{"id":"https://openalex.org/W2761149222","doi":"https://doi.org/10.1145/3132402.3132410","title":"Mitigating bitline crosstalk noise in DRAM memories","display_name":"Mitigating bitline crosstalk noise in DRAM memories","publication_year":2017,"publication_date":"2017-10-02","ids":{"openalex":"https://openalex.org/W2761149222","doi":"https://doi.org/10.1145/3132402.3132410","mag":"2761149222"},"language":"en","primary_location":{"id":"doi:10.1145/3132402.3132410","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3132402.3132410","pdf_url":null,"source":{"id":"https://openalex.org/S4306524191","display_name":"Proceedings of the International Symposium on Memory Systems","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the International Symposium on Memory Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109243875","display_name":"Seyed Mohammad Seyedzadeh","orcid":"https://orcid.org/0000-0003-4277-9713"},"institutions":[{"id":"https://openalex.org/I170201317","display_name":"University of Pittsburgh","ror":"https://ror.org/01an3r305","country_code":"US","type":"education","lineage":["https://openalex.org/I170201317"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Seyed Mohammad Seyedzadeh","raw_affiliation_strings":["University of Pittsburgh"],"affiliations":[{"raw_affiliation_string":"University of Pittsburgh","institution_ids":["https://openalex.org/I170201317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083719191","display_name":"Donald Kline","orcid":"https://orcid.org/0000-0002-4414-1513"},"institutions":[{"id":"https://openalex.org/I170201317","display_name":"University of Pittsburgh","ror":"https://ror.org/01an3r305","country_code":"US","type":"education","lineage":["https://openalex.org/I170201317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Donald Kline","raw_affiliation_strings":["University of Pittsburgh"],"affiliations":[{"raw_affiliation_string":"University of Pittsburgh","institution_ids":["https://openalex.org/I170201317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030875484","display_name":"Alex K. Jones","orcid":"https://orcid.org/0000-0001-7498-0206"},"institutions":[{"id":"https://openalex.org/I170201317","display_name":"University of Pittsburgh","ror":"https://ror.org/01an3r305","country_code":"US","type":"education","lineage":["https://openalex.org/I170201317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alex K. Jones","raw_affiliation_strings":["University of Pittsburgh"],"affiliations":[{"raw_affiliation_string":"University of Pittsburgh","institution_ids":["https://openalex.org/I170201317"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038997010","display_name":"Rami Melhem","orcid":"https://orcid.org/0000-0001-6403-5446"},"institutions":[{"id":"https://openalex.org/I170201317","display_name":"University of Pittsburgh","ror":"https://ror.org/01an3r305","country_code":"US","type":"education","lineage":["https://openalex.org/I170201317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rami Melhem","raw_affiliation_strings":["University of Pittsburgh"],"affiliations":[{"raw_affiliation_string":"University of Pittsburgh","institution_ids":["https://openalex.org/I170201317"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5109243875"],"corresponding_institution_ids":["https://openalex.org/I170201317"],"apc_list":null,"apc_paid":null,"fwci":1.7201,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.85707046,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"205","last_page":"216"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.9412367343902588},{"id":"https://openalex.org/keywords/crosstalk","display_name":"Crosstalk","score":0.8111035823822021},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5746777653694153},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5378427505493164},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5168386101722717},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.46850162744522095},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.46426108479499817},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.416610985994339},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.415283203125},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38328462839126587},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2770811915397644},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2711355984210968},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.24462246894836426}],"concepts":[{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.9412367343902588},{"id":"https://openalex.org/C169822122","wikidata":"https://www.wikidata.org/wiki/Q230187","display_name":"Crosstalk","level":2,"score":0.8111035823822021},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5746777653694153},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5378427505493164},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5168386101722717},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.46850162744522095},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.46426108479499817},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.416610985994339},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.415283203125},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38328462839126587},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2770811915397644},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2711355984210968},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.24462246894836426},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3132402.3132410","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3132402.3132410","pdf_url":null,"source":{"id":"https://openalex.org/S4306524191","display_name":"Proceedings of the International Symposium on Memory Systems","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the International Symposium on Memory Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4867965850","display_name":null,"funder_award_id":"CCF-1064976, 1247842","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"},{"id":"https://openalex.org/F4320337392","display_name":"Division of Electrical, Communications and Cyber Systems","ror":"https://ror.org/01krpsy48"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":64,"referenced_works":["https://openalex.org/W66842132","https://openalex.org/W1578894366","https://openalex.org/W1581229801","https://openalex.org/W1597555784","https://openalex.org/W1970221984","https://openalex.org/W1970426108","https://openalex.org/W1983178358","https://openalex.org/W1988245650","https://openalex.org/W1989764347","https://openalex.org/W1990028399","https://openalex.org/W1997638978","https://openalex.org/W2006983510","https://openalex.org/W2017525960","https://openalex.org/W2023834387","https://openalex.org/W2026703099","https://openalex.org/W2035575158","https://openalex.org/W2036853599","https://openalex.org/W2060397112","https://openalex.org/W2074385563","https://openalex.org/W2078724671","https://openalex.org/W2079248286","https://openalex.org/W2082948609","https://openalex.org/W2105963142","https://openalex.org/W2112768159","https://openalex.org/W2114260887","https://openalex.org/W2115500527","https://openalex.org/W2119092821","https://openalex.org/W2124058650","https://openalex.org/W2124608923","https://openalex.org/W2134633067","https://openalex.org/W2138815064","https://openalex.org/W2142111686","https://openalex.org/W2145197558","https://openalex.org/W2147657366","https://openalex.org/W2154480264","https://openalex.org/W2155132155","https://openalex.org/W2157116240","https://openalex.org/W2158620667","https://openalex.org/W2159392208","https://openalex.org/W2163518473","https://openalex.org/W2164586147","https://openalex.org/W2165899972","https://openalex.org/W2166360294","https://openalex.org/W2169875292","https://openalex.org/W2179360174","https://openalex.org/W2191646802","https://openalex.org/W2280097880","https://openalex.org/W2345165652","https://openalex.org/W2418958843","https://openalex.org/W2525431465","https://openalex.org/W2529008862","https://openalex.org/W2529175623","https://openalex.org/W2541400326","https://openalex.org/W2546811911","https://openalex.org/W2999623539","https://openalex.org/W3004383742","https://openalex.org/W3143002681","https://openalex.org/W4239813889","https://openalex.org/W4242601976","https://openalex.org/W4242612726","https://openalex.org/W4245207062","https://openalex.org/W4249971531","https://openalex.org/W6602847349","https://openalex.org/W6630885905"],"related_works":["https://openalex.org/W2139495056","https://openalex.org/W2050559740","https://openalex.org/W1972627271","https://openalex.org/W2166360294","https://openalex.org/W2135274146","https://openalex.org/W2164366009","https://openalex.org/W2538715940","https://openalex.org/W1863276242","https://openalex.org/W3016564565","https://openalex.org/W1818865594"],"abstract_inverted_index":{"DRAM":[0],"cells":[1,50],"in":[2],"deeply":[3],"scaled":[4],"CMOS":[5],"confront":[6],"significant":[7],"challenges":[8],"to":[9,48,55],"ensure":[10],"reliable":[11],"operation.":[12],"Parasitic":[13],"capacitances":[14],"induced":[15],"by":[16],"certain":[17],"bit":[18],"storage":[19],"patterns,":[20,23],"or":[21],"bad":[22],"create":[24],"coupling":[25,34],"noise":[26],"that":[27,51],"can":[28],"cause":[29],"crosstalk-induced":[30],"faults":[31],"when":[32],"the":[33],"exceeds":[35],"tolerable":[36],"margins.":[37],"These":[38],"margins":[39],"decrease":[40],"and":[41],"their":[42],"variabilities":[43],"increase":[44],"with":[45],"scaling,":[46],"leading":[47],"weak":[49],"are":[52],"highly":[53],"susceptible":[54],"this":[56],"form":[57],"of":[58],"crosstalk.":[59]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}