{"id":"https://openalex.org/W2913084376","doi":"https://doi.org/10.1145/3297097.3297102","title":"Application of Machine Learning for Functional Circuit Level Fault Diagnosis in Avionics System","display_name":"Application of Machine Learning for Functional Circuit Level Fault Diagnosis in Avionics System","publication_year":2018,"publication_date":"2018-11-17","ids":{"openalex":"https://openalex.org/W2913084376","doi":"https://doi.org/10.1145/3297097.3297102","mag":"2913084376"},"language":"en","primary_location":{"id":"doi:10.1145/3297097.3297102","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3297097.3297102","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2018 4th International Conference on Robotics and Artificial Intelligence","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100940287","display_name":"Linlin Shi","orcid":null},"institutions":[{"id":"https://openalex.org/I890469752","display_name":"Ministry of Industry and Information Technology","ror":"https://ror.org/0385nmy68","country_code":"CN","type":"government","lineage":["https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Linlin Shi","raw_affiliation_strings":["The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, Guangzhou, China","institution_ids":["https://openalex.org/I890469752"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057039676","display_name":"Zhenwei Zhou","orcid":"https://orcid.org/0000-0003-4473-7541"},"institutions":[{"id":"https://openalex.org/I890469752","display_name":"Ministry of Industry and Information Technology","ror":"https://ror.org/0385nmy68","country_code":"CN","type":"government","lineage":["https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhenwei Zhou","raw_affiliation_strings":["The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, Guangzhou, China","institution_ids":["https://openalex.org/I890469752"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100654486","display_name":"Yun Huang","orcid":"https://orcid.org/0000-0003-1549-1669"},"institutions":[{"id":"https://openalex.org/I890469752","display_name":"Ministry of Industry and Information Technology","ror":"https://ror.org/0385nmy68","country_code":"CN","type":"government","lineage":["https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yun Huang","raw_affiliation_strings":["The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, Guangzhou, China","institution_ids":["https://openalex.org/I890469752"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100940287"],"corresponding_institution_ids":["https://openalex.org/I890469752"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.20757733,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"57","last_page":"61"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9861999750137329,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9846000075340271,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/avionics","display_name":"Avionics","score":0.8877281546592712},{"id":"https://openalex.org/keywords/complex-programmable-logic-device","display_name":"Complex programmable logic device","score":0.762911319732666},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7424733638763428},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.6030338406562805},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5956383943557739},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5832861065864563},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.571845531463623},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.47366246581077576},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.44931381940841675},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.4212648868560791},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.39793887734413147},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.35090652108192444},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3177162706851959},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.30453044176101685},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2729789614677429},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.15484890341758728},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.09251588582992554},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07635870575904846},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.07445651292800903},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.06572279334068298}],"concepts":[{"id":"https://openalex.org/C15792166","wikidata":"https://www.wikidata.org/wiki/Q221329","display_name":"Avionics","level":2,"score":0.8877281546592712},{"id":"https://openalex.org/C128315158","wikidata":"https://www.wikidata.org/wiki/Q1063858","display_name":"Complex programmable logic device","level":2,"score":0.762911319732666},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7424733638763428},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.6030338406562805},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5956383943557739},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5832861065864563},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.571845531463623},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.47366246581077576},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.44931381940841675},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.4212648868560791},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.39793887734413147},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.35090652108192444},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3177162706851959},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.30453044176101685},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2729789614677429},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.15484890341758728},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.09251588582992554},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07635870575904846},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.07445651292800903},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.06572279334068298},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3297097.3297102","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3297097.3297102","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2018 4th International Conference on Robotics and Artificial Intelligence","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W587686178","https://openalex.org/W1489551367","https://openalex.org/W1993694278","https://openalex.org/W2001859427","https://openalex.org/W2059830677","https://openalex.org/W2151040995","https://openalex.org/W2330041469","https://openalex.org/W2554664056"],"related_works":["https://openalex.org/W2130922779","https://openalex.org/W2121043529","https://openalex.org/W2024194466","https://openalex.org/W3148663848","https://openalex.org/W2051500795","https://openalex.org/W4256030018","https://openalex.org/W2185394135","https://openalex.org/W2082366402","https://openalex.org/W2742111403","https://openalex.org/W2995708790"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"the":[3,11,19,31,47,66],"fault":[4,12,32,48,70,75],"injection":[5],"method":[6],"is":[7,37,55],"used":[8],"to":[9],"simulate":[10],"mode":[13],"of":[14,21,27,50],"avionics":[15,51],"system.":[16],"By":[17],"collecting":[18],"information":[20],"three":[22],"faults":[23],"and":[24,42],"normal":[25],"state":[26],"CPLD":[28],"synergic":[29],"circuit,":[30],"sensitive":[33],"parameter":[34],"sample":[35],"set":[36],"obtained":[38],"by":[39],"feature":[40],"extraction":[41],"correlation":[43],"analysis":[44],"method.":[45],"Finally,":[46],"diagnosis":[49],"system":[52],"module":[53],"level":[54],"realized":[56],"based":[57],"on":[58],"support":[59],"vector":[60],"machine":[61],"(SVM).":[62],"Experiments":[63],"show":[64],"that":[65],"algorithm":[67],"achieves":[68],"98.33%":[69],"identification":[71],"rate":[72],"for":[73],"SRU":[74],"diagnosis.":[76]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}