{"id":"https://openalex.org/W2908637594","doi":"https://doi.org/10.1145/3287624.3287679","title":"Diffusion break-aware leakage power optimization and detailed placement in sub-10nm VLSI","display_name":"Diffusion break-aware leakage power optimization and detailed placement in sub-10nm VLSI","publication_year":2019,"publication_date":"2019-01-18","ids":{"openalex":"https://openalex.org/W2908637594","doi":"https://doi.org/10.1145/3287624.3287679","mag":"2908637594"},"language":"en","primary_location":{"id":"doi:10.1145/3287624.3287679","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3287624.3287679","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 24th Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074654905","display_name":"Sun ik Heo","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Sun ik Heo","raw_affiliation_strings":["Samsung Electronics Co., Ltd., Hwaseong-si, Gyeonggi-do, South Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics Co., Ltd., Hwaseong-si, Gyeonggi-do, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073558386","display_name":"Andrew B. Kahng","orcid":"https://orcid.org/0000-0002-4490-5018"},"institutions":[{"id":"https://openalex.org/I2800935791","display_name":"UC San Diego Health System","ror":"https://ror.org/01kbfgm16","country_code":"US","type":"healthcare","lineage":["https://openalex.org/I2800935791"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andrew B. Kahng","raw_affiliation_strings":["UC San Diego"],"affiliations":[{"raw_affiliation_string":"UC San Diego","institution_ids":["https://openalex.org/I2800935791"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100362669","display_name":"Minsoo Kim","orcid":"https://orcid.org/0000-0002-6488-4349"},"institutions":[{"id":"https://openalex.org/I2800935791","display_name":"UC San Diego Health System","ror":"https://ror.org/01kbfgm16","country_code":"US","type":"healthcare","lineage":["https://openalex.org/I2800935791"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Minsoo Kim","raw_affiliation_strings":["UC San Diego"],"affiliations":[{"raw_affiliation_string":"UC San Diego","institution_ids":["https://openalex.org/I2800935791"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051578140","display_name":"Lutong Wang","orcid":"https://orcid.org/0000-0003-3702-5095"},"institutions":[{"id":"https://openalex.org/I2800935791","display_name":"UC San Diego Health System","ror":"https://ror.org/01kbfgm16","country_code":"US","type":"healthcare","lineage":["https://openalex.org/I2800935791"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lutong Wang","raw_affiliation_strings":["UC San Diego"],"affiliations":[{"raw_affiliation_string":"UC San Diego","institution_ids":["https://openalex.org/I2800935791"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5074654905"],"corresponding_institution_ids":["https://openalex.org/I2250650973"],"apc_list":null,"apc_paid":null,"fwci":0.1192,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.42589874,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"550","last_page":"556"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.7472058534622192},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.5461876392364502},{"id":"https://openalex.org/keywords/leakage-power","display_name":"Leakage power","score":0.499434232711792},{"id":"https://openalex.org/keywords/standard-cell","display_name":"Standard cell","score":0.4871320426464081},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48594605922698975},{"id":"https://openalex.org/keywords/heuristics","display_name":"Heuristics","score":0.4178754687309265},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41786664724349976},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25826296210289},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.238305002450943},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.21485081315040588},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21045538783073425},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.20690393447875977},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.20244890451431274}],"concepts":[{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.7472058534622192},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.5461876392364502},{"id":"https://openalex.org/C2987719587","wikidata":"https://www.wikidata.org/wiki/Q1811428","display_name":"Leakage power","level":4,"score":0.499434232711792},{"id":"https://openalex.org/C78401558","wikidata":"https://www.wikidata.org/wiki/Q464496","display_name":"Standard cell","level":3,"score":0.4871320426464081},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48594605922698975},{"id":"https://openalex.org/C127705205","wikidata":"https://www.wikidata.org/wiki/Q5748245","display_name":"Heuristics","level":2,"score":0.4178754687309265},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41786664724349976},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25826296210289},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.238305002450943},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.21485081315040588},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21045538783073425},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.20690393447875977},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.20244890451431274},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3287624.3287679","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3287624.3287679","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 24th Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320332603","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1999291149","https://openalex.org/W2005653503","https://openalex.org/W2019179812","https://openalex.org/W2022147648","https://openalex.org/W2085461947","https://openalex.org/W2105918490","https://openalex.org/W2110436374","https://openalex.org/W2167566128","https://openalex.org/W2248512261","https://openalex.org/W2469897127","https://openalex.org/W2525541849","https://openalex.org/W2584186471","https://openalex.org/W2742997206","https://openalex.org/W2744230264","https://openalex.org/W2772189580","https://openalex.org/W2787310733","https://openalex.org/W2789648197","https://openalex.org/W2884772258"],"related_works":["https://openalex.org/W2072989701","https://openalex.org/W1738647919","https://openalex.org/W3000179092","https://openalex.org/W1986774039","https://openalex.org/W2050511294","https://openalex.org/W2900067469","https://openalex.org/W2130342263","https://openalex.org/W2118321428","https://openalex.org/W2968511773","https://openalex.org/W1589514528"],"abstract_inverted_index":{"A":[0],"diffusion":[1,40,45],"break":[2,41,46],"(DB)":[3],"isolates":[4],"two":[5],"neighboring":[6,101],"devices":[7],"in":[8,52,82,136,152],"a":[9,15,78,90,98,107,115,126,153],"standard":[10],"cell-based":[11],"design":[12,26,186],"and":[13,20,67,119,123,146,164],"has":[14],"stress":[16],"effect":[17,60],"on":[18,73,94,168],"delay":[19],"leakage":[21,120,144,174],"power.":[22],"In":[23,110],"foundry":[24,155],"sub-10nm":[25],"enablements,":[27],"device":[28,65],"performance":[29,66,105],"is":[30,50,177],"changed":[31],"according":[32],"to":[33,85],"the":[34,53,74,86,95,173,180],"type":[35,79],"of":[36,80,97,106,128,172],"DB":[37,76,88,130,182],"-":[38,48],"single":[39],"(SDB)":[42],"or":[43],"double":[44],"(DDB)":[47],"that":[49,92,159,176],"used":[51],"library":[54],"cell":[55],"layout.":[56],"Crucially,":[57],"local":[58],"layout":[59],"(LLE)":[61],"can":[62,132],"substantially":[63],"affect":[64],"leakage.":[68],"Our":[69],"present":[70],"work":[71],"focuses":[72],"2nd":[75,116,129,142,161,181],"effect,":[77,183],"LLE":[81],"which":[83],"distance":[84,91],"second-closest":[87],"(i.e.,":[89],"depends":[93],"placement":[96,148],"given":[99,108],"cell's":[100],"cell)":[102],"also":[103],"impacts":[104],"device.":[109],"this":[111],"work,":[112],"we":[113],"implement":[114],"DB-aware":[117,143,162],"timing":[118],"analysis":[121,163],"flow,":[122],"show":[124],"how":[125],"lack":[127],"awareness":[131],"misguide":[133],"current":[134],"optimization":[135,145,165],"place-and-route":[137],"stages.":[138],"We":[139],"then":[140],"develop":[141],"detailed":[147],"heuristics.":[149],"Experimental":[150],"results":[151],"scaled":[154],"14nm":[156],"technology":[157],"indicate":[158],"our":[160],"flow":[166],"achieves,":[167],"average,":[169],"80%":[170],"recovery":[171],"increment":[175],"induced":[178],"by":[179],"without":[184],"changing":[185],"performance.":[187]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}