{"id":"https://openalex.org/W2945774230","doi":"https://doi.org/10.1145/3299874.3318028","title":"A Statistical Current and Delay Model Based on Log-Skew-Normal Distribution for Low Voltage Region","display_name":"A Statistical Current and Delay Model Based on Log-Skew-Normal Distribution for Low Voltage Region","publication_year":2019,"publication_date":"2019-05-13","ids":{"openalex":"https://openalex.org/W2945774230","doi":"https://doi.org/10.1145/3299874.3318028","mag":"2945774230"},"language":"en","primary_location":{"id":"doi:10.1145/3299874.3318028","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3299874.3318028","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2019 Great Lakes Symposium on VLSI","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046599843","display_name":"Peng Cao","orcid":"https://orcid.org/0000-0003-2039-9031"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Peng Cao","raw_affiliation_strings":["Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034476875","display_name":"Jiangping Wu","orcid":"https://orcid.org/0000-0001-9126-5490"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiangping Wu","raw_affiliation_strings":["Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100320722","display_name":"Zhiyuan Liu","orcid":"https://orcid.org/0000-0002-6331-0810"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiyuan Liu","raw_affiliation_strings":["Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089487764","display_name":"Jingjing Guo","orcid":"https://orcid.org/0000-0002-1031-9416"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingjing Guo","raw_affiliation_strings":["Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030384645","display_name":"Jun Yang","orcid":"https://orcid.org/0000-0002-8379-0321"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Yang","raw_affiliation_strings":["Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101499715","display_name":"Longxing Shi","orcid":"https://orcid.org/0000-0002-0629-7154"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Longxing Shi","raw_affiliation_strings":["Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5046599843"],"corresponding_institution_ids":["https://openalex.org/I76569877"],"apc_list":null,"apc_paid":null,"fwci":0.1192,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.44096673,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"323","last_page":"326"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/skew-normal-distribution","display_name":"Skew normal distribution","score":0.7333990931510925},{"id":"https://openalex.org/keywords/skew","display_name":"Skew","score":0.7083240747451782},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5935600399971008},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5483116507530212},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5441119074821472},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.525152862071991},{"id":"https://openalex.org/keywords/gaussian","display_name":"Gaussian","score":0.5095251202583313},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.48240792751312256},{"id":"https://openalex.org/keywords/normal-distribution","display_name":"Normal distribution","score":0.46970149874687195},{"id":"https://openalex.org/keywords/probability-density-function","display_name":"Probability density function","score":0.46440720558166504},{"id":"https://openalex.org/keywords/percentile","display_name":"Percentile","score":0.4483430087566376},{"id":"https://openalex.org/keywords/process-corners","display_name":"Process corners","score":0.4362420439720154},{"id":"https://openalex.org/keywords/inverse-gaussian-distribution","display_name":"Inverse Gaussian distribution","score":0.4341168701648712},{"id":"https://openalex.org/keywords/statistical-model","display_name":"Statistical model","score":0.42880162596702576},{"id":"https://openalex.org/keywords/moment","display_name":"Moment (physics)","score":0.4219658374786377},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41423434019088745},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3763258457183838},{"id":"https://openalex.org/keywords/distribution","display_name":"Distribution (mathematics)","score":0.36222025752067566},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.35819411277770996},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3171023726463318},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.29330721497535706},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18414101004600525},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17452001571655273},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1146751344203949},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.08722129464149475},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07606509327888489}],"concepts":[{"id":"https://openalex.org/C43694697","wikidata":"https://www.wikidata.org/wiki/Q3258551","display_name":"Skew normal distribution","level":3,"score":0.7333990931510925},{"id":"https://openalex.org/C43711488","wikidata":"https://www.wikidata.org/wiki/Q7534783","display_name":"Skew","level":2,"score":0.7083240747451782},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5935600399971008},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5483116507530212},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5441119074821472},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.525152862071991},{"id":"https://openalex.org/C163716315","wikidata":"https://www.wikidata.org/wiki/Q901177","display_name":"Gaussian","level":2,"score":0.5095251202583313},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.48240792751312256},{"id":"https://openalex.org/C102094743","wikidata":"https://www.wikidata.org/wiki/Q133871","display_name":"Normal distribution","level":2,"score":0.46970149874687195},{"id":"https://openalex.org/C197055811","wikidata":"https://www.wikidata.org/wiki/Q207522","display_name":"Probability density function","level":2,"score":0.46440720558166504},{"id":"https://openalex.org/C122048520","wikidata":"https://www.wikidata.org/wiki/Q2913954","display_name":"Percentile","level":2,"score":0.4483430087566376},{"id":"https://openalex.org/C192615534","wikidata":"https://www.wikidata.org/wiki/Q7247268","display_name":"Process corners","level":3,"score":0.4362420439720154},{"id":"https://openalex.org/C132878287","wikidata":"https://www.wikidata.org/wiki/Q1671727","display_name":"Inverse Gaussian distribution","level":3,"score":0.4341168701648712},{"id":"https://openalex.org/C114289077","wikidata":"https://www.wikidata.org/wiki/Q3284399","display_name":"Statistical model","level":2,"score":0.42880162596702576},{"id":"https://openalex.org/C179254644","wikidata":"https://www.wikidata.org/wiki/Q13222844","display_name":"Moment (physics)","level":2,"score":0.4219658374786377},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41423434019088745},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3763258457183838},{"id":"https://openalex.org/C110121322","wikidata":"https://www.wikidata.org/wiki/Q865811","display_name":"Distribution (mathematics)","level":2,"score":0.36222025752067566},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.35819411277770996},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3171023726463318},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.29330721497535706},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18414101004600525},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17452001571655273},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1146751344203949},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.08722129464149475},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07606509327888489},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3299874.3318028","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3299874.3318028","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2019 Great Lakes Symposium on VLSI","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7400000095367432,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1997782294","https://openalex.org/W1999520218","https://openalex.org/W2030257954","https://openalex.org/W2044350388","https://openalex.org/W2066324432","https://openalex.org/W2070623495","https://openalex.org/W2111372718","https://openalex.org/W2141236461","https://openalex.org/W2160859600","https://openalex.org/W2168159483","https://openalex.org/W2176629069","https://openalex.org/W2342528869","https://openalex.org/W2559429877","https://openalex.org/W6741216493"],"related_works":["https://openalex.org/W2525077515","https://openalex.org/W4293214704","https://openalex.org/W2183005240","https://openalex.org/W4293213689","https://openalex.org/W2912733426","https://openalex.org/W2118152793","https://openalex.org/W2141625582","https://openalex.org/W2996035120","https://openalex.org/W2460338119","https://openalex.org/W3048707456"],"abstract_inverted_index":{"The":[0],"increasing":[1],"performance":[2],"variation":[3,31],"and":[4,42,82,118],"non-Gaussian":[5],"distribution":[6,59,70],"pose":[7],"remarkable":[8],"challenges":[9],"to":[10,99,138],"timing":[11],"analysis":[12],"for":[13,39,79,142],"circuits":[14],"operating":[15],"in":[16,45,51,94,111],"low":[17,46,143],"voltage":[18,47],"region.":[19],"Accurate":[20],"modeling":[21],"of":[22,115],"the":[23,36,56,68,76,100,112,119,133],"statistical":[24,37,103],"characteristics":[25],"is":[26,109],"urgently":[27],"required":[28],"with":[29,88,136],"process":[30],"consideration.":[32],"In":[33],"this":[34],"paper,":[35],"models":[38,78],"drain":[40,80],"current":[41,81],"gate":[43,83,116],"delay":[44,84,117,121],"region":[48],"are":[49,85],"established":[50],"analytical":[52],"form":[53],"based":[54],"on":[55],"log-skew-normal":[57],"(LSN)":[58],"via":[60],"moment":[61],"matching":[62],"technique.":[63],"Experimental":[64],"results":[65,93],"show":[66],"that":[67],"probability":[69],"function":[71],"(PDF)":[72],"curves":[73],"obtained":[74],"from":[75],"proposed":[77,101],"highly":[86],"fitted":[87],"Monte":[89],"Carlo":[90],"(MC)":[91],"simulation":[92],"sub/near-threshold":[95],"regions.":[96],"Moreover,":[97],"owing":[98],"LSN-based":[102],"model,":[104],"less":[105],"than":[106,132],"8%":[107],"error":[108],"introduced":[110],"predicted":[113],"sensitivity":[114],"maximum/minimum":[120],"indicated":[122],"by":[123],"\u00b13\u03c3":[124],"percentile":[125],"points":[126],"can":[127],"be":[128],"calculated":[129],"more":[130],"precisely":[131],"LN-based":[134],"method":[135],"up":[137],"3\u00d7":[139],"accuracy":[140],"improvement":[141],"supply":[144],"voltage.":[145]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}