{"id":"https://openalex.org/W3030178746","doi":"https://doi.org/10.1145/3386415.3387087","title":"Research and Application of Intelligent Pressure Measuring Instrument","display_name":"Research and Application of Intelligent Pressure Measuring Instrument","publication_year":2019,"publication_date":"2019-12-06","ids":{"openalex":"https://openalex.org/W3030178746","doi":"https://doi.org/10.1145/3386415.3387087","mag":"3030178746"},"language":"en","primary_location":{"id":"doi:10.1145/3386415.3387087","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3386415.3387087","pdf_url":null,"source":{"id":"https://openalex.org/S4306523750","display_name":"Proceedings of the 2nd International Conference on Information Technologies and Electrical Engineering","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2nd International Conference on Information Technologies and Electrical Engineering","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035647982","display_name":"Ruogu Zhang","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Ruogu Zhang","raw_affiliation_strings":["Hunan Cangshu Aerospace, Sci-Tec Co. Ltd, Changsha China"],"affiliations":[{"raw_affiliation_string":"Hunan Cangshu Aerospace, Sci-Tec Co. Ltd, Changsha China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100453276","display_name":"Haitao Li","orcid":"https://orcid.org/0000-0001-5322-5375"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Haitao Li","raw_affiliation_strings":["Hunan Cangshu Aerospace, Sci-Tec Co. Ltd, Changsha China"],"affiliations":[{"raw_affiliation_string":"Hunan Cangshu Aerospace, Sci-Tec Co. Ltd, Changsha China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5055470393","display_name":"Tao Huang","orcid":"https://orcid.org/0000-0002-7645-4290"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tao Huang","raw_affiliation_strings":["Hunan Cangshu Aerospace, Sci-Tec Co. Ltd, Changsha China"],"affiliations":[{"raw_affiliation_string":"Hunan Cangshu Aerospace, Sci-Tec Co. Ltd, Changsha China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5035647982"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.40669145,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14225","display_name":"Advanced Sensor and Control Systems","score":0.8745999932289124,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14225","display_name":"Advanced Sensor and Control Systems","score":0.8745999932289124,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.8320000171661377,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11325","display_name":"Inertial Sensor and Navigation","score":0.8133999705314636,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7109458446502686},{"id":"https://openalex.org/keywords/pressure-measurement","display_name":"Pressure measurement","score":0.6730831861495972},{"id":"https://openalex.org/keywords/pressure-sensor","display_name":"Pressure sensor","score":0.5965763926506042},{"id":"https://openalex.org/keywords/measuring-instrument","display_name":"Measuring instrument","score":0.5840872526168823},{"id":"https://openalex.org/keywords/data-acquisition","display_name":"Data acquisition","score":0.5591812133789062},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.5072450041770935},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4995236396789551},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.4850553572177887},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.4613172709941864},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.45599788427352905},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.4441800117492676},{"id":"https://openalex.org/keywords/instrument-control","display_name":"Instrument control","score":0.41368648409843445},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3858170509338379},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.3833411931991577},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3741399645805359},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.2541266083717346},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19684761762619019},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.158574640750885},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.10393944382667542}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7109458446502686},{"id":"https://openalex.org/C80264047","wikidata":"https://www.wikidata.org/wiki/Q7424019","display_name":"Pressure measurement","level":2,"score":0.6730831861495972},{"id":"https://openalex.org/C41325743","wikidata":"https://www.wikidata.org/wiki/Q1261040","display_name":"Pressure sensor","level":2,"score":0.5965763926506042},{"id":"https://openalex.org/C62646347","wikidata":"https://www.wikidata.org/wiki/Q2041172","display_name":"Measuring instrument","level":2,"score":0.5840872526168823},{"id":"https://openalex.org/C163985040","wikidata":"https://www.wikidata.org/wiki/Q1172399","display_name":"Data acquisition","level":2,"score":0.5591812133789062},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.5072450041770935},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4995236396789551},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.4850553572177887},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.4613172709941864},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.45599788427352905},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.4441800117492676},{"id":"https://openalex.org/C2777628319","wikidata":"https://www.wikidata.org/wiki/Q6041841","display_name":"Instrument control","level":2,"score":0.41368648409843445},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3858170509338379},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.3833411931991577},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3741399645805359},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.2541266083717346},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19684761762619019},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.158574640750885},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.10393944382667542},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3386415.3387087","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3386415.3387087","pdf_url":null,"source":{"id":"https://openalex.org/S4306523750","display_name":"Proceedings of the 2nd International Conference on Information Technologies and Electrical Engineering","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2nd International Conference on Information Technologies and Electrical Engineering","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8999999761581421}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2314830850"],"related_works":["https://openalex.org/W4240752941","https://openalex.org/W4254267907","https://openalex.org/W2133600276","https://openalex.org/W2386418312","https://openalex.org/W2161743861","https://openalex.org/W2095039322","https://openalex.org/W1956119242","https://openalex.org/W4233547328","https://openalex.org/W4214860651","https://openalex.org/W1886232488"],"abstract_inverted_index":{"The":[0,55],"Intelligent":[1],"pressure":[2,14,28,49,58],"measuring":[3,16,59],"instrument":[4,60],"is":[5,24],"a":[6],"set":[7],"of":[8,30,42,57,66],"high":[9,12,47,51],"integration":[10],"and":[11,20,33,46,53],"precision":[13,21,48],"data":[15,44],"equipment":[17],"integrating":[18],"electronics":[19],"machinery.":[22],"It":[23,38],"developed":[25],"for":[26],"large-scale":[27],"measurement":[29],"wind":[31],"tunnel":[32],"aircraft":[34],"test":[35],"in":[36],"China.":[37],"has":[39],"the":[40,63,67],"ability":[41],"fast":[43],"acquisition":[45],"measurement,":[50],"reliability":[52],"stability.":[54],"development":[56],"can":[61],"realize":[62],"autonomous":[64],"control":[65],"product":[68],"further.":[69]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}