{"id":"https://openalex.org/W2536042654","doi":"https://doi.org/10.1145/2966986.2967029","title":"Efficient statistical analysis for correlated rare failure events via asymptotic probability approximation","display_name":"Efficient statistical analysis for correlated rare failure events via asymptotic probability approximation","publication_year":2016,"publication_date":"2016-10-18","ids":{"openalex":"https://openalex.org/W2536042654","doi":"https://doi.org/10.1145/2966986.2967029","mag":"2536042654"},"language":"en","primary_location":{"id":"doi:10.1145/2966986.2967029","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2966986.2967029","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 35th International Conference on Computer-Aided Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052581595","display_name":"Handi Yu","orcid":"https://orcid.org/0000-0002-4904-8991"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Handi Yu","raw_affiliation_strings":["Fudan University, Shanghai, China","ASIC & System State Key Lab, Dept. of Microelectronics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"ASIC & System State Key Lab, Dept. of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062927280","display_name":"Jun Tao","orcid":"https://orcid.org/0000-0001-8742-687X"},"institutions":[{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Tao","raw_affiliation_strings":["Fudan University, Shanghai, China","ASIC & System State Key Lab, Dept. of Microelectronics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"ASIC & System State Key Lab, Dept. of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057721115","display_name":"Changhai Liao","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changhai Liao","raw_affiliation_strings":["Fudan University, Shanghai, China","ASIC & System State Key Lab, Dept. of Microelectronics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"ASIC & System State Key Lab, Dept. of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101680116","display_name":"Yangfeng Su","orcid":"https://orcid.org/0000-0002-8744-1591"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yangfeng Su","raw_affiliation_strings":["Fudan University, Shanghai, China","School of Mathematical Sciences, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"School of Mathematical Sciences, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054960059","display_name":"Dian Zhou","orcid":"https://orcid.org/0000-0002-2648-5232"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dian Zhou","raw_affiliation_strings":["Fudan University, Shanghai, China and University of Texas at Dallas","ASIC & System State Key Lab, Dept. of Microelectronics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Fudan University, Shanghai, China and University of Texas at Dallas","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"ASIC & System State Key Lab, Dept. of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064213921","display_name":"Xuan Zeng","orcid":"https://orcid.org/0000-0002-8097-4053"},"institutions":[{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuan Zeng","raw_affiliation_strings":["Fudan University, Shanghai, China","ASIC & System State Key Lab, Dept. of Microelectronics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"ASIC & System State Key Lab, Dept. of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100353869","display_name":"Xin Li","orcid":"https://orcid.org/0000-0002-4510-2436"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xin Li","raw_affiliation_strings":["Carnegie Mellon University","Dept. of ECE, Carnegie Mellon University, Pittsburgh, USA"],"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University","institution_ids":["https://openalex.org/I74973139"]},{"raw_affiliation_string":"Dept. of ECE, Carnegie Mellon University, Pittsburgh, USA","institution_ids":["https://openalex.org/I74973139"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5052581595"],"corresponding_institution_ids":["https://openalex.org/I24943067","https://openalex.org/I4210132426"],"apc_list":null,"apc_paid":null,"fwci":1.1026,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.80743214,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.7285802960395813},{"id":"https://openalex.org/keywords/confidence-interval","display_name":"Confidence interval","score":0.5363145470619202},{"id":"https://openalex.org/keywords/random-variable","display_name":"Random variable","score":0.535264253616333},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.4903152287006378},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4813750088214874},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4580248296260834},{"id":"https://openalex.org/keywords/rare-events","display_name":"Rare events","score":0.4517856538295746},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.44360631704330444},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.3811541199684143},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.37101107835769653},{"id":"https://openalex.org/keywords/applied-mathematics","display_name":"Applied mathematics","score":0.33447736501693726}],"concepts":[{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.7285802960395813},{"id":"https://openalex.org/C44249647","wikidata":"https://www.wikidata.org/wiki/Q208498","display_name":"Confidence interval","level":2,"score":0.5363145470619202},{"id":"https://openalex.org/C122123141","wikidata":"https://www.wikidata.org/wiki/Q176623","display_name":"Random variable","level":2,"score":0.535264253616333},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.4903152287006378},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4813750088214874},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4580248296260834},{"id":"https://openalex.org/C2777317252","wikidata":"https://www.wikidata.org/wiki/Q18393516","display_name":"Rare events","level":2,"score":0.4517856538295746},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.44360631704330444},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.3811541199684143},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.37101107835769653},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.33447736501693726},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2966986.2967029","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2966986.2967029","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 35th International Conference on Computer-Aided Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1821426037","display_name":null,"funder_award_id":"1115556 and CCF-1316363","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1667165204","https://openalex.org/W1969390180","https://openalex.org/W1970248392","https://openalex.org/W1975331880","https://openalex.org/W1980147245","https://openalex.org/W1988698377","https://openalex.org/W1997140745","https://openalex.org/W1999091229","https://openalex.org/W2033246483","https://openalex.org/W2067378304","https://openalex.org/W2071764978","https://openalex.org/W2092478972","https://openalex.org/W2113613740","https://openalex.org/W2119312496","https://openalex.org/W2130282462","https://openalex.org/W2132621842","https://openalex.org/W2168101540","https://openalex.org/W2169286256","https://openalex.org/W3151880060","https://openalex.org/W4243669666"],"related_works":["https://openalex.org/W4392590355","https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W2109451123","https://openalex.org/W4378977321","https://openalex.org/W1976168335","https://openalex.org/W3211992815","https://openalex.org/W179354024"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3,26,50,73],"novel":[4],"Asymptotic":[5],"Probability":[6],"Approximation":[7],"(APA)":[8],"method":[9,63],"is":[10,40,64,76],"proposed":[11,78],"to":[12,41,66,79],"estimate":[13,80],"the":[14,43,68,81,97],"overall":[15,44,98],"rare":[16,103],"probability":[17],"of":[18,29,38,52,84,101],"correlated":[19,102],"failure":[20,46,55,70,99,104],"events":[21,105],"for":[22],"complex":[23],"circuits":[24],"containing":[25],"large":[27],"number":[28],"replicated":[30],"cells":[31],"(e.g.,":[32],"SRAM":[33],"bit-cells).":[34],"The":[35],"key":[36],"idea":[37],"APA":[39,91],"approximate":[42],"circuit":[45],"rate":[47,71,100],"based":[48],"on":[49],"set":[51],"carefully":[53],"defined":[54],"events.":[56],"An":[57],"efficient":[58],"Hierarchal":[59],"Subset":[60],"Simulation":[61],"(H-SUS)":[62],"developed":[65],"calculate":[67],"aforementioned":[69],"and":[72,94],"statistical":[74],"methodology":[75],"further":[77],"confidence":[82],"interval":[83],"APA.":[85],"Our":[86],"numerical":[87],"experiments":[88],"demonstrate":[89],"that":[90],"can":[92],"accurately":[93],"reliably":[95],"estimates":[96],"involving":[106],"more":[107],"than":[108],"20,000":[109],"independent":[110],"random":[111],"variables.":[112]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}