{"id":"https://openalex.org/W2905789540","doi":"https://doi.org/10.1145/3277453.3277477","title":"Reliability Evaluation of Complex Equipment Based on Virtual Samples and Performance Degradation","display_name":"Reliability Evaluation of Complex Equipment Based on Virtual Samples and Performance Degradation","publication_year":2018,"publication_date":"2018-09-19","ids":{"openalex":"https://openalex.org/W2905789540","doi":"https://doi.org/10.1145/3277453.3277477","mag":"2905789540"},"language":"en","primary_location":{"id":"doi:10.1145/3277453.3277477","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3277453.3277477","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2018 International Conference on Electronics and Electrical Engineering Technology","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100566906","display_name":"Xinchao Zhao","orcid":"https://orcid.org/0000-0001-9376-7646"},"institutions":[{"id":"https://openalex.org/I4210162215","display_name":"Naval Aeronautical and Astronautical University","ror":"https://ror.org/02j2yhq26","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210162215"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xinchao Zhao","raw_affiliation_strings":["Naval Aeronautical University, Yantai, Shandong,China"],"affiliations":[{"raw_affiliation_string":"Naval Aeronautical University, Yantai, Shandong,China","institution_ids":["https://openalex.org/I4210162215"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064752351","display_name":"Weimin Lv","orcid":null},"institutions":[{"id":"https://openalex.org/I4210162215","display_name":"Naval Aeronautical and Astronautical University","ror":"https://ror.org/02j2yhq26","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210162215"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weimin Lv","raw_affiliation_strings":["Naval Aeronautical University, Yantai, Shandong,China"],"affiliations":[{"raw_affiliation_string":"Naval Aeronautical University, Yantai, Shandong,China","institution_ids":["https://openalex.org/I4210162215"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5100566906"],"corresponding_institution_ids":["https://openalex.org/I4210162215"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.21428009,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"50","issue":null,"first_page":"112","last_page":"117"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9789999723434448,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9656000137329102,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.8595253229141235},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7941454648971558},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6777294278144836},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6371994614601135},{"id":"https://openalex.org/keywords/trajectory","display_name":"Trajectory","score":0.6160314083099365},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.551483154296875},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5152907371520996},{"id":"https://openalex.org/keywords/relay","display_name":"Relay","score":0.49761679768562317},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.4970591366291046},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.25622302293777466},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17218610644340515}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.8595253229141235},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7941454648971558},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6777294278144836},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6371994614601135},{"id":"https://openalex.org/C13662910","wikidata":"https://www.wikidata.org/wiki/Q193139","display_name":"Trajectory","level":2,"score":0.6160314083099365},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.551483154296875},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5152907371520996},{"id":"https://openalex.org/C2778156585","wikidata":"https://www.wikidata.org/wiki/Q174053","display_name":"Relay","level":3,"score":0.49761679768562317},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.4970591366291046},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.25622302293777466},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17218610644340515},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3277453.3277477","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3277453.3277477","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2018 International Conference on Electronics and Electrical Engineering Technology","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1815542355","https://openalex.org/W1964039725","https://openalex.org/W1969126633","https://openalex.org/W1972500918","https://openalex.org/W2145341463","https://openalex.org/W2321096599","https://openalex.org/W2351312185","https://openalex.org/W2356530765","https://openalex.org/W2374969100","https://openalex.org/W6681604792"],"related_works":["https://openalex.org/W2539674285","https://openalex.org/W1038122923","https://openalex.org/W1998322187","https://openalex.org/W2952514781","https://openalex.org/W3019210376","https://openalex.org/W2391145594","https://openalex.org/W2326572623","https://openalex.org/W1815542355","https://openalex.org/W2152540334","https://openalex.org/W4289655666"],"abstract_inverted_index":{"Aiming":[0],"at":[1],"the":[2,28,36,43,48,57,61,71,81,101,105,109,114],"difficulties":[3],"in":[4,113],"reliability":[5,15],"evaluation":[6,16],"of":[7,84,88,95,108],"small":[8],"samples":[9,21],"and":[10,22,35,91],"multi-performance":[11,29],"parameter":[12,30,38,45],"products,":[13],"a":[14,85,93],"method":[17,67,74,102],"based":[18,75],"on":[19,76],"virtual":[20,40],"performance":[23,44,72,77],"degradation":[24,63,78,82,116],"is":[25,33,39,53,68],"proposed.":[26],"Firstly,":[27],"distance":[31],"concept":[32],"introduced,":[34],"original":[37],"augmented":[41],"with":[42,70],"distance.":[46],"Secondly,":[47],"improved":[49],"Elman":[50],"neural":[51],"network":[52],"used":[54],"to":[55,59,79],"process":[56,80],"sample":[58,111],"obtain":[60,92],"complete":[62],"trajectory.":[64],"Finally,":[65],"this":[66],"combined":[69],"prediction":[73],"data":[83,112],"certain":[86,120],"type":[87],"space":[89],"relay":[90],"lifetime":[94],"128":[96],"hours.":[97],"The":[98],"result":[99],"shows":[100],"effectively":[103],"solves":[104],"processing":[106],"problem":[107],"rare":[110],"accelerated":[115],"test,":[117],"which":[118],"has":[119],"reference":[121],"significance.":[122]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}