{"id":"https://openalex.org/W2399407221","doi":"https://doi.org/10.1145/2897937.2897998","title":"Comprehensive optimization of scan chain timing during late-stage IC implementation","display_name":"Comprehensive optimization of scan chain timing during late-stage IC implementation","publication_year":2016,"publication_date":"2016-05-25","ids":{"openalex":"https://openalex.org/W2399407221","doi":"https://doi.org/10.1145/2897937.2897998","mag":"2399407221"},"language":"en","primary_location":{"id":"doi:10.1145/2897937.2897998","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2897937.2897998","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 53rd Annual Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024304785","display_name":"Kun Young Chung","orcid":null},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kun Young Chung","raw_affiliation_strings":["UC San Diego, La Jolla, CA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UC San Diego, La Jolla, CA","institution_ids":["https://openalex.org/I36258959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073558386","display_name":"Andrew B. Kahng","orcid":"https://orcid.org/0000-0002-4490-5018"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andrew B. Kahng","raw_affiliation_strings":["UC San Diego, La Jolla, CA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UC San Diego, La Jolla, CA","institution_ids":["https://openalex.org/I36258959"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100454287","display_name":"Jiajia Li","orcid":"https://orcid.org/0000-0002-3420-9764"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jiajia Li","raw_affiliation_strings":["UC San Diego, La Jolla, CA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UC San Diego, La Jolla, CA","institution_ids":["https://openalex.org/I36258959"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I36258959"],"apc_list":null,"apc_paid":null,"fwci":0.3204,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.5590243,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.86485356092453},{"id":"https://openalex.org/keywords/skew","display_name":"Skew","score":0.7483531832695007},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7177031636238098},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.47003525495529175},{"id":"https://openalex.org/keywords/timing-failure","display_name":"Timing failure","score":0.4657348692417145},{"id":"https://openalex.org/keywords/routing","display_name":"Routing (electronic design automation)","score":0.4440973699092865},{"id":"https://openalex.org/keywords/clock-skew","display_name":"Clock skew","score":0.41232725977897644},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3918249309062958},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.36333996057510376},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.3162921369075775},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.1446862816810608},{"id":"https://openalex.org/keywords/clock-signal","display_name":"Clock signal","score":0.10686740279197693}],"concepts":[{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.86485356092453},{"id":"https://openalex.org/C43711488","wikidata":"https://www.wikidata.org/wiki/Q7534783","display_name":"Skew","level":2,"score":0.7483531832695007},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7177031636238098},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.47003525495529175},{"id":"https://openalex.org/C104654189","wikidata":"https://www.wikidata.org/wiki/Q7806740","display_name":"Timing failure","level":5,"score":0.4657348692417145},{"id":"https://openalex.org/C74172769","wikidata":"https://www.wikidata.org/wiki/Q1446839","display_name":"Routing (electronic design automation)","level":2,"score":0.4440973699092865},{"id":"https://openalex.org/C60501442","wikidata":"https://www.wikidata.org/wiki/Q4382014","display_name":"Clock skew","level":4,"score":0.41232725977897644},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3918249309062958},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.36333996057510376},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.3162921369075775},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.1446862816810608},{"id":"https://openalex.org/C137059387","wikidata":"https://www.wikidata.org/wiki/Q426882","display_name":"Clock signal","level":3,"score":0.10686740279197693},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2897937.2897998","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2897937.2897998","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 53rd Annual Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1511008725","https://openalex.org/W1539964283","https://openalex.org/W1594216069","https://openalex.org/W1767514545","https://openalex.org/W1963977507","https://openalex.org/W1974368829","https://openalex.org/W2005714865","https://openalex.org/W2023991496","https://openalex.org/W2029575849","https://openalex.org/W2046490954","https://openalex.org/W2103423925","https://openalex.org/W2105200922","https://openalex.org/W2116957391","https://openalex.org/W2123380246","https://openalex.org/W2123862221","https://openalex.org/W2148790082","https://openalex.org/W2160843080","https://openalex.org/W2167428133","https://openalex.org/W2171905707","https://openalex.org/W2324108981","https://openalex.org/W2888824071","https://openalex.org/W3145605605"],"related_works":["https://openalex.org/W2116259070","https://openalex.org/W2123512677","https://openalex.org/W4232019485","https://openalex.org/W4327499872","https://openalex.org/W2164834710","https://openalex.org/W2128528443","https://openalex.org/W2028052815","https://openalex.org/W2066822161","https://openalex.org/W1866979339","https://openalex.org/W2771228069"],"abstract_inverted_index":{"Scan":[0],"chain":[1],"timing":[2,24,77,96],"is":[3,58],"increasingly":[4],"critical":[5],"to":[6,18,65,73,92,100],"test":[7],"time":[8],"and":[9,69,84,94,105],"product":[10],"cost.":[11],"However,":[12],"hold":[13,67,88],"buffer":[14],"insertions":[15],"(e.g.,":[16],"due":[17],"large":[19],"clock":[20],"skew)":[21],"limit":[22],"scan":[23,31,35,63,75],"improvement.":[25],"Dynamic":[26],"voltage":[27],"drop":[28],"(DVD)":[29],"during":[30],"shift":[32,36,76],"further":[33],"degrades":[34],"timing,":[37],"inducing":[38],"\"false":[39],"failures\"":[40],"in":[41,48],"silicon.":[42],"Hence,":[43],"new":[44],"optimizations":[45,80],"are":[46],"needed":[47],"late":[49],"stages":[50,86],"of":[51],"implementation":[52],"when":[53],"accurate":[54],"(skew,":[55],"DVD)":[56],"information":[57],"available.":[59],"We":[60],"propose":[61],"skew-aware":[62],"ordering":[64],"minimize":[66],"buffers,":[68],"DVD-aware":[70],"gating":[71],"insertion":[72],"improve":[74],"slacks.":[78],"Our":[79],"at":[81],"the":[82],"post-CTS":[83],"post-routing":[85],"reduce":[87],"buffers":[89],"by":[90,98],"up":[91,99],"82%,":[93],"DVD-induced":[95],"degradation":[97],"58%,":[101],"with":[102],"negligible":[103],"area":[104],"power":[106],"overheads.":[107]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}