{"id":"https://openalex.org/W2752142607","doi":"https://doi.org/10.1145/3084684","title":"Optimal Don\u2019t Care Filling for Minimizing Peak Toggles During At-Speed Stuck-At Testing","display_name":"Optimal Don\u2019t Care Filling for Minimizing Peak Toggles During At-Speed Stuck-At Testing","publication_year":2017,"publication_date":"2017-08-31","ids":{"openalex":"https://openalex.org/W2752142607","doi":"https://doi.org/10.1145/3084684","mag":"2752142607"},"language":"en","primary_location":{"id":"doi:10.1145/3084684","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3084684","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075796173","display_name":"A. Satya Trinadh","orcid":null},"institutions":[{"id":"https://openalex.org/I65181880","display_name":"Indian Institute of Technology Hyderabad","ror":"https://ror.org/01j4v3x97","country_code":"IN","type":"education","lineage":["https://openalex.org/I65181880"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"A. Satya Trinadh","raw_affiliation_strings":["Department of Computer Science and Engineering, IIT Hyderabad, Telangana, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, IIT Hyderabad, Telangana, India","institution_ids":["https://openalex.org/I65181880"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086738589","display_name":"Seetal Potluri","orcid":"https://orcid.org/0000-0002-4054-7743"},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"education","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Seetal Potluri","raw_affiliation_strings":["Department of Electrical Engineering, IIT Madras, Chennai, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, IIT Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Sobhan Babu Ch.","orcid":null},"institutions":[{"id":"https://openalex.org/I65181880","display_name":"Indian Institute of Technology Hyderabad","ror":"https://ror.org/01j4v3x97","country_code":"IN","type":"education","lineage":["https://openalex.org/I65181880"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sobhan Babu Ch.","raw_affiliation_strings":["Department of Computer Science and Engineering, IIT Hyderabad, Telangana, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, IIT Hyderabad, Telangana, India","institution_ids":["https://openalex.org/I65181880"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010004459","display_name":"V. Kamakoti","orcid":null},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"education","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"V. Kamakoti","raw_affiliation_strings":["Department of Computer Science and Engineering, IIT Madras, Chennai, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, IIT Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113891705","display_name":"Shiv Govind Singh","orcid":null},"institutions":[{"id":"https://openalex.org/I65181880","display_name":"Indian Institute of Technology Hyderabad","ror":"https://ror.org/01j4v3x97","country_code":"IN","type":"education","lineage":["https://openalex.org/I65181880"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Shiv Govind Singh","raw_affiliation_strings":["Department of Electrical Engineering, IIT Hyderabad, Telangana, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, IIT Hyderabad, Telangana, India","institution_ids":["https://openalex.org/I65181880"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4474,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.61569005,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"23","issue":"1","first_page":"1","last_page":"26"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7192153334617615},{"id":"https://openalex.org/keywords/minification","display_name":"Minification","score":0.6226441860198975},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.5269665718078613},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5209585428237915},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.4845249056816101},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4501667618751526},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4427379071712494},{"id":"https://openalex.org/keywords/voltage-droop","display_name":"Voltage droop","score":0.426002562046051},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4172624349594116},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19478854537010193},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14435318112373352}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7192153334617615},{"id":"https://openalex.org/C147764199","wikidata":"https://www.wikidata.org/wiki/Q6865248","display_name":"Minification","level":2,"score":0.6226441860198975},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.5269665718078613},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5209585428237915},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.4845249056816101},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4501667618751526},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4427379071712494},{"id":"https://openalex.org/C40760162","wikidata":"https://www.wikidata.org/wiki/Q10920295","display_name":"Voltage droop","level":4,"score":0.426002562046051},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4172624349594116},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19478854537010193},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14435318112373352},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/3084684","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3084684","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"},{"id":"pmh:oai:raiith.iith.ac.in:3522","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306400292","display_name":"Research Archive of Indian Institute of Technology Hyderabad (Indian Institute of Technology Hyderabad)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I65181880","host_organization_name":"Indian Institute of Technology Hyderabad","host_organization_lineage":["https://openalex.org/I65181880"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Life in Land","score":0.4300000071525574,"id":"https://metadata.un.org/sdg/15"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1479863711","https://openalex.org/W1561562902","https://openalex.org/W1568407911","https://openalex.org/W1924975623","https://openalex.org/W1966908388","https://openalex.org/W1979037587","https://openalex.org/W1995945236","https://openalex.org/W1999775506","https://openalex.org/W2012053559","https://openalex.org/W2049310936","https://openalex.org/W2079077276","https://openalex.org/W2095754347","https://openalex.org/W2104713752","https://openalex.org/W2106303764","https://openalex.org/W2110164501","https://openalex.org/W2110232289","https://openalex.org/W2113862323","https://openalex.org/W2116220383","https://openalex.org/W2116900507","https://openalex.org/W2119826888","https://openalex.org/W2125734620","https://openalex.org/W2126152478","https://openalex.org/W2126641963","https://openalex.org/W2128750402","https://openalex.org/W2130903991","https://openalex.org/W2132188866","https://openalex.org/W2132733952","https://openalex.org/W2133640956","https://openalex.org/W2135936250","https://openalex.org/W2137179556","https://openalex.org/W2141568925","https://openalex.org/W2155630219","https://openalex.org/W2156747864","https://openalex.org/W2157472099","https://openalex.org/W2196330920","https://openalex.org/W3148190347"],"related_works":["https://openalex.org/W2913126688","https://openalex.org/W2050523103","https://openalex.org/W2385471027","https://openalex.org/W1517016735","https://openalex.org/W2493193322","https://openalex.org/W2051339649","https://openalex.org/W2140497172","https://openalex.org/W2752142607","https://openalex.org/W3041803904","https://openalex.org/W2098878150"],"abstract_inverted_index":{"Due":[0],"to":[1,28,39,82,112,155,225,246,272],"the":[2,8,72,76,87,91,123,145,159,172,204,210,217,249,258],"increase":[3],"in":[4,7,216,252],"manufacturing/environmental":[5],"uncertainties":[6],"nanometer":[9],"regime,":[10],"testing":[11,58,121],"digital":[12],"chips":[13],"under":[14,122],"different":[15],"operating":[16],"conditions":[17],"becomes":[18],"mandatory.":[19],"Traditionally,":[20],"stuck-at":[21,57,99,120,292],"tests":[22,35],"were":[23,36],"applied":[24,37],"at":[25],"slow":[26],"speed":[27],"detect":[29,40],"structural":[30],"defects":[31,50],"and":[32,79,163,264],"transition":[33],"fault":[34],"at-speed":[38,56,98,119,291],"delay":[41,84],"defects.":[42],"Recently,":[43],"it":[44],"was":[45],"shown":[46],"that":[47,203,209],"certain":[48],"cell-internal":[49],"can":[51],"only":[52],"be":[53],"detected":[54],"using":[55,262],".":[59],"Stuck-at":[60],"test":[61,77,135,185,221],"patterns":[62],"are":[63,137,187,213],"power":[64,73,95,116,242,288],"hungry,":[65],"thereby":[66,223],"causing":[67],"excessive":[68],"voltage":[69],"droop":[70],"on":[71,86,237],"grid,":[74],"delaying":[75],"response,":[78],"finally":[80],"leading":[81,224],"false":[83],"failures":[85],"tester.":[88],"This":[89],"motivates":[90],"need":[92],"for":[93,150,171,179,285],"peak":[94,151,241,287],"minimization":[96,108,154,280],"during":[97,118,290],"testing.":[100,293],"In":[101],"this":[102,142],"article,":[103],"we":[104,193],"use":[105],"input":[106,152,227,278],"toggle":[107,153,228,279],"as":[109,281],"a":[110,114,156,165,176,195],"means":[111],"minimize":[113],"circuit\u2019s":[115],"dissipation":[117,289],"Combinational":[124],"State":[125],"Preservation":[126],"scan":[127],"(CSP-scan)":[128],"Design-For-Testability":[129],"(DFT)":[130],"scheme.":[131],"For":[132,182],"circuits":[133,183],"whose":[134,184],"sets":[136,186],"dominated":[138,189],"by":[139,190],"don\u2019t":[140,191,211],"cares,":[141,192],"article":[143],"maps":[144],"problem":[146,162],"of":[147,158,220,244,276],"optimal":[148,277],"X-filling":[149],"variant":[157],"interval":[160],"coloring":[161],"proposes":[164],"Dynamic":[166],"Programming":[167],"(DP)":[168],"algorithm":[169],"(DP-fill)":[170],"same":[173],"along":[174],"with":[175,268],"theoretical":[177],"proof":[178],"its":[180],"optimality.":[181],"not":[188],"propose":[194],"max":[196],"scatter":[197],"Hamiltonian":[198],"path":[199],"algorithm,":[200],"which":[201],"ensures":[202],"ordering":[205,219],"is":[206],"done":[207],"such":[208],"cares":[212],"evenly":[214],"distributed":[215],"final":[218],"cubes,":[222],"better":[226],"savings":[229,243],"than":[230],"DP-fill.":[231],"The":[232],"proposed":[233],"algorithms,":[234],"when":[235],"experimented":[236],"ITC99":[238],"benchmarks,":[239],"produced":[240],"up":[245],"48%":[247],"over":[248],"best-known":[250],"algorithms":[251],"literature.":[253],"We":[254],"have":[255],"also":[256],"pruned":[257],"solutions":[259],"thus":[260],"obtained":[261],"Greedy":[263],"Simulated":[265],"Annealing":[266],"strategies":[267],"iterative":[269],"1-bit":[270],"neighborhood":[271],"validate":[273],"our":[274],"idea":[275],"an":[282],"effective":[283],"technique":[284],"minimizing":[286]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}