{"id":"https://openalex.org/W2625568424","doi":"https://doi.org/10.1145/3061639.3062235","title":"Efficient Hierarchical Performance Modeling for Integrated Circuits via Bayesian Co-Learning","display_name":"Efficient Hierarchical Performance Modeling for Integrated Circuits via Bayesian Co-Learning","publication_year":2017,"publication_date":"2017-06-13","ids":{"openalex":"https://openalex.org/W2625568424","doi":"https://doi.org/10.1145/3061639.3062235","mag":"2625568424"},"language":"en","primary_location":{"id":"doi:10.1145/3061639.3062235","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3061639.3062235","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 54th Annual Design Automation Conference 2017","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038501242","display_name":"Mohamed Baker Alawieh","orcid":"https://orcid.org/0000-0002-3546-0336"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Mohamad Alawieh","raw_affiliation_strings":["Electrical and Computer Engineering Department, Carnegie Mellon University, Pittsburgh, PA, USA"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100702415","display_name":"Fa Wang","orcid":"https://orcid.org/0000-0002-8117-1914"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fa Wang","raw_affiliation_strings":["Electrical and Computer Engineering Department, Carnegie Mellon University, Pittsburgh, PA, USA"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100353869","display_name":"Xin Li","orcid":"https://orcid.org/0000-0002-4510-2436"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xin Li","raw_affiliation_strings":["Electrical and Computer Engineering Department, Carnegie Mellon University, Pittsburgh, PA, USA"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5038501242"],"corresponding_institution_ids":["https://openalex.org/I74973139"],"apc_list":null,"apc_paid":null,"fwci":1.1341,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.78485812,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7747560143470764},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.6352648735046387},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.5515770316123962},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.469772070646286},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.46006906032562256},{"id":"https://openalex.org/keywords/hierarchical-database-model","display_name":"Hierarchical database model","score":0.4499160945415497},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4392551779747009},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.24551990628242493},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08136233687400818}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7747560143470764},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.6352648735046387},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.5515770316123962},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.469772070646286},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.46006906032562256},{"id":"https://openalex.org/C144986985","wikidata":"https://www.wikidata.org/wiki/Q871236","display_name":"Hierarchical database model","level":2,"score":0.4499160945415497},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4392551779747009},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.24551990628242493},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08136233687400818},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3061639.3062235","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3061639.3062235","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 54th Annual Design Automation Conference 2017","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1506806321","https://openalex.org/W1970441097","https://openalex.org/W1989728241","https://openalex.org/W1996546647","https://openalex.org/W1998752433","https://openalex.org/W2009086942","https://openalex.org/W2020519026","https://openalex.org/W2040556057","https://openalex.org/W2049039038","https://openalex.org/W2052409107","https://openalex.org/W2053430356","https://openalex.org/W2079965673","https://openalex.org/W2092773574","https://openalex.org/W2100992121","https://openalex.org/W2102649620","https://openalex.org/W2105980164","https://openalex.org/W2110073735","https://openalex.org/W2112894859","https://openalex.org/W2127271355","https://openalex.org/W2137626494","https://openalex.org/W2141004763","https://openalex.org/W2155811837","https://openalex.org/W2169797000","https://openalex.org/W2296319761","https://openalex.org/W2403278033","https://openalex.org/W4235099732","https://openalex.org/W4236314258","https://openalex.org/W4252410013","https://openalex.org/W4297970750","https://openalex.org/W6602211964"],"related_works":["https://openalex.org/W17155033","https://openalex.org/W3207760230","https://openalex.org/W1496222301","https://openalex.org/W1590307681","https://openalex.org/W2536018345","https://openalex.org/W4312814274","https://openalex.org/W4285370786","https://openalex.org/W2296488620","https://openalex.org/W2358353312","https://openalex.org/W2353836703"],"abstract_inverted_index":{"With":[0],"the":[1,36,96,106],"continuous":[2],"drive":[3],"towards":[4],"integrated":[5],"circuits":[6],"scaling,":[7],"efficient":[8],"performance":[9,28,89],"modeling":[10,29,55,108],"is":[11],"becoming":[12],"more":[13,16],"crucial":[14],"yet,":[15],"challenging.":[17],"In":[18],"this":[19],"paper,":[20],"we":[21],"propose":[22],"a":[23,40,44,67,75,88],"novel":[24],"method":[25,64],"of":[26,39,70,78],"hierarchical":[27,37],"based":[30],"on":[31],"Bayesian":[32,45],"co-learning.":[33],"We":[34],"exploit":[35],"structure":[38],"circuit":[41],"to":[42,53,85,101],"establish":[43],"framework":[46],"where":[47],"unlabeled":[48,79],"data":[49],"samples":[50,80],"are":[51],"generated":[52],"improve":[54],"accuracy":[56],"without":[57,110],"running":[58],"additional":[59],"simulation.":[60],"Consequently,":[61],"our":[62],"proposed":[63,97],"only":[65],"requires":[66],"small":[68],"number":[69,77],"labeled":[71],"samples,":[72],"along":[73],"with":[74],"large":[76],"obtained":[81],"at":[82],"almost":[83],"no-cost,":[84],"accurately":[86],"learn":[87],"model.":[90],"Our":[91],"numerical":[92],"experiments":[93],"demonstrate":[94],"that":[95],"approach":[98],"achieves":[99],"up":[100],"3.66x":[102],"runtime":[103],"speed-up":[104],"over":[105],"state-of-the-art":[107],"technique":[109],"surrendering":[111],"any":[112],"accuracy.":[113]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}