{"id":"https://openalex.org/W2784176683","doi":"https://doi.org/10.1145/3167486.3167575","title":"Evaluation of the Mode I Stress Intensity Factor calculated by the Finite Element Method for CT Specimen of API 5L X52 Steel","display_name":"Evaluation of the Mode I Stress Intensity Factor calculated by the Finite Element Method for CT Specimen of API 5L X52 Steel","publication_year":2017,"publication_date":"2017-11-14","ids":{"openalex":"https://openalex.org/W2784176683","doi":"https://doi.org/10.1145/3167486.3167575","mag":"2784176683"},"language":"en","primary_location":{"id":"doi:10.1145/3167486.3167575","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3167486.3167575","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2nd International Conference on Computing and Wireless Communication Systems","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088440207","display_name":"S. Ousfya","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Ousfya","raw_affiliation_strings":["Laboratory of modelization and automatic system, Errachidia, Morocco"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of modelization and automatic system, Errachidia, Morocco","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014487456","display_name":"Rafik Taouil","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"R. Taouil","raw_affiliation_strings":["Laboratory of modelization and automatic system, Errachidia, Morocco"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of modelization and automatic system, Errachidia, Morocco","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110433494","display_name":"Hassane Moustabchir","orcid":"https://orcid.org/0000-0001-9185-6848"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"H. Moustabchir","raw_affiliation_strings":["Science and Materials Engineering Team, Errachidia, Morocco"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Materials Engineering Team, Errachidia, Morocco","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076727547","display_name":"M. Touzani","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. Touzani","raw_affiliation_strings":["Laboratory of modelization and automatic system, Errachidia, Morocco"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of modelization and automatic system, Errachidia, Morocco","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.36477072,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10396","display_name":"Fatigue and fracture mechanics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10396","display_name":"Fatigue and fracture mechanics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10386","display_name":"Microstructure and Mechanical Properties of Steels","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.7843785881996155},{"id":"https://openalex.org/keywords/mode","display_name":"Mode (computer interface)","score":0.5773210525512695},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.5158902406692505},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.5056159496307373},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4915097653865814},{"id":"https://openalex.org/keywords/stress-intensity-factor","display_name":"Stress intensity factor","score":0.48886579275131226},{"id":"https://openalex.org/keywords/intensity","display_name":"Intensity (physics)","score":0.4547722339630127},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4324643015861511},{"id":"https://openalex.org/keywords/computed-tomography","display_name":"Computed tomography","score":0.4271096885204315},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3355841040611267},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.3290012776851654},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19712862372398376},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.1657603681087494},{"id":"https://openalex.org/keywords/radiology","display_name":"Radiology","score":0.0842742919921875}],"concepts":[{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.7843785881996155},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.5773210525512695},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.5158902406692505},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.5056159496307373},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4915097653865814},{"id":"https://openalex.org/C54303661","wikidata":"https://www.wikidata.org/wiki/Q1754376","display_name":"Stress intensity factor","level":3,"score":0.48886579275131226},{"id":"https://openalex.org/C93038891","wikidata":"https://www.wikidata.org/wiki/Q1061524","display_name":"Intensity (physics)","level":2,"score":0.4547722339630127},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4324643015861511},{"id":"https://openalex.org/C544519230","wikidata":"https://www.wikidata.org/wiki/Q32566","display_name":"Computed tomography","level":2,"score":0.4271096885204315},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3355841040611267},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.3290012776851654},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19712862372398376},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1657603681087494},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.0842742919921875},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3167486.3167575","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3167486.3167575","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2nd International Conference on Computing and Wireless Communication Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5400000214576721,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1487455380","https://openalex.org/W2001325695","https://openalex.org/W2080672916","https://openalex.org/W2098850750","https://openalex.org/W2145572133","https://openalex.org/W2145580705","https://openalex.org/W2154411184","https://openalex.org/W4214736987"],"related_works":["https://openalex.org/W2082075152","https://openalex.org/W2350575069","https://openalex.org/W2037307173","https://openalex.org/W2367741322","https://openalex.org/W3009773004","https://openalex.org/W2388302583","https://openalex.org/W4311870809","https://openalex.org/W2094089080","https://openalex.org/W157340567","https://openalex.org/W2365350042"],"abstract_inverted_index":{"Today,":[0],"computers":[1],"and":[2,15],"digital":[3],"sciences":[4],"are":[5],"essential":[6],"to":[7,12],"model":[8],"processes":[9],"in":[10,18],"order":[11],"extract":[13],"information":[14],"present":[16],"it":[17],"a":[19],"framework":[20],"exploitable":[21],"for":[22],"the":[23],"researcher.":[24]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}