{"id":"https://openalex.org/W3111958023","doi":"https://doi.org/10.1145/3400302.3415635","title":"Electromigration checking using a stochastic effective current model","display_name":"Electromigration checking using a stochastic effective current model","publication_year":2020,"publication_date":"2020-11-02","ids":{"openalex":"https://openalex.org/W3111958023","doi":"https://doi.org/10.1145/3400302.3415635","mag":"3111958023"},"language":"en","primary_location":{"id":"doi:10.1145/3400302.3415635","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3400302.3415635","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 39th International Conference on Computer-Aided Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000369904","display_name":"Adam Issa","orcid":null},"institutions":[{"id":"https://openalex.org/I185261750","display_name":"University of Toronto","ror":"https://ror.org/03dbr7087","country_code":"CA","type":"education","lineage":["https://openalex.org/I185261750"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Adam Issa","raw_affiliation_strings":["University of Toronto, Toronto, ON, Canada"],"affiliations":[{"raw_affiliation_string":"University of Toronto, Toronto, ON, Canada","institution_ids":["https://openalex.org/I185261750"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021627904","display_name":"Valeriy Sukharev","orcid":"https://orcid.org/0000-0002-5647-0584"},"institutions":[{"id":"https://openalex.org/I1325886976","display_name":"Siemens (Germany)","ror":"https://ror.org/059mq0909","country_code":"DE","type":"company","lineage":["https://openalex.org/I1325886976"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Valeriy Sukharev","raw_affiliation_strings":["A Siemens Business"],"affiliations":[{"raw_affiliation_string":"A Siemens Business","institution_ids":["https://openalex.org/I1325886976"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089881278","display_name":"Farid N. Najm","orcid":"https://orcid.org/0000-0001-5393-7794"},"institutions":[{"id":"https://openalex.org/I185261750","display_name":"University of Toronto","ror":"https://ror.org/03dbr7087","country_code":"CA","type":"education","lineage":["https://openalex.org/I185261750"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Farid N. Najm","raw_affiliation_strings":["University of Toronto, Toronto, ON, Canada"],"affiliations":[{"raw_affiliation_string":"University of Toronto, Toronto, ON, Canada","institution_ids":["https://openalex.org/I185261750"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5000369904"],"corresponding_institution_ids":["https://openalex.org/I185261750"],"apc_list":null,"apc_paid":null,"fwci":0.0664,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.29699707,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromigration","display_name":"Electromigration","score":0.970987856388092},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.7181718349456787},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5466788411140442},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.124860018491745},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12228161096572876}],"concepts":[{"id":"https://openalex.org/C138055206","wikidata":"https://www.wikidata.org/wiki/Q1319010","display_name":"Electromigration","level":2,"score":0.970987856388092},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.7181718349456787},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5466788411140442},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.124860018491745},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12228161096572876}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3400302.3415635","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3400302.3415635","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 39th International Conference on Computer-Aided Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W578295231","https://openalex.org/W1528653255","https://openalex.org/W1559536185","https://openalex.org/W1970826249","https://openalex.org/W2007719944","https://openalex.org/W2081786181","https://openalex.org/W2114178877","https://openalex.org/W2155028245","https://openalex.org/W2472275884","https://openalex.org/W2587645287","https://openalex.org/W3158009766"],"related_works":["https://openalex.org/W113636360","https://openalex.org/W1645422805","https://openalex.org/W2017313547","https://openalex.org/W1986515636","https://openalex.org/W2465644818","https://openalex.org/W2107364367","https://openalex.org/W2189655511","https://openalex.org/W2024678397","https://openalex.org/W2478434456","https://openalex.org/W4302369913"],"abstract_inverted_index":{"Electromigration":[0],"(EM)":[1],"degradation":[2],"evolves":[3],"slowly":[4],"towards":[5],"failure,":[6],"over":[7,34],"a":[8,54,104,170,187,231],"period":[9],"of":[10,68,126,129,141,144,174,218,226],"years.":[11],"This":[12,203],"is":[13,115,146,221],"why":[14],"EM":[15,176],"checking":[16],"methods":[17],"use":[18,67],"effective":[19,106],"current":[20,40,107,112,151],"models":[21],"to":[22,92,119,148,157],"represent":[23],"the":[24,43,66,110,127,133,138,161,165,175,207,215,219,227,235],"underlying":[25],"circuit":[26],"workload,":[27],"which":[28,122,153,168],"are":[29,80,154],"typically":[30],"constant":[31],"(DC)":[32],"currents":[33],"time.":[35],"However,":[36],"ignoring":[37],"all":[38],"input":[39,50,111,130,150],"variations":[41,51,89],"around":[42,160,224],"mean":[44],"can":[45,52,90,180,209],"be":[46,97,181,192,210],"risky,":[47],"because":[48],"low-frequency":[49,76],"have":[53],"significant":[55],"impact":[56,128],"on":[57,132,137],"EM,":[58],"resulting":[59],"in":[60,78,84,164,234],"shorter":[61],"than":[62],"expected":[63,139],"lifetimes.":[64,236],"With":[65],"dark":[69],"silicon":[70],"and":[71,95,121],"multimodal":[72],"chip":[73],"operation,":[74],"such":[75],"changes":[77],"workload":[79],"becoming":[81],"increasingly":[82],"common":[83],"modern":[85],"designs.":[86],"Ignoring":[87],"these":[88],"lead":[91],"false":[93],"positives":[94],"must":[96],"avoided.":[98],"We":[99],"tackle":[100],"this":[101],"by":[102],"developing":[103],"stochastic":[105,124],"model":[108],"for":[109,117,183,199],"waveforms":[113,163],"that":[114,194,206],"easy":[116],"users":[118],"specify":[120],"allows":[123,195],"estimation":[125],"variability":[131],"lifetime.":[134,177],"User-provided":[135],"guidance":[136],"durations":[140],"various":[142],"modes":[143],"operation":[145],"used":[147],"provide":[149,158],"variances,":[152],"then":[155],"propagated":[156],"variances":[159],"stress":[162],"metal":[166],"network,":[167],"gives":[169],"more":[171],"realistic":[172],"estimate":[173],"Variance":[178],"propagation":[179,198],"expensive":[182],"large":[184,200],"systems,":[185],"but":[186],"novel":[188],"simulation-like":[189],"framework":[190],"will":[191],"presented":[193],"efficient":[196],"variance":[197,208],"interconnect":[201],"trees.":[202],"has":[204],"revealed":[205],"highly":[211],"significant.":[212],"Even":[213],"when":[214],"standard":[216],"deviation":[217],"inputs":[220],"small,":[222],"at":[223],"20--30%":[225],"mean,":[228],"we":[229],"see":[230],"30--40%":[232],"drop":[233]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}