{"id":"https://openalex.org/W2910602641","doi":"https://doi.org/10.1145/3287624.3288743","title":"Fault tolerance in neuromorphic computing systems","display_name":"Fault tolerance in neuromorphic computing systems","publication_year":2019,"publication_date":"2019-01-18","ids":{"openalex":"https://openalex.org/W2910602641","doi":"https://doi.org/10.1145/3287624.3288743","mag":"2910602641"},"language":"en","primary_location":{"id":"doi:10.1145/3287624.3288743","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3287624.3288743","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 24th Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038187283","display_name":"Mengyun Liu","orcid":"https://orcid.org/0000-0002-6476-3061"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Mengyun Liu","raw_affiliation_strings":["Duke University"],"affiliations":[{"raw_affiliation_string":"Duke University","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008190519","display_name":"Lixue Xia","orcid":"https://orcid.org/0000-0002-7731-7028"},"institutions":[{"id":"https://openalex.org/I4210095624","display_name":"Alibaba Group (United States)","ror":"https://ror.org/00rn0m335","country_code":"US","type":"company","lineage":["https://openalex.org/I4210095624","https://openalex.org/I45928872"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lixue Xia","raw_affiliation_strings":["Alibaba Group"],"affiliations":[{"raw_affiliation_string":"Alibaba Group","institution_ids":["https://openalex.org/I4210095624"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090481567","display_name":"Yu Wang","orcid":"https://orcid.org/0000-0003-4375-303X"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Wang","raw_affiliation_strings":["Tsinghua University"],"affiliations":[{"raw_affiliation_string":"Tsinghua University","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033880864","display_name":"Krishnendu Chakrabarty","orcid":"https://orcid.org/0000-0003-4475-6435"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishnendu Chakrabarty","raw_affiliation_strings":["Duke University"],"affiliations":[{"raw_affiliation_string":"Duke University","institution_ids":["https://openalex.org/I170897317"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5038187283"],"corresponding_institution_ids":["https://openalex.org/I170897317"],"apc_list":null,"apc_paid":null,"fwci":2.655,"has_fulltext":false,"cited_by_count":35,"citation_normalized_percentile":{"value":0.90131458,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"216","last_page":"223"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/neuromorphic-engineering","display_name":"Neuromorphic engineering","score":0.9458460211753845},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.8735959529876709},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.7578381299972534},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7294294238090515},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5724522471427917},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5115719437599182},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4697330892086029},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.44792744517326355},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.44583889842033386},{"id":"https://openalex.org/keywords/efficient-energy-use","display_name":"Efficient energy use","score":0.42312535643577576},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.41422784328460693},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.39925089478492737},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.36611685156822205},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.3115876317024231},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.21697309613227844},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.18076342344284058},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.1611350178718567},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15694144368171692},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12913039326667786},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12737464904785156},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.07278650999069214}],"concepts":[{"id":"https://openalex.org/C151927369","wikidata":"https://www.wikidata.org/wiki/Q1981312","display_name":"Neuromorphic engineering","level":3,"score":0.9458460211753845},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.8735959529876709},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.7578381299972534},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7294294238090515},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5724522471427917},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5115719437599182},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4697330892086029},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.44792744517326355},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.44583889842033386},{"id":"https://openalex.org/C2742236","wikidata":"https://www.wikidata.org/wiki/Q924713","display_name":"Efficient energy use","level":2,"score":0.42312535643577576},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.41422784328460693},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.39925089478492737},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.36611685156822205},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.3115876317024231},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.21697309613227844},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.18076342344284058},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.1611350178718567},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15694144368171692},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12913039326667786},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12737464904785156},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.07278650999069214},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3287624.3288743","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3287624.3288743","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 24th Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8899999856948853,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W205636095","https://openalex.org/W1542981317","https://openalex.org/W1967628726","https://openalex.org/W1971319818","https://openalex.org/W2008781847","https://openalex.org/W2014402164","https://openalex.org/W2016922062","https://openalex.org/W2021383442","https://openalex.org/W2022208730","https://openalex.org/W2044814508","https://openalex.org/W2096286660","https://openalex.org/W2101091847","https://openalex.org/W2112181056","https://openalex.org/W2112594540","https://openalex.org/W2125223858","https://openalex.org/W2162651880","https://openalex.org/W2163054919","https://openalex.org/W2200085687","https://openalex.org/W2317230785","https://openalex.org/W2346143906","https://openalex.org/W2400475751","https://openalex.org/W2408724663","https://openalex.org/W2563104793","https://openalex.org/W2587907650","https://openalex.org/W2612375349","https://openalex.org/W2613989746","https://openalex.org/W2625840880","https://openalex.org/W2626719825","https://openalex.org/W2627034335","https://openalex.org/W2736591611","https://openalex.org/W2768104155","https://openalex.org/W2798982017","https://openalex.org/W2809617027","https://openalex.org/W2911496292","https://openalex.org/W2912252885","https://openalex.org/W2948232604","https://openalex.org/W2964299589","https://openalex.org/W3165267979","https://openalex.org/W4254672563","https://openalex.org/W4298558181"],"related_works":["https://openalex.org/W2793181810","https://openalex.org/W1967489488","https://openalex.org/W2806638311","https://openalex.org/W2891417865","https://openalex.org/W2893723691","https://openalex.org/W2517651798","https://openalex.org/W2785635065","https://openalex.org/W2020622255","https://openalex.org/W4386475142","https://openalex.org/W2065076119"],"abstract_inverted_index":{"Resistive":[0],"Random":[1],"Access":[2],"Memory":[3],"(RRAM)":[4],"and":[5,67,81,122],"RRAM-based":[6,58,65],"computing":[7,60],"systems":[8],"(RCS)":[9],"provide":[10],"energy-efficient":[11],"technology":[12],"options":[13],"for":[14,57],"neuromorphic":[15,59],"computing.":[16],"However,":[17],"the":[18,30],"applicability":[19],"of":[20,39,54,105,120],"RCS":[21,40],"is":[22,46],"limited":[23],"by":[24],"reliability":[25],"problems":[26],"that":[27,98],"arise":[28],"from":[29],"immature":[31],"fabrication":[32],"process.":[33],"In":[34],"order":[35],"to":[36,101],"take":[37],"advantage":[38],"in":[41,70,111,117,128],"practical":[42],"applications,":[43],"fault-tolerant":[44,55,96,118],"design":[45],"a":[47,52],"key":[48],"challenge.":[49],"We":[50,62],"present":[51,94],"survey":[53,113],"designs":[56,119],"systems.":[61],"first":[63],"describe":[64],"crossbars":[66],"training":[68],"architectures":[69],"RCS.":[71],"Following":[72],"this,":[73],"we":[74,93],"classify":[75],"fault":[76],"models":[77],"into":[78],"different":[79,103],"categories,":[80],"review":[82],"post-fabrication":[83],"testing":[84,88],"methods.":[85],"Subsequently,":[86],"online":[87],"methods":[89,109],"are":[90,123],"presented.":[91],"Finally,":[92],"various":[95],"techniques":[97],"were":[99],"designed":[100],"tolerate":[102],"types":[104],"RRAM":[106],"faults.":[107],"The":[108],"reviewed":[110],"this":[112,129],"represent":[114],"recent":[115],"trends":[116],"RCS,":[121],"expected":[124],"motivate":[125],"further":[126],"research":[127],"field.":[130]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":5}],"updated_date":"2026-03-31T07:56:22.981413","created_date":"2025-10-10T00:00:00"}