{"id":"https://openalex.org/W3017155169","doi":"https://doi.org/10.1145/3387940.3392253","title":"Improving The Effectiveness of Automatically Generated Test Suites Using Metamorphic Testing","display_name":"Improving The Effectiveness of Automatically Generated Test Suites Using Metamorphic Testing","publication_year":2020,"publication_date":"2020-06-27","ids":{"openalex":"https://openalex.org/W3017155169","doi":"https://doi.org/10.1145/3387940.3392253","mag":"3017155169"},"language":"en","primary_location":{"id":"doi:10.1145/3387940.3392253","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3387940.3392253","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE/ACM 42nd International Conference on Software Engineering Workshops","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["arxiv","crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/2004.08518","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008059783","display_name":"Prashanta Saha","orcid":"https://orcid.org/0000-0002-9571-9485"},"institutions":[{"id":"https://openalex.org/I23732399","display_name":"Montana State University","ror":"https://ror.org/02w0trx84","country_code":"US","type":"education","lineage":["https://openalex.org/I23732399","https://openalex.org/I4210126032"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Prashanta Saha","raw_affiliation_strings":["School of Computing, Montana State University, Bozeman, Montana, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computing, Montana State University, Bozeman, Montana, USA","institution_ids":["https://openalex.org/I23732399"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083120673","display_name":"Upulee Kanewala","orcid":"https://orcid.org/0000-0002-5954-1616"},"institutions":[{"id":"https://openalex.org/I23732399","display_name":"Montana State University","ror":"https://ror.org/02w0trx84","country_code":"US","type":"education","lineage":["https://openalex.org/I23732399","https://openalex.org/I4210126032"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Upulee Kanewala","raw_affiliation_strings":["School of Computing, Montana State University, Bozeman, Montana, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computing, Montana State University, Bozeman, Montana, USA","institution_ids":["https://openalex.org/I23732399"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I23732399"],"apc_list":null,"apc_paid":null,"fwci":0.8021,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.68138425,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"418","last_page":"419"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7757181525230408},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.6300438642501831},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.6202811002731323},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5458614230155945},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5400148034095764},{"id":"https://openalex.org/keywords/keyword-driven-testing","display_name":"Keyword-driven testing","score":0.5157135128974915},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5038036704063416},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.48716971278190613},{"id":"https://openalex.org/keywords/test-management-approach","display_name":"Test Management Approach","score":0.45872944593429565},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.455483615398407},{"id":"https://openalex.org/keywords/software-testing","display_name":"Software testing","score":0.44171276688575745},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.43377697467803955},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.4336397051811218},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3729765713214874},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3507349193096161},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3347695469856262},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3215600848197937},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.2122650444507599},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.1580994427204132},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11393389105796814},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.08735936880111694},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.06737503409385681}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7757181525230408},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.6300438642501831},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.6202811002731323},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5458614230155945},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5400148034095764},{"id":"https://openalex.org/C169168650","wikidata":"https://www.wikidata.org/wiki/Q1675637","display_name":"Keyword-driven testing","level":5,"score":0.5157135128974915},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5038036704063416},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.48716971278190613},{"id":"https://openalex.org/C7435765","wikidata":"https://www.wikidata.org/wiki/Q7705776","display_name":"Test Management Approach","level":5,"score":0.45872944593429565},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.455483615398407},{"id":"https://openalex.org/C2984328558","wikidata":"https://www.wikidata.org/wiki/Q188522","display_name":"Software testing","level":3,"score":0.44171276688575745},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.43377697467803955},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.4336397051811218},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3729765713214874},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3507349193096161},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3347695469856262},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3215600848197937},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.2122650444507599},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.1580994427204132},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11393389105796814},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.08735936880111694},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.06737503409385681},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/3387940.3392253","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3387940.3392253","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE/ACM 42nd International Conference on Software Engineering Workshops","raw_type":"proceedings-article"},{"id":"pmh:oai:arXiv.org:2004.08518","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2004.08518","pdf_url":"https://arxiv.org/pdf/2004.08518","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:2004.08518","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2004.08518","pdf_url":"https://arxiv.org/pdf/2004.08518","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G828186097","display_name":null,"funder_award_id":"1656877","funder_id":"https://openalex.org/F4320315254","funder_display_name":"Innovative Research Group Project of the National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320315254","display_name":"Innovative Research Group Project of the National Natural Science Foundation of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1965194038","https://openalex.org/W1971650562","https://openalex.org/W2110441383","https://openalex.org/W2782311202","https://openalex.org/W2788718979","https://openalex.org/W2962772707","https://openalex.org/W3008797115"],"related_works":["https://openalex.org/W2091833418","https://openalex.org/W2913077774","https://openalex.org/W4256030018","https://openalex.org/W2145089576","https://openalex.org/W2021253405","https://openalex.org/W1986228509","https://openalex.org/W2147400189","https://openalex.org/W1600468096","https://openalex.org/W2340957901","https://openalex.org/W1991935474"],"abstract_inverted_index":{"Automated":[0],"test":[1,15,21,30,46,72],"generation":[2,31],"has":[3],"helped":[4],"to":[5],"reduce":[6,37],"the":[7,38,65],"cost":[8],"of":[9,42,54,69],"software":[10],"testing.":[11],"However,":[12],"developing":[13],"effective":[14],"oracles":[16,35],"for":[17],"these":[18,43],"automatically":[19,44,70],"generated":[20,45,71],"inputs":[22],"is":[23],"a":[24],"challenging":[25],"task.":[26],"Therefore,":[27],"most":[28],"automated":[29],"tools":[32],"use":[33],"trivial":[34],"that":[36,59],"fault":[39,66],"detection":[40,67],"effectiveness":[41,68],"cases.":[47,73],"In":[48],"this":[49],"work,":[50],"we":[51],"provide":[52],"results":[53],"an":[55],"empirical":[56],"study":[57],"showing":[58],"utilizing":[60],"metamorphic":[61],"relations":[62],"can":[63],"increase":[64]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}