{"id":"https://openalex.org/W2911206580","doi":"https://doi.org/10.1145/3287624.3287688","title":"Tackling signal electromigration with learning-based detection and multistage mitigation","display_name":"Tackling signal electromigration with learning-based detection and multistage mitigation","publication_year":2019,"publication_date":"2019-01-18","ids":{"openalex":"https://openalex.org/W2911206580","doi":"https://doi.org/10.1145/3287624.3287688","mag":"2911206580"},"language":"en","primary_location":{"id":"doi:10.1145/3287624.3287688","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3287624.3287688","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 24th Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5106716491","display_name":"Wei Ye","orcid":"https://orcid.org/0000-0002-5275-7721"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Wei Ye","raw_affiliation_strings":["UT Austin"],"affiliations":[{"raw_affiliation_string":"UT Austin","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038501242","display_name":"Mohamed Baker Alawieh","orcid":"https://orcid.org/0000-0002-3546-0336"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohamed Baker Alawieh","raw_affiliation_strings":["UT Austin"],"affiliations":[{"raw_affiliation_string":"UT Austin","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000933188","display_name":"Yibo Lin","orcid":"https://orcid.org/0000-0002-0977-2774"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yibo Lin","raw_affiliation_strings":["UT Austin"],"affiliations":[{"raw_affiliation_string":"UT Austin","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011883763","display_name":"David Z. Pan","orcid":"https://orcid.org/0000-0002-5705-2501"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Z. Pan","raw_affiliation_strings":["UT Austin"],"affiliations":[{"raw_affiliation_string":"UT Austin","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5106716491"],"corresponding_institution_ids":["https://openalex.org/I86519309"],"apc_list":null,"apc_paid":null,"fwci":0.2927,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.45449535,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"167","last_page":"172"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.9902999997138977,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9847000241279602,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromigration","display_name":"Electromigration","score":0.8093514442443848},{"id":"https://openalex.org/keywords/speedup","display_name":"Speedup","score":0.7473340034484863},{"id":"https://openalex.org/keywords/routing","display_name":"Routing (electronic design automation)","score":0.6952816843986511},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6780298948287964},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6469332575798035},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.552409291267395},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5461822152137756},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45545074343681335},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.4521988034248352},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.4485534131526947},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.44415977597236633},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.4122648537158966},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.37402164936065674},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.24831035733222961},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19293105602264404},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18882787227630615},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.17203405499458313},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.16357949376106262},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.162104070186615},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.08724293112754822},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.0824505090713501}],"concepts":[{"id":"https://openalex.org/C138055206","wikidata":"https://www.wikidata.org/wiki/Q1319010","display_name":"Electromigration","level":2,"score":0.8093514442443848},{"id":"https://openalex.org/C68339613","wikidata":"https://www.wikidata.org/wiki/Q1549489","display_name":"Speedup","level":2,"score":0.7473340034484863},{"id":"https://openalex.org/C74172769","wikidata":"https://www.wikidata.org/wiki/Q1446839","display_name":"Routing (electronic design automation)","level":2,"score":0.6952816843986511},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6780298948287964},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6469332575798035},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.552409291267395},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5461822152137756},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45545074343681335},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.4521988034248352},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.4485534131526947},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.44415977597236633},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.4122648537158966},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.37402164936065674},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.24831035733222961},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19293105602264404},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18882787227630615},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.17203405499458313},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.16357949376106262},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.162104070186615},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.08724293112754822},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0824505090713501},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3287624.3287688","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3287624.3287688","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 24th Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1517922202","https://openalex.org/W1601795611","https://openalex.org/W1605203071","https://openalex.org/W1979787852","https://openalex.org/W2007038177","https://openalex.org/W2007719944","https://openalex.org/W2008074787","https://openalex.org/W2008400134","https://openalex.org/W2021894415","https://openalex.org/W2033258441","https://openalex.org/W2033675353","https://openalex.org/W2039556638","https://openalex.org/W2046020806","https://openalex.org/W2054507614","https://openalex.org/W2064704576","https://openalex.org/W2071520186","https://openalex.org/W2114136290","https://openalex.org/W2296319761","https://openalex.org/W2744044393","https://openalex.org/W4250589301","https://openalex.org/W6652518615"],"related_works":["https://openalex.org/W2004615523","https://openalex.org/W2055638565","https://openalex.org/W2138118262","https://openalex.org/W2542708587","https://openalex.org/W4229007131","https://openalex.org/W2364197307","https://openalex.org/W4381800218","https://openalex.org/W2034853009","https://openalex.org/W2381557379","https://openalex.org/W2006371366"],"abstract_inverted_index":{"With":[0,25],"the":[1,15,20,42,55,80,111,139],"continuous":[2],"scaling":[3,28],"of":[4,14,22,110,149],"integrated":[5],"circuit":[6],"(IC)":[7],"technologies,":[8],"electromigration":[9],"(EM)":[10],"prevails":[11],"as":[12],"one":[13],"major":[16],"reliability":[17],"challenges":[18],"facing":[19],"design":[21,113],"robust":[23],"circuits.":[24],"such":[26],"aggressive":[27],"in":[29,84,147],"advanced":[30,85],"technology":[31,86],"nodes,":[32],"signal":[33,43,47,95],"nets":[34],"experience":[35],"high":[36],"switching":[37],"frequency,":[38],"which":[39],"further":[40],"exacerbates":[41],"EM":[44,48,52,82,96,102,150],"effect.":[45],"Traditionally,":[46],"fixing":[49,105],"approaches":[50,74],"analyze":[51],"violations":[53,83],"after":[54],"routing":[56,65],"stage":[57],"and":[58,104,115,152],"repair":[59],"is":[60],"attempted":[61],"via":[62],"iterative":[63],"incremental":[64],"or":[66],"cell":[67],"resizing":[68],"techniques.":[69],"However,":[70],"these":[71],"\"EM-analysis-then":[72],"fix\"":[73],"are":[75],"ill-equipped":[76],"when":[77,136],"faced":[78],"with":[79],"ever-growing":[81],"nodes.":[87],"In":[88],"this":[89],"work,":[90],"we":[91],"propose":[92],"a":[93,123],"novel":[94],"handling":[97],"framework":[98,131],"that":[99,129],"(i)":[100],"incorporates":[101],"detection":[103,121],"techniques":[106],"into":[107],"earlier":[108],"stages":[109],"physical":[112],"process,":[114],"(ii)":[116],"integrates":[117],"machine":[118],"learning":[119],"based":[120],"alongside":[122],"multistage":[124],"mitigation.":[125],"Experimental":[126],"results":[127],"demonstrate":[128],"our":[130],"can":[132],"achieve":[133],"15x":[134],"speedup":[135],"compared":[137],"to":[138],"state-of-the-art":[140],"EDA":[141],"tool":[142],"while":[143],"achieving":[144],"similar":[145],"performance":[146],"terms":[148],"mitigation":[151],"overhead.":[153]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}