{"id":"https://openalex.org/W2398827161","doi":"https://doi.org/10.1145/2897937.2898072","title":"Probabilistic bug-masking analysis for post-silicon tests in microprocessor verification","display_name":"Probabilistic bug-masking analysis for post-silicon tests in microprocessor verification","publication_year":2016,"publication_date":"2016-05-25","ids":{"openalex":"https://openalex.org/W2398827161","doi":"https://doi.org/10.1145/2897937.2898072","mag":"2398827161"},"language":"en","primary_location":{"id":"doi:10.1145/2897937.2898072","is_oa":true,"landing_page_url":"https://doi.org/10.1145/2897937.2898072","pdf_url":"http://dl.acm.org/ft_gateway.cfm?id=2898072&type=pdf","source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 53rd Annual Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"http://dl.acm.org/ft_gateway.cfm?id=2898072&type=pdf","any_repository_has_fulltext":null},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068356978","display_name":"Doowon Lee","orcid":"https://orcid.org/0000-0001-6635-5953"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Doowon Lee","raw_affiliation_strings":["University of Michigan"],"affiliations":[{"raw_affiliation_string":"University of Michigan","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004166192","display_name":"Tom Kolan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210167297","display_name":"IBM Research - Haifa","ror":"https://ror.org/05rw9t746","country_code":"IL","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210167297"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Tom Kolan","raw_affiliation_strings":["IBM Research, Haifa"],"affiliations":[{"raw_affiliation_string":"IBM Research, Haifa","institution_ids":["https://openalex.org/I4210167297"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034159041","display_name":"Arkadiy Morgenshtein","orcid":null},"institutions":[{"id":"https://openalex.org/I4210167297","display_name":"IBM Research - Haifa","ror":"https://ror.org/05rw9t746","country_code":"IL","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210167297"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Arkadiy Morgenshtein","raw_affiliation_strings":["IBM Research, Haifa"],"affiliations":[{"raw_affiliation_string":"IBM Research, Haifa","institution_ids":["https://openalex.org/I4210167297"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058832650","display_name":"Vitali Sokhin","orcid":null},"institutions":[{"id":"https://openalex.org/I4210167297","display_name":"IBM Research - Haifa","ror":"https://ror.org/05rw9t746","country_code":"IL","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210167297"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Vitali Sokhin","raw_affiliation_strings":["IBM Research, Haifa"],"affiliations":[{"raw_affiliation_string":"IBM Research, Haifa","institution_ids":["https://openalex.org/I4210167297"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078990888","display_name":"Ronny Morad","orcid":null},"institutions":[{"id":"https://openalex.org/I4210167297","display_name":"IBM Research - Haifa","ror":"https://ror.org/05rw9t746","country_code":"IL","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210167297"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Ronny Morad","raw_affiliation_strings":["IBM Research, Haifa"],"affiliations":[{"raw_affiliation_string":"IBM Research, Haifa","institution_ids":["https://openalex.org/I4210167297"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041046910","display_name":"Avi Ziv","orcid":"https://orcid.org/0000-0002-6309-250X"},"institutions":[{"id":"https://openalex.org/I4210167297","display_name":"IBM Research - Haifa","ror":"https://ror.org/05rw9t746","country_code":"IL","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210167297"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Avi Ziv","raw_affiliation_strings":["IBM Research, Haifa"],"affiliations":[{"raw_affiliation_string":"IBM Research, Haifa","institution_ids":["https://openalex.org/I4210167297"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030335506","display_name":"Valeria Bertacco","orcid":"https://orcid.org/0000-0002-0319-3368"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Valeria Bertacco","raw_affiliation_strings":["University of Michigan"],"affiliations":[{"raw_affiliation_string":"University of Michigan","institution_ids":["https://openalex.org/I27837315"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5068356978"],"corresponding_institution_ids":["https://openalex.org/I27837315"],"apc_list":null,"apc_paid":null,"fwci":0.9295,"has_fulltext":true,"cited_by_count":5,"citation_normalized_percentile":{"value":0.77658331,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/observability","display_name":"Observability","score":0.8123989105224609},{"id":"https://openalex.org/keywords/software-bug","display_name":"Software bug","score":0.7934112548828125},{"id":"https://openalex.org/keywords/unobservable","display_name":"Unobservable","score":0.7022429704666138},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7016893625259399},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.6540914177894592},{"id":"https://openalex.org/keywords/masking","display_name":"Masking (illustration)","score":0.6447311639785767},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.5331377983093262},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.49380430579185486},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.2903282642364502},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.2336406111717224},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.22558116912841797},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.17452332377433777},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15137162804603577},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.12459319829940796},{"id":"https://openalex.org/keywords/econometrics","display_name":"Econometrics","score":0.07138228416442871}],"concepts":[{"id":"https://openalex.org/C36299963","wikidata":"https://www.wikidata.org/wiki/Q1369844","display_name":"Observability","level":2,"score":0.8123989105224609},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.7934112548828125},{"id":"https://openalex.org/C2780695315","wikidata":"https://www.wikidata.org/wiki/Q3799040","display_name":"Unobservable","level":2,"score":0.7022429704666138},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7016893625259399},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.6540914177894592},{"id":"https://openalex.org/C2777402240","wikidata":"https://www.wikidata.org/wiki/Q6783436","display_name":"Masking (illustration)","level":2,"score":0.6447311639785767},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.5331377983093262},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.49380430579185486},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2903282642364502},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.2336406111717224},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.22558116912841797},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.17452332377433777},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15137162804603577},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.12459319829940796},{"id":"https://openalex.org/C149782125","wikidata":"https://www.wikidata.org/wiki/Q160039","display_name":"Econometrics","level":1,"score":0.07138228416442871},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2897937.2898072","is_oa":true,"landing_page_url":"https://doi.org/10.1145/2897937.2898072","pdf_url":"http://dl.acm.org/ft_gateway.cfm?id=2898072&type=pdf","source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 53rd Annual Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1145/2897937.2898072","is_oa":true,"landing_page_url":"https://doi.org/10.1145/2897937.2898072","pdf_url":"http://dl.acm.org/ft_gateway.cfm?id=2898072&type=pdf","source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 53rd Annual Design Automation Conference","raw_type":"proceedings-article"},"sustainable_development_goals":[{"score":0.5,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[{"id":"https://openalex.org/G4887462507","display_name":null,"funder_award_id":"C-FAR","funder_id":"https://openalex.org/F4320306087","funder_display_name":"Semiconductor Research Corporation"},{"id":"https://openalex.org/G5613224033","display_name":null,"funder_award_id":"STARnet","funder_id":"https://openalex.org/F4320332180","funder_display_name":"Defense Advanced Research Projects Agency"},{"id":"https://openalex.org/G6811296919","display_name":null,"funder_award_id":"C-FAR","funder_id":"https://openalex.org/F4320332180","funder_display_name":"Defense Advanced Research Projects Agency"}],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"},{"id":"https://openalex.org/F4320332180","display_name":"Defense Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2398827161.pdf","grobid_xml":"https://content.openalex.org/works/W2398827161.grobid-xml"},"referenced_works_count":16,"referenced_works":["https://openalex.org/W1560028438","https://openalex.org/W1976197109","https://openalex.org/W1981504678","https://openalex.org/W2012262513","https://openalex.org/W2029313817","https://openalex.org/W2086311869","https://openalex.org/W2102970979","https://openalex.org/W2122049982","https://openalex.org/W2129278597","https://openalex.org/W2132362854","https://openalex.org/W2136932895","https://openalex.org/W2143849045","https://openalex.org/W2147657366","https://openalex.org/W2156591015","https://openalex.org/W2165566357","https://openalex.org/W4255519882"],"related_works":["https://openalex.org/W2046459260","https://openalex.org/W2614563012","https://openalex.org/W2149686805","https://openalex.org/W4294689033","https://openalex.org/W4226462367","https://openalex.org/W1978158123","https://openalex.org/W2967463586","https://openalex.org/W2082642870","https://openalex.org/W2378270039","https://openalex.org/W4246201196"],"abstract_inverted_index":{"Post-silicon":[0,16],"validation":[1,17],"has":[2],"become":[3],"essential":[4],"in":[5,67],"catching":[6],"hard-to-detect,":[7],"rarely-occurring":[8],"bugs":[9],"that":[10],"have":[11],"slipped":[12],"through":[13],"pre-silicon":[14],"verification.":[15],"flows,":[18],"however,":[19],"are":[20],"challenged":[21],"by":[22],"limited":[23],"signal":[24],"observability,":[25],"which":[26],"impacts":[27],"their":[28],"ability":[29,55],"of":[30,41,61],"diagnosing":[31],"and":[32,47],"detecting":[33],"bugs.":[34],"Indeed,":[35],"bug":[36],"manifestations":[37],"during":[38],"the":[39,51,58],"execution":[40],"constrained-random":[42],"tests":[43,72],"may":[44],"be":[45,48],"masked":[46],"unobservable":[49],"from":[50],"test's":[52],"outputs.":[53],"The":[54],"to":[56],"evaluate":[57],"bug-masking":[59],"rate":[60],"a":[62],"test":[63],"provides":[64],"great":[65],"value":[66],"generating":[68],"and/or":[69],"selecting":[70],"effective":[71],"for":[73],"high":[74],"coverage":[75],"regressions.":[76]},"counts_by_year":[{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1}],"updated_date":"2026-04-10T15:06:20.359241","created_date":"2025-10-10T00:00:00"}