{"id":"https://openalex.org/W2742342371","doi":"https://doi.org/10.1145/3097983.3098157","title":"AESOP","display_name":"AESOP","publication_year":2017,"publication_date":"2017-08-04","ids":{"openalex":"https://openalex.org/W2742342371","doi":"https://doi.org/10.1145/3097983.3098157","mag":"2742342371"},"language":"en","primary_location":{"id":"doi:10.1145/3097983.3098157","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3097983.3098157","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 23rd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111662075","display_name":"Supratim Deb","orcid":null},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Supratim Deb","raw_affiliation_strings":["AT&T Labs, Bedminister, NJ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AT&T Labs, Bedminister, NJ, USA","institution_ids":["https://openalex.org/I1283103587"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076892155","display_name":"Zihui Ge","orcid":"https://orcid.org/0000-0003-0114-7584"},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zihui Ge","raw_affiliation_strings":["AT&T Labs, Bedminister, NJ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AT&T Labs, Bedminister, NJ, USA","institution_ids":["https://openalex.org/I1283103587"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108446102","display_name":"Sastry Isukapalli","orcid":null},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sastry Isukapalli","raw_affiliation_strings":["AT&T Labs, Bedminister, NJ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AT&T Labs, Bedminister, NJ, USA","institution_ids":["https://openalex.org/I1283103587"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045107677","display_name":"S. Puthenpura","orcid":null},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sarat Puthenpura","raw_affiliation_strings":["AT&T Labs, Bedminister, NJ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AT&T Labs, Bedminister, NJ, USA","institution_ids":["https://openalex.org/I1283103587"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079497548","display_name":"Shobha Venkataraman","orcid":null},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shobha Venkataraman","raw_affiliation_strings":["AT&T Labs, Bedminister, NJ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AT&T Labs, Bedminister, NJ, USA","institution_ids":["https://openalex.org/I1283103587"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102791255","display_name":"He Yan","orcid":"https://orcid.org/0009-0001-9990-9358"},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"He Yan","raw_affiliation_strings":["AT&T Labs, Bedminister, NJ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AT&T Labs, Bedminister, NJ, USA","institution_ids":["https://openalex.org/I1283103587"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077473264","display_name":"Jennifer Yates","orcid":null},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jennifer Yates","raw_affiliation_strings":["AT&T Labs, Bedminister, NJ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AT&T Labs, Bedminister, NJ, USA","institution_ids":["https://openalex.org/I1283103587"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1283103587"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1783","last_page":"1792"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10400","display_name":"Network Security and Intrusion Detection","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.7385431528091431},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6317555904388428},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.540673553943634},{"id":"https://openalex.org/keywords/service","display_name":"Service (business)","score":0.5198264718055725},{"id":"https://openalex.org/keywords/quality-of-service","display_name":"Quality of service","score":0.5190163850784302},{"id":"https://openalex.org/keywords/service-quality","display_name":"Service quality","score":0.4439045786857605},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.37455877661705017},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.35578954219818115},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.27396631240844727},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24491462111473083},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.10880264639854431}],"concepts":[{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.7385431528091431},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6317555904388428},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.540673553943634},{"id":"https://openalex.org/C2780378061","wikidata":"https://www.wikidata.org/wiki/Q25351891","display_name":"Service (business)","level":2,"score":0.5198264718055725},{"id":"https://openalex.org/C5119721","wikidata":"https://www.wikidata.org/wiki/Q220501","display_name":"Quality of service","level":2,"score":0.5190163850784302},{"id":"https://openalex.org/C140781008","wikidata":"https://www.wikidata.org/wiki/Q1221081","display_name":"Service quality","level":3,"score":0.4439045786857605},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.37455877661705017},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.35578954219818115},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.27396631240844727},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24491462111473083},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.10880264639854431},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C162853370","wikidata":"https://www.wikidata.org/wiki/Q39809","display_name":"Marketing","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3097983.3098157","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3097983.3098157","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 23rd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1904710828","https://openalex.org/W2024046085","https://openalex.org/W2085533912","https://openalex.org/W2104618058","https://openalex.org/W2121511513","https://openalex.org/W2131389289","https://openalex.org/W2143887693","https://openalex.org/W2157578436","https://openalex.org/W2158698691","https://openalex.org/W2216268987","https://openalex.org/W2480346368","https://openalex.org/W2508465325","https://openalex.org/W2509298940","https://openalex.org/W2546571074","https://openalex.org/W2562162676","https://openalex.org/W4250589301"],"related_works":["https://openalex.org/W2050679837","https://openalex.org/W2360066791","https://openalex.org/W1608069547","https://openalex.org/W2329452785","https://openalex.org/W2356380379","https://openalex.org/W2810716635","https://openalex.org/W2364562957","https://openalex.org/W3027915305","https://openalex.org/W2364808845","https://openalex.org/W2363925233"],"abstract_inverted_index":{"Efficient":[0],"management":[1],"and":[2,6,29,65,77,84,107],"control":[3],"of":[4,10,35,55,81],"modern":[5],"next-gen":[7],"networks":[8,14],"is":[9,39,49,67,93],"paramount":[11],"importance":[12],"as":[13,123,128],"have":[15],"to":[16,51,97,100,103,116,125],"maintain":[17],"highly":[18],"reliable":[19],"service":[20,37,46],"quality":[21],"whilst":[22],"supporting":[23],"rapid":[24,53,74],"growth":[25],"in":[26,43,114],"traffic":[27],"demand":[28],"new":[30],"application":[31],"services.":[32],"Rapid":[33],"mitigation":[34,54,109],"network":[36,60],"degradations":[38],"a":[40],"key":[41],"factor":[42],"delivering":[44],"high":[45],"quality.":[47],"Automation":[48],"vital":[50],"achieving":[52],"issues,":[56],"particularly":[57],"at":[58],"the":[59,63,68,73,88,117],"edge":[61],"where":[62],"scale":[64],"diversity":[66],"greatest.":[69],"This":[70],"automation":[71],"involves":[72],"detection,":[75],"localization":[76],"(where":[78],"possible)":[79],"repair":[80],"service-impacting":[82],"faults":[83],"performance":[85],"impairments.":[86],"However,":[87],"most":[89],"significant":[90],"challenge":[91],"here":[92],"knowing":[94],"what":[95,108],"events":[96,102],"detect,":[98],"how":[99],"correlate":[101],"localize":[104],"an":[105],"issue":[106],"actions":[110],"should":[111],"be":[112],"performed":[113],"response":[115],"identified":[118],"issues.":[119],"These":[120],"are":[121],"defined":[122],"policies":[124],"systems":[126],"such":[127],"ECOMP.":[129]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2017-08-17T00:00:00"}