.org/W2349084057","https://openalex.org/W2102089219"],"abstract_inverted_index":{"Traditional":[0],"defect":[1,99,124],"classification":[2,102],"of":[3,24,31,45,71,80,90,123],"TFT-LCD":[4,35,53],"array":[5,36,54],"processing":[6],"leaned":[7],"on":[8,84,105],"human":[9,81,85],"decision-maker":[10],"in":[11,33,51,66],"which":[12],"visual":[13],"inspection":[14],"used":[15],"to":[16,41,95,112],"categorize":[17],"defects":[18,32],"and":[19,48,69,78,88,101,118],"consequently":[20],"identify":[21],"the":[22,28,34,42,46,52,56,67,76,114,121],"rout-causes":[23],"defects.":[25],"In":[26],"practice,":[27],"main":[29],"sources":[30],"process":[37,122],"are":[38],"particles.":[39],"Due":[40],"huge":[43],"size":[44],"machinery":[47],"production":[49],"tools":[50],"process,":[55],"sensor":[57,72],"allocation":[58],"for":[59],"particle":[60,109],"detection":[61,100],"plays":[62],"a":[63,97],"critical":[64],"role":[65],"inadequacy":[68],"quality":[70],"data.":[73],"Therefore,":[74],"where":[75],"adequacy":[77],"efficiency":[79],"performance":[82],"depend":[83],"factors,":[86],"emotion,":[87],"level":[89],"attention,":[91],"this":[92],"study":[93],"aims":[94],"design":[96],"semi-automatic":[98],"method":[103],"based":[104],"information":[106],"capture":[107],"by":[108],"detector":[110],"sensors":[111],"reduce":[113],"cognitive":[115],"load":[116],"devaluation":[117],"proceed":[119],"with":[120],"classification.":[125]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}