{"id":"https://openalex.org/W2527651326","doi":"https://doi.org/10.1145/2934466.2966351","title":"Dynamic analysis of shared execution in software product line testing","display_name":"Dynamic analysis of shared execution in software product line testing","publication_year":2016,"publication_date":"2016-09-16","ids":{"openalex":"https://openalex.org/W2527651326","doi":"https://doi.org/10.1145/2934466.2966351","mag":"2527651326"},"language":"en","primary_location":{"id":"doi:10.1145/2934466.2966351","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2934466.2966351","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 20th International Systems and Software Product Line Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036039721","display_name":"Bo Wang","orcid":"https://orcid.org/0000-0002-1848-0167"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Bo Wang","raw_affiliation_strings":["Peking University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5036039721"],"corresponding_institution_ids":["https://openalex.org/I20231570"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.06212936,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"340","last_page":"341"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10639","display_name":"Advanced Software Engineering Methodologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10639","display_name":"Advanced Software Engineering Methodologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10933","display_name":"Real-Time Systems Scheduling","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/software-product-line","display_name":"Software product line","score":0.7537262439727783},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6645785570144653},{"id":"https://openalex.org/keywords/software-performance-testing","display_name":"Software performance testing","score":0.5972886085510254},{"id":"https://openalex.org/keywords/product-line","display_name":"Product line","score":0.5302096605300903},{"id":"https://openalex.org/keywords/system-integration-testing","display_name":"System integration testing","score":0.5297772884368896},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.5094993710517883},{"id":"https://openalex.org/keywords/software-testing","display_name":"Software testing","score":0.5080265998840332},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.502777099609375},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4679884612560272},{"id":"https://openalex.org/keywords/non-regression-testing","display_name":"Non-regression testing","score":0.4478156566619873},{"id":"https://openalex.org/keywords/black-box-testing","display_name":"Black-box testing","score":0.43940481543540955},{"id":"https://openalex.org/keywords/orthogonal-array-testing","display_name":"Orthogonal array testing","score":0.4341157078742981},{"id":"https://openalex.org/keywords/test-strategy","display_name":"Test strategy","score":0.43327295780181885},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.4306163489818573},{"id":"https://openalex.org/keywords/system-testing","display_name":"System testing","score":0.4245184659957886},{"id":"https://openalex.org/keywords/white-box-testing","display_name":"White-box testing","score":0.41318416595458984},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.4125424027442932},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.4112279415130615},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.39663589000701904},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3915456533432007},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.24777886271476746},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1813964545726776},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.06472840905189514}],"concepts":[{"id":"https://openalex.org/C2778177629","wikidata":"https://www.wikidata.org/wiki/Q2111823","display_name":"Software product line","level":4,"score":0.7537262439727783},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6645785570144653},{"id":"https://openalex.org/C178059732","wikidata":"https://www.wikidata.org/wiki/Q1982529","display_name":"Software performance testing","level":5,"score":0.5972886085510254},{"id":"https://openalex.org/C2988046880","wikidata":"https://www.wikidata.org/wiki/Q3084961","display_name":"Product line","level":2,"score":0.5302096605300903},{"id":"https://openalex.org/C111524372","wikidata":"https://www.wikidata.org/wiki/Q7663718","display_name":"System integration testing","level":5,"score":0.5297772884368896},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.5094993710517883},{"id":"https://openalex.org/C2984328558","wikidata":"https://www.wikidata.org/wiki/Q188522","display_name":"Software testing","level":3,"score":0.5080265998840332},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.502777099609375},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4679884612560272},{"id":"https://openalex.org/C86469151","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Non-regression testing","level":5,"score":0.4478156566619873},{"id":"https://openalex.org/C24169984","wikidata":"https://www.wikidata.org/wiki/Q879969","display_name":"Black-box testing","level":5,"score":0.43940481543540955},{"id":"https://openalex.org/C158324730","wikidata":"https://www.wikidata.org/wiki/Q54862604","display_name":"Orthogonal array testing","level":5,"score":0.4341157078742981},{"id":"https://openalex.org/C188598960","wikidata":"https://www.wikidata.org/wiki/Q7705805","display_name":"Test strategy","level":3,"score":0.43327295780181885},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.4306163489818573},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.4245184659957886},{"id":"https://openalex.org/C162443782","wikidata":"https://www.wikidata.org/wiki/Q1066228","display_name":"White-box testing","level":5,"score":0.41318416595458984},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.4125424027442932},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.4112279415130615},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.39663589000701904},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3915456533432007},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.24777886271476746},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1813964545726776},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.06472840905189514},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2934466.2966351","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2934466.2966351","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 20th International Systems and Software Product Line Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.6399999856948853}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2004248182","https://openalex.org/W2112025128","https://openalex.org/W2120280318","https://openalex.org/W2120566171","https://openalex.org/W2170472255","https://openalex.org/W2172288767","https://openalex.org/W2392262895","https://openalex.org/W4250014727"],"related_works":["https://openalex.org/W2376559135","https://openalex.org/W2387992358","https://openalex.org/W3197709817","https://openalex.org/W3214776400","https://openalex.org/W2886756146","https://openalex.org/W17857273","https://openalex.org/W3009842397","https://openalex.org/W2183799055","https://openalex.org/W2376324434","https://openalex.org/W2098804367"],"abstract_inverted_index":{"Software":[0],"product":[1,28],"line":[2],"(SPL),":[3],"a":[4,13],"family-based":[5],"software":[6,19],"development":[7],"process,":[8],"has":[9],"proven":[10],"to":[11],"be":[12],"more":[14],"effective":[15],"technology":[16],"than":[17],"single":[18],"systems.":[20],"Testing":[21],"SPL":[22,37],"products":[23],"individually":[24],"is":[25,39],"redundant":[26],"for":[27],"lines":[29],"testing.":[30],"Meanwhile,":[31],"the":[32,43],"complexity":[33],"of":[34,45],"systematically":[35],"testing":[36,46],"programs":[38],"combinatorial,":[40],"which":[41],"limits":[42],"scalability":[44],"SPL.":[47]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}