{"id":"https://openalex.org/W2884687732","doi":"https://doi.org/10.1145/3218603.3218642","title":"Reliability and Uniformity Enhancement in 8T-SRAM based PUFs operating at NTC","display_name":"Reliability and Uniformity Enhancement in 8T-SRAM based PUFs operating at NTC","publication_year":2018,"publication_date":"2018-07-23","ids":{"openalex":"https://openalex.org/W2884687732","doi":"https://doi.org/10.1145/3218603.3218642","mag":"2884687732"},"language":"en","primary_location":{"id":"doi:10.1145/3218603.3218642","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3218603.3218642","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/3218603.3218642","source":{"id":"https://openalex.org/S4363608722","display_name":"Proceedings of the International Symposium on Low Power Electronics and Design","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the International Symposium on Low Power Electronics and Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://dl.acm.org/doi/pdf/10.1145/3218603.3218642","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056242537","display_name":"Pramesh Pandey","orcid":"https://orcid.org/0000-0002-4345-4067"},"institutions":[{"id":"https://openalex.org/I121980950","display_name":"Utah State University","ror":"https://ror.org/00h6set76","country_code":"US","type":"education","lineage":["https://openalex.org/I121980950"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pramesh Pandey","raw_affiliation_strings":["USU BRIDGE LAB, Electrical and Computer Engineering Department, Utah State University, Logan, Utah, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"USU BRIDGE LAB, Electrical and Computer Engineering Department, Utah State University, Logan, Utah, USA","institution_ids":["https://openalex.org/I121980950"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103239410","display_name":"Asmita Pal","orcid":"https://orcid.org/0000-0001-6949-5070"},"institutions":[{"id":"https://openalex.org/I121980950","display_name":"Utah State University","ror":"https://ror.org/00h6set76","country_code":"US","type":"education","lineage":["https://openalex.org/I121980950"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Asmita Pal","raw_affiliation_strings":["USU BRIDGE LAB, Electrical and Computer Engineering Department, Utah State University, Logan, Utah, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"USU BRIDGE LAB, Electrical and Computer Engineering Department, Utah State University, Logan, Utah, USA","institution_ids":["https://openalex.org/I121980950"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101594477","display_name":"Koushik Chakraborty","orcid":"https://orcid.org/0000-0003-0228-2737"},"institutions":[{"id":"https://openalex.org/I121980950","display_name":"Utah State University","ror":"https://ror.org/00h6set76","country_code":"US","type":"education","lineage":["https://openalex.org/I121980950"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Koushik Chakraborty","raw_affiliation_strings":["USU BRIDGE LAB, Electrical and Computer Engineering Department, Utah State University, Logan, Utah, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"USU BRIDGE LAB, Electrical and Computer Engineering Department, Utah State University, Logan, Utah, USA","institution_ids":["https://openalex.org/I121980950"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068885938","display_name":"Sanghamitra Roy","orcid":"https://orcid.org/0000-0002-3927-1612"},"institutions":[{"id":"https://openalex.org/I121980950","display_name":"Utah State University","ror":"https://ror.org/00h6set76","country_code":"US","type":"education","lineage":["https://openalex.org/I121980950"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sanghamitra Roy","raw_affiliation_strings":["USU BRIDGE LAB, Electrical and Computer Engineering Department, Utah State University, Logan, Utah, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"USU BRIDGE LAB, Electrical and Computer Engineering Department, Utah State University, Logan, Utah, USA","institution_ids":["https://openalex.org/I121980950"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.07692308,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/schematic","display_name":"Schematic","score":0.7615615129470825},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7398297786712646},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6411068439483643},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6298955678939819},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5939857959747314},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5499274134635925},{"id":"https://openalex.org/keywords/sizing","display_name":"Sizing","score":0.5198657512664795},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.5079444050788879},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4571438133716583},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.4377589523792267},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4368784725666046},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42050641775131226},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4028148651123047},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.167802631855011},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.15321367979049683},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07008668780326843}],"concepts":[{"id":"https://openalex.org/C192328126","wikidata":"https://www.wikidata.org/wiki/Q4514647","display_name":"Schematic","level":2,"score":0.7615615129470825},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7398297786712646},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6411068439483643},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6298955678939819},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5939857959747314},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5499274134635925},{"id":"https://openalex.org/C2777767291","wikidata":"https://www.wikidata.org/wiki/Q1080291","display_name":"Sizing","level":2,"score":0.5198657512664795},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.5079444050788879},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4571438133716583},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.4377589523792267},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4368784725666046},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42050641775131226},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4028148651123047},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.167802631855011},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.15321367979049683},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07008668780326843},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/3218603.3218642","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3218603.3218642","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/3218603.3218642","source":{"id":"https://openalex.org/S4363608722","display_name":"Proceedings of the International Symposium on Low Power Electronics and Design","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the International Symposium on Low Power Electronics and Design","raw_type":"proceedings-article"},{"id":"pmh:oai:digitalcommons.usu.edu:ece_facpub-1247","is_oa":false,"landing_page_url":"https://digitalcommons.usu.edu/ece_facpub/243","pdf_url":null,"source":{"id":"https://openalex.org/S4377196327","display_name":"Digital Commons - USU (Utah State University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I121980950","host_organization_name":"Utah State University","host_organization_lineage":["https://openalex.org/I121980950"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Electrical and Computer Engineering Faculty Publications","raw_type":"text"}],"best_oa_location":{"id":"doi:10.1145/3218603.3218642","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3218603.3218642","pdf_url":"https://dl.acm.org/doi/pdf/10.1145/3218603.3218642","source":{"id":"https://openalex.org/S4363608722","display_name":"Proceedings of the International Symposium on Low Power Electronics and Design","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the International Symposium on Low Power Electronics and Design","raw_type":"proceedings-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.4300000071525574,"display_name":"Industry, innovation and infrastructure"}],"awards":[{"id":"https://openalex.org/G2226162150","display_name":null,"funder_award_id":"CNS-1421022","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G2980899272","display_name":null,"funder_award_id":"CNS-1421068","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G3558657069","display_name":"SHF:Small:Boosting Sustainability in NoC Architectures Through a Proactive Approach","funder_award_id":"1318826","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G4410011735","display_name":null,"funder_award_id":"CAREER-1253024","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G5422440929","display_name":"CAREER: Predicting Timing Violations: A New Direction for Robust System Design","funder_award_id":"1253024","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G5523648604","display_name":null,"funder_award_id":"CCF-1318826","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G6671297155","display_name":null,"funder_award_id":"CAREER","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G7235328486","display_name":"CSR: Small: DARP: Promoting Energy Efficient System Design Through a Dynamically Adaptable Resilient Pipeline","funder_award_id":"1421022","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G8634188759","display_name":null,"funder_award_id":"Grant CAREER-1253024, Grant CCF-1318826, Grant CNS-1421022, and Grant CNS-1421068","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2884687732.pdf","grobid_xml":"https://content.openalex.org/works/W2884687732.grobid-xml"},"referenced_works_count":21,"referenced_works":["https://openalex.org/W42037993","https://openalex.org/W564905336","https://openalex.org/W585970796","https://openalex.org/W1975057355","https://openalex.org/W1975166224","https://openalex.org/W1998525920","https://openalex.org/W2067392247","https://openalex.org/W2088455835","https://openalex.org/W2104956145","https://openalex.org/W2113322447","https://openalex.org/W2116374153","https://openalex.org/W2132621842","https://openalex.org/W2149648080","https://openalex.org/W2149930948","https://openalex.org/W2516208723","https://openalex.org/W2538126211","https://openalex.org/W4206682622","https://openalex.org/W4212829285","https://openalex.org/W4232862975","https://openalex.org/W4233114901","https://openalex.org/W4244942424"],"related_works":["https://openalex.org/W2119312496","https://openalex.org/W4247460323","https://openalex.org/W2537086382","https://openalex.org/W2107909712","https://openalex.org/W2153162275","https://openalex.org/W2079259690","https://openalex.org/W2108986771","https://openalex.org/W789543267","https://openalex.org/W2004965314","https://openalex.org/W2094295436"],"abstract_inverted_index":{"SRAM-based":[0],"PUFs":[1],"(SPUFs)":[2],"have":[3],"emerged":[4],"as":[5],"promising":[6],"security":[7],"primitives":[8],"for":[9],"low-power":[10],"devices.":[11],"However,":[12],"operating":[13],"8T-SPUFs":[14],"at":[15],"Near-Threshold":[16],"Computing":[17],"(NTC)":[18],"realm":[19],"is":[20],"plagued":[21],"by":[22,54,91],"exacerbated":[23],"process":[24],"variation":[25],"(PV)":[26],"sensitivity":[27],"which":[28],"thwarts":[29],"their":[30],"reliable":[31],"operation.":[32],"In":[33],"this":[34],"paper,":[35],"we":[36,60],"demonstrate":[37],"the":[38,42,51,79,86],"massive":[39],"degradation":[40],"in":[41,78],"reliability":[43],"and":[44,63,84],"uniformity":[45,90],"characteristics":[46],"of":[47,57,74,81],"8T-SPUF.":[48],"By":[49],"exploiting":[50],"opportunities":[52],"bestowed":[53],"schematic":[55],"asymmetry":[56],"8T-SPUF":[58,97],"cells,":[59],"propose":[61],"biasing":[62],"sizing":[64],"based":[65],"design":[66],"strategies.":[67],"Our":[68],"techniques":[69],"achieve":[70],"an":[71],"immense":[72],"improvement":[73],"more":[75],"than":[76],"55%":[77],"percentage":[80],"unreliable":[82],"cells":[83],"improves":[85],"proximity":[87],"to":[88],"ideal":[89],"82%,":[92],"over":[93],"a":[94],"baseline":[95],"NTC":[96],"with":[98],"no":[99],"enhancement.":[100]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}