{"id":"https://openalex.org/W2898150750","doi":"https://doi.org/10.1145/3276604.3284957","title":"A new approach for software correctness and reliability (keynote)","display_name":"A new approach for software correctness and reliability (keynote)","publication_year":2018,"publication_date":"2018-10-24","ids":{"openalex":"https://openalex.org/W2898150750","doi":"https://doi.org/10.1145/3276604.3284957","mag":"2898150750"},"language":"en","primary_location":{"id":"doi:10.1145/3276604.3284957","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3276604.3284957","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 11th ACM SIGPLAN International Conference on Software Language Engineering","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045127387","display_name":"Martin Rinard","orcid":"https://orcid.org/0000-0001-8095-8523"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Martin C. Rinard","raw_affiliation_strings":["Massachusetts Institute of Technology, USA"],"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, USA","institution_ids":["https://openalex.org/I63966007"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5045127387"],"corresponding_institution_ids":["https://openalex.org/I63966007"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1742924,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9697999954223633,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9531000256538391,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/correctness","display_name":"Correctness","score":0.9306409358978271},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7273885011672974},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6201791763305664},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5299715995788574},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.4985339641571045},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.4938502907752991},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4818366765975952},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.45406433939933777},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.45174241065979004},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.25558727979660034},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.23393034934997559},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16430315375328064},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.0645938515663147}],"concepts":[{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.9306409358978271},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7273885011672974},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6201791763305664},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5299715995788574},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4985339641571045},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.4938502907752991},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4818366765975952},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.45406433939933777},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.45174241065979004},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.25558727979660034},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.23393034934997559},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16430315375328064},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0645938515663147},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3276604.3284957","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3276604.3284957","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 11th ACM SIGPLAN International Conference on Software Language Engineering","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Quality Education","score":0.6600000262260437,"id":"https://metadata.un.org/sdg/4"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2353986702","https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433"],"abstract_inverted_index":{"Software":[0],"correctness":[1],"and":[2],"security":[3],"have":[4,15],"been":[5],"a":[6,17],"central":[7],"issue":[8],"in":[9],"the":[10],"field":[11],"for":[12],"decades.":[13],"Researchers":[14],"developed":[16],"wide":[18],"range":[19],"of":[20,26],"approaches":[21],"to":[22,32],"these":[23,30],"problems,":[24],"none":[25],"which":[27],"has":[28],"solved":[29],"problems":[31],"date.":[33]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}