{"id":"https://openalex.org/W2944421575","doi":"https://doi.org/10.1145/3310273.3321564","title":"A new memory reliability technique for multiple bit upsets mitigation","display_name":"A new memory reliability technique for multiple bit upsets mitigation","publication_year":2019,"publication_date":"2019-04-30","ids":{"openalex":"https://openalex.org/W2944421575","doi":"https://doi.org/10.1145/3310273.3321564","mag":"2944421575"},"language":"en","primary_location":{"id":"doi:10.1145/3310273.3321564","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3310273.3321564","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 16th ACM International Conference on Computing Frontiers","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064062188","display_name":"Alexandre Chabot","orcid":"https://orcid.org/0000-0002-5410-4556"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Alexandre Chabot","raw_affiliation_strings":["Software Reliability and Security Laboratory, Gif-sur-Yvette, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Software Reliability and Security Laboratory, Gif-sur-Yvette, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002123043","display_name":"Ihsen Alouani","orcid":"https://orcid.org/0000-0001-5102-8087"},"institutions":[{"id":"https://openalex.org/I70348806","display_name":"Universit\u00e9 Polytechnique Hauts-de-France","ror":"https://ror.org/02ezch769","country_code":"FR","type":"education","lineage":["https://openalex.org/I70348806"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Ihsen Alouani","raw_affiliation_strings":["Polytechnic University Hauts-De-France, Valenciennes, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Polytechnic University Hauts-De-France, Valenciennes, France","institution_ids":["https://openalex.org/I70348806"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080926469","display_name":"Sma\u00efl Niar","orcid":"https://orcid.org/0000-0002-7550-484X"},"institutions":[{"id":"https://openalex.org/I70348806","display_name":"Universit\u00e9 Polytechnique Hauts-de-France","ror":"https://ror.org/02ezch769","country_code":"FR","type":"education","lineage":["https://openalex.org/I70348806"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Smail Niar","raw_affiliation_strings":["Polytechnic University Hauts-De-France, Valenciennes, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Polytechnic University Hauts-De-France, Valenciennes, France","institution_ids":["https://openalex.org/I70348806"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050621942","display_name":"R\u00e9da Nouacer","orcid":"https://orcid.org/0000-0002-6219-706X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Reda Nouacer","raw_affiliation_strings":["Software Reliability and Security Laboratory, Gif-sur-Yvette, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Software Reliability and Security Laboratory, Gif-sur-Yvette, France","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1167,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.42875033,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"145","last_page":"152"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.791931688785553},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7449186444282532},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7116655707359314},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6827757358551025},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6321885585784912},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5408336520195007},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.44392573833465576},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16811144351959229},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.16625577211380005}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.791931688785553},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7449186444282532},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7116655707359314},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6827757358551025},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6321885585784912},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5408336520195007},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.44392573833465576},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16811144351959229},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.16625577211380005},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1145/3310273.3321564","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3310273.3321564","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 16th ACM International Conference on Computing Frontiers","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-03522687v1","is_oa":false,"landing_page_url":"https://uphf.hal.science/hal-03522687","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"https://dl.acm.org/doi/10.1145/3310273.3321564","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:pure.qub.ac.uk/portal:publications/6befd72f-52d4-4cc4-bf73-260dc25337e1","is_oa":false,"landing_page_url":"https://pure.qub.ac.uk/en/publications/6befd72f-52d4-4cc4-bf73-260dc25337e1","pdf_url":null,"source":{"id":"https://openalex.org/S4306402319","display_name":"Research Portal (Queen's University Belfast)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I126231945","host_organization_name":"Queen's University Belfast","host_organization_lineage":["https://openalex.org/I126231945"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Alouani, I 2019, A new memory reliability technique for multiple bit upsets mitigation. in CF '19: Proceedings of the 16th ACM International Conference on Computing Frontier. Association for Computing Machinery, pp. 145-152, ACM International Conference on Computing Frontiers, Alghero, Italy, 30/04/2019. https://doi.org/10.1145/3310273.3321564","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1686420892","https://openalex.org/W1980363975","https://openalex.org/W2104886115","https://openalex.org/W2153014736","https://openalex.org/W2167638298","https://openalex.org/W2167839483","https://openalex.org/W2337485678","https://openalex.org/W4230595296","https://openalex.org/W4244925767"],"related_works":["https://openalex.org/W2067279514","https://openalex.org/W2089002058","https://openalex.org/W1909296377","https://openalex.org/W3185029353","https://openalex.org/W2969498307","https://openalex.org/W3116379964","https://openalex.org/W2915176329","https://openalex.org/W2793465010","https://openalex.org/W2967161359","https://openalex.org/W2208608937"],"abstract_inverted_index":{"Technological":[0],"advances":[1,13],"make":[2],"it":[3,32],"possible":[4],"to":[5,20,35,38,43,82,100],"produce":[6],"increasingly":[7],"complex":[8],"electronic":[9],"components.":[10],"Nevertheless,":[11],"these":[12,40],"are":[14,64],"convoyed":[15],"by":[16],"an":[17,24],"increasing":[18,108],"sensitivity":[19],"operating":[21],"conditions":[22],"and":[23,42,80,87,113,131],"accelerated":[25],"aging":[26],"process.":[27],"In":[28,50],"safety":[29],"critical":[30],"applications,":[31],"is":[33],"vital":[34],"provide":[36],"solutions":[37],"avoid":[39,81],"limitations":[41],"guarantee":[44],"a":[45,84,97,126],"high":[46,127],"level":[47,128],"of":[48,52,69,104,129],"reliability.":[49],"most":[51],"the":[53,57,91,102],"existing":[54],"methods":[55],"in":[56,110,137],"literature":[58],"only":[59],"Single":[60,123],"Event":[61],"Upsets":[62,78],"(SEU)":[63],"assumed.":[65],"The":[66],"next":[67],"generations":[68],"embedded":[70],"systems":[71],"must":[72],"on":[73,90],"one":[74],"side":[75],"support":[76],"Multiple-Bit":[77],"(MBU)":[79],"induce":[83],"significant":[85],"memory":[86,111],"processing":[88,114],"overheads":[89],"other":[92],"side.":[93],"This":[94],"paper":[95],"proposes":[96],"new":[98],"method":[99],"increase":[101],"reliability":[103,130],"SRAM,":[105],"without":[106],"dramatically":[107],"costs":[109],"space":[112],"time.":[115],"Our":[116],"method,":[117],"named":[118],"DPSR":[119],"for":[120],"Double":[121],"Parity":[122],"Redundancy,":[124],"offers":[125],"takes":[132],"into":[133],"fault":[134],"patterns":[135],"occurring":[136],"real":[138],"conditions.":[139]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}