{"id":"https://openalex.org/W2810644268","doi":"https://doi.org/10.1145/3194733.3194741","title":"Memory corruption detecting method using static variables and dynamic memory usage","display_name":"Memory corruption detecting method using static variables and dynamic memory usage","publication_year":2018,"publication_date":"2018-05-28","ids":{"openalex":"https://openalex.org/W2810644268","doi":"https://doi.org/10.1145/3194733.3194741","mag":"2810644268"},"language":"en","primary_location":{"id":"doi:10.1145/3194733.3194741","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3194733.3194741","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 13th International Workshop on Automation of Software Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100338427","display_name":"Jihyun Park","orcid":"https://orcid.org/0000-0003-4478-7565"},"institutions":[{"id":"https://openalex.org/I138925566","display_name":"Ewha Womans University","ror":"https://ror.org/053fp5c05","country_code":"KR","type":"education","lineage":["https://openalex.org/I138925566"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jihyun Park","raw_affiliation_strings":["Ewha Womans University, Seoul, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ewha Womans University, Seoul, Korea","institution_ids":["https://openalex.org/I138925566"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066775413","display_name":"Chang-Sun Park","orcid":null},"institutions":[{"id":"https://openalex.org/I138925566","display_name":"Ewha Womans University","ror":"https://ror.org/053fp5c05","country_code":"KR","type":"education","lineage":["https://openalex.org/I138925566"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Changsun Park","raw_affiliation_strings":["Ewha Womans University, Seoul, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ewha Womans University, Seoul, Korea","institution_ids":["https://openalex.org/I138925566"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057462266","display_name":"Byoungju Choi","orcid":"https://orcid.org/0000-0003-3985-7645"},"institutions":[{"id":"https://openalex.org/I138925566","display_name":"Ewha Womans University","ror":"https://ror.org/053fp5c05","country_code":"KR","type":"education","lineage":["https://openalex.org/I138925566"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byoungju Choi","raw_affiliation_strings":["Ewha Womans University, Seoul, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ewha Womans University, Seoul, Korea","institution_ids":["https://openalex.org/I138925566"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049994588","display_name":"Gihun Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Gihun Chang","raw_affiliation_strings":["Samsung Electronics, Seoul, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Seoul, Korea","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1663,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.43837581,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"46","last_page":"52"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11241","display_name":"Advanced Malware Detection Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11241","display_name":"Advanced Malware Detection Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7750663757324219},{"id":"https://openalex.org/keywords/crash","display_name":"Crash","score":0.7235607504844666},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.7057181000709534},{"id":"https://openalex.org/keywords/memory-management","display_name":"Memory management","score":0.46759718656539917},{"id":"https://openalex.org/keywords/memory-leak","display_name":"Memory leak","score":0.46492576599121094},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4412652552127838},{"id":"https://openalex.org/keywords/language-change","display_name":"Language change","score":0.43812352418899536},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.3536745011806488},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3398948013782501},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3376937210559845},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.3307117819786072},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.18114706873893738},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.17497950792312622},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.16525721549987793},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1286822259426117}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7750663757324219},{"id":"https://openalex.org/C183469790","wikidata":"https://www.wikidata.org/wiki/Q333501","display_name":"Crash","level":2,"score":0.7235607504844666},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.7057181000709534},{"id":"https://openalex.org/C176649486","wikidata":"https://www.wikidata.org/wiki/Q2308807","display_name":"Memory management","level":3,"score":0.46759718656539917},{"id":"https://openalex.org/C156731835","wikidata":"https://www.wikidata.org/wiki/Q751740","display_name":"Memory leak","level":4,"score":0.46492576599121094},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4412652552127838},{"id":"https://openalex.org/C2780027415","wikidata":"https://www.wikidata.org/wiki/Q524648","display_name":"Language change","level":2,"score":0.43812352418899536},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.3536745011806488},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3398948013782501},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3376937210559845},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.3307117819786072},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.18114706873893738},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.17497950792312622},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.16525721549987793},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1286822259426117},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3194733.3194741","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3194733.3194741","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 13th International Workshop on Automation of Software Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8100000023841858,"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W121328003","https://openalex.org/W1878544538","https://openalex.org/W1957875051","https://openalex.org/W2010739076","https://openalex.org/W2098809490","https://openalex.org/W2135531618","https://openalex.org/W2138538192","https://openalex.org/W2140073981","https://openalex.org/W2538458302","https://openalex.org/W2586904474","https://openalex.org/W2622485323"],"related_works":["https://openalex.org/W4384948881","https://openalex.org/W2182829270","https://openalex.org/W2064228006","https://openalex.org/W2592247214","https://openalex.org/W2104098106","https://openalex.org/W2165063050","https://openalex.org/W2158767818","https://openalex.org/W2304927939","https://openalex.org/W2102012911","https://openalex.org/W2574626727"],"abstract_inverted_index":{"Memory":[0,25],"fault":[1],"detection":[2,9],"has":[3],"been":[4],"continuously":[5],"studied":[6],"and":[7],"various":[8],"methods":[10],"exist.":[11],"However,":[12,38],"there":[13,39],"are":[14,21,40,62],"still":[15],"remains":[16],"many":[17,41],"memory":[18,58],"defects":[19,31,61],"that":[20,32],"difficult":[22,63],"to":[23,64],"debug.":[24],"corruption":[26],"is":[27,49],"one":[28],"of":[29,46],"those":[30],"often":[33],"cause":[34],"a":[35],"system":[36],"crash.":[37],"cases":[42],"where":[43],"the":[44,47,52,56],"location":[45,54],"crash":[48],"different":[50],"from":[51],"actual":[53,57],"causing":[55],"corruption.":[59],"These":[60],"solve":[65],"by":[66],"existing":[67],"methods.":[68]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}