{"id":"https://openalex.org/W2945095509","doi":"https://doi.org/10.1145/3318299.3318334","title":"Discharge Fault Simulation System for High Voltage SF6 Gas Insulated Switch-gear and Its Intelligent Pattern Recognition","display_name":"Discharge Fault Simulation System for High Voltage SF6 Gas Insulated Switch-gear and Its Intelligent Pattern Recognition","publication_year":2019,"publication_date":"2019-02-22","ids":{"openalex":"https://openalex.org/W2945095509","doi":"https://doi.org/10.1145/3318299.3318334","mag":"2945095509"},"language":"en","primary_location":{"id":"doi:10.1145/3318299.3318334","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3318299.3318334","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2019 11th International Conference on Machine Learning and Computing","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Zhang Shiling","orcid":null},"institutions":[{"id":"https://openalex.org/I1335486098","display_name":"Electric Power Research Institute","ror":"https://ror.org/02dqztz06","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I1335486098"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Zhang Shiling","raw_affiliation_strings":["State Grid Chongqing Electric Power Company Chongqing Electric Power Research Institute, Chongqing"],"affiliations":[{"raw_affiliation_string":"State Grid Chongqing Electric Power Company Chongqing Electric Power Research Institute, Chongqing","institution_ids":["https://openalex.org/I1335486098"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1335486098"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.0331915,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"393","last_page":"399"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9883999824523926,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9883999824523926,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":0.9390000104904175,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9340999722480774,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sulfur-hexafluoride","display_name":"Sulfur hexafluoride","score":0.8318265676498413},{"id":"https://openalex.org/keywords/partial-discharge","display_name":"Partial discharge","score":0.8268735408782959},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5732335448265076},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.5164961814880371},{"id":"https://openalex.org/keywords/switchgear","display_name":"Switchgear","score":0.5060009360313416},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.49746420979499817},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4787920415401459},{"id":"https://openalex.org/keywords/high-voltage","display_name":"High voltage","score":0.44775718450546265},{"id":"https://openalex.org/keywords/fault-simulator","display_name":"Fault Simulator","score":0.42374444007873535},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3239932656288147},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.29804527759552},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2858484983444214},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.15835118293762207}],"concepts":[{"id":"https://openalex.org/C2778282533","wikidata":"https://www.wikidata.org/wiki/Q279055","display_name":"Sulfur hexafluoride","level":2,"score":0.8318265676498413},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.8268735408782959},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5732335448265076},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.5164961814880371},{"id":"https://openalex.org/C93893174","wikidata":"https://www.wikidata.org/wiki/Q1273786","display_name":"Switchgear","level":2,"score":0.5060009360313416},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.49746420979499817},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4787920415401459},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.44775718450546265},{"id":"https://openalex.org/C2776365744","wikidata":"https://www.wikidata.org/wiki/Q5438149","display_name":"Fault Simulator","level":5,"score":0.42374444007873535},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3239932656288147},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.29804527759552},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2858484983444214},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.15835118293762207},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3318299.3318334","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3318299.3318334","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2019 11th International Conference on Machine Learning and Computing","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1998574409","https://openalex.org/W2025593145","https://openalex.org/W2142277797","https://openalex.org/W2786199997","https://openalex.org/W2921736909","https://openalex.org/W4231147507","https://openalex.org/W4233213564"],"related_works":["https://openalex.org/W2808957303","https://openalex.org/W4396908798","https://openalex.org/W2907218275","https://openalex.org/W3010931597","https://openalex.org/W2110874379","https://openalex.org/W2893668454","https://openalex.org/W1938434038","https://openalex.org/W4200454289","https://openalex.org/W2533213929","https://openalex.org/W2513708364"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"the":[3,65,72,74,103,107,126,139,160,165,169,199,205],"defect":[4,30,37,57,170,203],"simulator":[5,38,58],"for":[6,217],"high":[7],"voltage":[8],"sulfur":[9,24],"hexafluoride":[10,25],"gas":[11,26,79,150],"insulated":[12],"composite":[13],"electrical":[14,122],"apparatus":[15],"is":[16,62,69,82,100,129,183],"developed.":[17],"The":[18,36,115,131],"device":[19],"consists":[20],"of":[21,77,106,119,147,168,201,209],"four":[22],"parts:":[23],"chamber,":[27],"solid":[28],"insulator,":[29],"simulator,":[31,73,171],"observation":[32],"and":[33,50,64,96,102,151,192,197,222],"measurement":[34],"device.":[35],"can":[39,136,189],"effectively":[40,137,193],"simulate":[41],"free":[42],"metal":[43],"particle":[44],"discharge,":[45,47],"tip":[46],"suspension":[48],"discharge":[49,67],"air":[51],"gap":[52],"discharge.":[53],"A":[54],"real-type":[55],"integrated":[56],"based":[59],"on":[60,71,85],"GIS":[61,218],"developed,":[63],"partial":[66],"signal":[68],"tested":[70],"change":[75],"trend":[76],"decomposed":[78],"with":[80],"time":[81,145],"detected.":[83],"Based":[84],"this,":[86],"an":[87,175],"artificial":[88,176],"intelligence":[89,177],"classification":[90,162,178],"method":[91,128,135],"combining":[92],"fuzzy":[93],"ISODATA":[94],"algorithm":[95,99,179],"ant":[97],"colony":[98],"proposed,":[101],"structure":[104],"parameters":[105],"two":[108],"algorithms":[109],"are":[110],"optimized":[111],"by":[112],"PSO":[113],"algorithm.":[114],"field":[116,206],"application":[117],"results":[118],"HV":[120],"combined":[121],"appliances":[123],"show":[124],"that":[125],"proposed":[127],"effective.":[130],"fault":[132,140,220],"type":[133,200],"diagnosis":[134,221],"judge":[138],"mode":[141],"intelligently":[142],"according":[143],"to":[144,185,195],"series":[146],"SF6":[148],"micro-decomposition":[149,153],"typical":[152],"gas.":[154],"This":[155],"paper":[156],"not":[157],"only":[158],"collects":[159],"original":[161],"data":[163],"from":[164],"hardware":[166],"platform":[167],"but":[172],"also":[173],"develops":[174],"software":[180],"system":[181],"which":[182],"easy":[184],"be":[186,190],"programmed.":[187],"It":[188,211],"directly":[191],"used":[194],"diagnose":[196],"evaluate":[198],"insulation":[202],"in":[204],"practical":[207],"engineering":[208],"GIS.":[210],"has":[212],"certain":[213],"theoretical":[214],"guidance":[215],"value":[216],"equipment":[219],"pattern":[223],"recognition.":[224]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-04-16T08:26:57.006410","created_date":"2025-10-10T00:00:00"}