{"id":"https://openalex.org/W3012029404","doi":"https://doi.org/10.1145/3372780.3378170","title":"Advances in Carbon Nanotube Technologies","display_name":"Advances in Carbon Nanotube Technologies","publication_year":2020,"publication_date":"2020-03-20","ids":{"openalex":"https://openalex.org/W3012029404","doi":"https://doi.org/10.1145/3372780.3378170","mag":"3012029404"},"language":"en","primary_location":{"id":"doi:10.1145/3372780.3378170","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3372780.3378170","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2020 International Symposium on Physical Design","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003214642","display_name":"Gage Hills","orcid":"https://orcid.org/0000-0002-4912-814X"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gage Hills","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043172170","display_name":"C.L. Lau","orcid":"https://orcid.org/0000-0003-0416-9949"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Christian Lau","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011011809","display_name":"Tathagata Srimani","orcid":"https://orcid.org/0000-0002-1238-7324"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tathagata Srimani","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040458783","display_name":"Mindy D. Bishop","orcid":"https://orcid.org/0000-0001-7067-9264"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mindy D. Bishop","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050743409","display_name":"Pritpal S. Kanhaiya","orcid":"https://orcid.org/0000-0001-8744-8550"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pritpal Kanhaiya","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067128017","display_name":"Rebecca Ho","orcid":"https://orcid.org/0000-0002-9864-1257"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rebecca Ho","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102578577","display_name":"Aya Amer","orcid":"https://orcid.org/0000-0002-9084-7138"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Aya Amer","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061843047","display_name":"Max M. Shulaker","orcid":"https://orcid.org/0000-0003-2237-193X"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Max M. Shulaker","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I63966007"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"33","last_page":"38"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10074","display_name":"Carbon Nanotubes in Composites","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10074","display_name":"Carbon Nanotubes in Composites","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.7979848384857178},{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.7279735803604126},{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.6762625575065613},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6640818119049072},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6247805953025818},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6210638284683228},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5662412643432617},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5300595164299011},{"id":"https://openalex.org/keywords/carbon-nanotube-field-effect-transistor","display_name":"Carbon nanotube field-effect transistor","score":0.4639546275138855},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44917744398117065},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4337720572948456},{"id":"https://openalex.org/keywords/nanoelectronics","display_name":"Nanoelectronics","score":0.4223371148109436},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3300396203994751},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.32379382848739624},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.29591435194015503},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2916814088821411},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.27465128898620605},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.2694810628890991},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1657094955444336},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10329681634902954}],"concepts":[{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.7979848384857178},{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.7279735803604126},{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.6762625575065613},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6640818119049072},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6247805953025818},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6210638284683228},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5662412643432617},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5300595164299011},{"id":"https://openalex.org/C58916441","wikidata":"https://www.wikidata.org/wiki/Q1778563","display_name":"Carbon nanotube field-effect transistor","level":5,"score":0.4639546275138855},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44917744398117065},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4337720572948456},{"id":"https://openalex.org/C141400236","wikidata":"https://www.wikidata.org/wiki/Q1479544","display_name":"Nanoelectronics","level":2,"score":0.4223371148109436},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3300396203994751},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.32379382848739624},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.29591435194015503},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2916814088821411},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.27465128898620605},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2694810628890991},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1657094955444336},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10329681634902954},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3372780.3378170","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3372780.3378170","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2020 International Symposium on Physical Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8899999856948853}],"awards":[],"funders":[{"id":"https://openalex.org/F4320309065","display_name":"Analog Devices","ror":"https://ror.org/01545pm61"},{"id":"https://openalex.org/F4320332180","display_name":"Defense Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"},{"id":"https://openalex.org/F4320338294","display_name":"Air Force Research Laboratory","ror":"https://ror.org/02e2egq70"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1526219215","https://openalex.org/W1992764350","https://openalex.org/W2002878591","https://openalex.org/W2008911167","https://openalex.org/W2089427056","https://openalex.org/W2094834535","https://openalex.org/W2130789712","https://openalex.org/W2135650105","https://openalex.org/W2138085193","https://openalex.org/W2144289559","https://openalex.org/W2209394967","https://openalex.org/W2346205343","https://openalex.org/W2509740691","https://openalex.org/W2731422849","https://openalex.org/W2892652298","https://openalex.org/W2907909057","https://openalex.org/W2908023422","https://openalex.org/W2922205224","https://openalex.org/W2970187632","https://openalex.org/W2987036159","https://openalex.org/W4220666134"],"related_works":["https://openalex.org/W4386261925","https://openalex.org/W2048420745","https://openalex.org/W2082944690","https://openalex.org/W2263373136","https://openalex.org/W1914349328","https://openalex.org/W2160067645","https://openalex.org/W2023334077","https://openalex.org/W2005494397","https://openalex.org/W2104885411","https://openalex.org/W2339836056"],"abstract_inverted_index":{"Carbon":[0],"nanotube":[1],"(CNT)":[2],"field-effect":[3],"transistors":[4],"(CNFETs)":[5],"promise":[6],"to":[7,61,70],"improve":[8],"the":[9,87],"energy":[10],"efficiency":[11],"of":[12,107,134],"very-large-scale":[13],"integrated":[14],"(VLSI)":[15],"systems.":[16],"However,":[17],"multiple":[18],"challenges":[19],"have":[20,58],"prevented":[21],"VLSI":[22,67,77],"CNFET":[23,68,90,119],"circuits":[24,69,91],"from":[25],"being":[26],"realized,":[27],"including":[28,42,95],"inherent":[29],"nano-scale":[30],"material":[31],"defects,":[32],"robust":[33],"processing":[34,78],"for":[35],"yielding":[36],"complementary":[37],"CNFETs":[38,102],"(i.e.,":[39],"CNT":[40,50,111],"CMOS:":[41],"both":[43],"PMOS":[44],"and":[45,48,79,92,114,126],"NMOS":[46],"CNFETs),":[47],"major":[49],"variations.":[51],"Here,":[52],"we":[53,57,85],"summarize":[54],"techniques":[55],"that":[56],"recently":[59],"developed":[60],"overcome":[62],"these":[63,83],"outstanding":[64],"challenges,":[65],"enabling":[66],"be":[71],"experimentally":[72],"realized":[73],"today":[74],"using":[75],"standard":[76],"design":[80],"flows.":[81],"Leveraging":[82],"techniques,":[84],"demonstrate":[86],"most":[88],"complex":[89],"systems":[93],"to-date,":[94],"a":[96,108,127],"three-dimensional":[97],"(3D)":[98],"imaging":[99],"system":[100],"comprising":[101],"fabricated":[103],"directly":[104],"on":[105],"top":[106],"silicon":[109],"imager,":[110],"CMOS":[112],"analog":[113],"mixed-signal":[115],"circuits,":[116],"1":[117],"kilobit":[118],"static":[120],"random-access":[121],"memory":[122,124],"(SRAM)":[123],"arrays,":[125],"16-bit":[128],"RISC-V":[129],"microprocessor":[130],"built":[131],"entirely":[132],"out":[133],"CNFETs.":[135]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}